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Kafe 바로가기국가/구분 | United States(US) Patent 등록 |
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국제특허분류(IPC7판) |
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출원번호 | US-0383209 (2009-03-20) |
등록번호 | US7893704 (2011-02-08) |
발명자 / 주소 |
|
출원인 / 주소 |
|
대리인 / 주소 |
|
인용정보 | 피인용 횟수 : 8 인용 특허 : 809 |
A membrane probing assembly includes a support element having an incompressible forward support tiltably coupled to a rearward base and a membrane assembly, formed of polyimide layers, with its central region interconnected to the support by an elastomeric layer. Flexible traces form data/signal lin
A membrane probing assembly includes a support element having an incompressible forward support tiltably coupled to a rearward base and a membrane assembly, formed of polyimide layers, with its central region interconnected to the support by an elastomeric layer. Flexible traces form data/signal lines to contacts on the central region. Each contact comprises a rigid beam and a bump located in off-centered location on the beam, which bump includes a contacting portion. After initial touchdown of these contacting portions, further over-travel of the pads causes each beam to independently tilt locally so that different portions of each beam move different distances relative to the support thus driving each contact into lateral scrubbing movement across the pad thereby clearing away oxide buildup. The elastomeric member backed by the incompressible support ensures sufficient scrub pressure and reliable tilt recovery of each contact without mechanical straining of the beam. In an alternative embodiment, the contacts comprise conductive beams each supported on a loose U-shaped flap formed in the membrane assembly where each flap and beam is tiltably supported in inclined position by an elastomeric hub interposed between the flap and support.
We claim: 1. A structure suitable for use with a probe for probing an electrical device, said structure comprising:(a) an elastic membrane; and(b) a plurality of rigid contacts each supported by an elongate portion of a first surface of said elastic membrane and having a contacting portion located n
We claim: 1. A structure suitable for use with a probe for probing an electrical device, said structure comprising:(a) an elastic membrane; and(b) a plurality of rigid contacts each supported by an elongate portion of a first surface of said elastic membrane and having a contacting portion located nearer a first end of said elongate portion than a second end of said elongate portion, displacement of said respective elongate portion relative to a second surface of said elastic membrane when said respective contacting portion is pressed into engagement with said electrical device causing said respective contact to tilt and said contacting portion to scrub laterally across said electrical device.
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