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Defective pixel specifying method, defective pixel specifying system, image correcting method, and image correcting system 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H04N-009/64
출원번호 US-0945608 (2010-11-12)
등록번호 US7969489 (2011-06-15)
우선권정보 JP-2001-001-057422(2001-03-01)
발명자 / 주소
  • Kimura, Hajime
출원인 / 주소
  • Semiconductor Energy Laboratory Co., Ltd.
대리인 / 주소
    Robinson Intellectual Property Law Office, P.C.
인용정보 피인용 횟수 : 2  인용 특허 : 55

초록 ▼

A defective pixel specifying method and a defective pixel specifying system for a semiconductor device having a defective pixel are provided. Also provided are an image correcting method and an image correcting system for making a defective pixel inconspicuous on the screen when a read image is disp

대표청구항 ▼

What is claimed is: 1. A driving method of a device comprising a pixel comprising a transistor and a photoelectric conversion element, the driving method comprising:resetting the photoelectric conversion element by applying a first potential to an n-channel terminal of the photoelectric conversion e

이 특허에 인용된 특허 (55)

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이 특허를 인용한 특허 (2)

  1. Kimura, Hajime, Defective pixel specifying method, defective pixel specifying system, image correcting method, and image correcting system.
    상세보기
  2. Kimura, Hajime, Defective pixel specifying method, defective pixel specifying system, image correcting method, and image correcting system.
    상세보기

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