$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Deposition sub-chamber with variable flow 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C23C-016/458
출원번호 US-0626328 (2007-01-23)
발명자 / 주소
  • Krotov, Peter
  • Smith, Colin F.
출원인 / 주소
  • Novellus Systems, Inc.
대리인 / 주소
    Weaver Austin Villeneuve & Sampson LLP
인용정보 피인용 횟수 : 16  인용 특허 : 69

초록

An apparatus and method for depositing film on a substrate includes a plurality of conduits that allow by-product and reactant gases to flow past the edge of a substrate. The apparatus and process of the present invention has several advantages for enhanced chamber performance, particularly for micr

대표청구항

What is claimed: 1. An apparatus, comprising:a chemical isolation chamber;a deposition sub-chamber formed within the chemical isolation chamber;a substrate pedestal module, the substrate pedestal module comprising a pedestal base located within the chemical isolation chamber,wherein the substrate pe

이 특허에 인용된 특허 (69)

  1. Gavronsky, Stas, Acupuncture device with improved needle guide tube.
  2. Hausmann,Dennis M.; Tipton,Adrianne K.; Nie,Bunsen; Papasouliotis,George D.; Rulkens,Ron; Tarafdar,Raihan M., Aluminum phosphate incorporation in silica thin films produced by rapid surface catalyzed vapor deposition (RVD).
  3. Sneh, Ofer; Galewski, Carl J., Apparatus and concept for minimizing parasitic chemical vapor deposition during atomic layer deposition.
  4. Raaijmakers, Ivo, Apparatus and method for growth of a thin film.
  5. Sneh, Ofer; Seidel, Thomas E.; Galewski, Carl, Apparatus and method to achieve continuous interface and ultrathin film during atomic layer deposition.
  6. Yamaga Kenichi (Sagamihara JPX) Kobayashi Toshiki (Zama JPX), Apparatus for heat treating semiconductors at normal pressure and low pressure.
  7. Hiroki, Tamayo, Apparatus for manufacturing electron source, method for manufacturing electron source, and method for manufacturing image-forming apparatus.
  8. Takeda, Toshihiko; Kamio, Masaru; Yamashita, Masataka; Sato, Yasue; Oda, Hitoshi; Yamamoto, Keisuke; Tamura, Miki; Kawasaki, Hideshi; Jindai, Kazuhiro, Apparatus for producing electron source.
  9. Mizuno, Shigeru; Doi, Hiroshi; Itani, Seiji; Liu, Xiao-Meng, CVD apparatus.
  10. MacLeish Joseph H. ; Mailho Robert D., CVD reactor having heated process chamber within isolation chamber.
  11. Takashi Seki JP; Hiroyuki Shimizu JP; Akira Sano JP, Catalyst containing novel transition metal compound for polymerization of olefins.
  12. Tepman Avi ; Yin Gerald Zheyao ; Olgado Donald, Compartmentalized substrate processing chamber.
  13. Tepman Avi ; Yin Gerald Zheyao ; Olgado Donald, Compartnetalized substrate processing chamber.
  14. Wytman Joseph, Compliant wafer chuck.
  15. Venkataramanan N. (Brookfield Center CT) Zarowin Charles B. (Rowayton CT), Diamond-like carbon films and process for production thereof.
  16. Wesley Natzle ; Richard A. Conti ; Laertis Economikos ; Thomas Ivers ; George D. Papasouliotis, Directional CVD process with optimized etchback.
  17. Lind, Gary; Smith, Colin F.; Johanson, William; Pratt, Thomas M.; Mazzocco, John, Dual seal deposition process chamber and process.
  18. Azuma, Hisanobu, Electrifying method and manufacturing method of electron-source substrate.
  19. Azuma,Hisanobu, Electrifying method and manufacturing method of electron-source substrate.
  20. Azuma,Hisanobu, Electrifying method and manufacturing method of electron-source substrate.
  21. Kimura, Akihiro; Ohki, Kazuhiro, Electron source manufacturing apparatus.
  22. Li, Yicheng, Exhaust system for a vacuum processing system.
  23. John M. White ; Ernst Keller ; Wendell T. Blonigan, Flexibly suspended gas distribution manifold for plasma chamber.
  24. Zimmer Johannes,ATX, Flow-dividing arrangement.
  25. Sneh, Ofer; Seidel, Thomas E., Fully integrated process for MIM capacitors using atomic layer deposition.
  26. McMillin Brian ; Nguyen Huong ; Barnes Michael ; Ni Tom, Gas injection system for plasma processing.
  27. Arena Chantal (le Fontanil FRX) Joly Jean-Pierre (St. Egreve FRX) Noel Patrice (Sassenage FRX) Papapietro Michel (Lyons FRX), Gaseous phase chemical treatment reactor.
  28. Biberger, Maximilian A.; Layman, Frederick Paul; Sutton, Thomas Robert, High pressure processing chamber for semiconductor substrate.
  29. Biberger,Maximilian A.; Layman,Frederick Paul; Sutton,Thomas Robert, High pressure processing chamber for semiconductor substrate.
  30. Papasouliotis George D. ; Chakravarti Ashima B. ; Conti Richard A. ; Economikos Laertis ; Van Cleemput Patrick A., High throughput chemical vapor deposition process capable of filling high aspect ratio structures.
  31. Jones,William Dale, High-pressure processing chamber for a semiconductor wafer.
  32. Jones,William Dale, High-pressure processing chamber for a semiconductor wafer.
  33. Omori Tsutae (Yamanashi-ken JPX) Harada Kouji (Kumamoto-ken JPX) Satoh Takami (Kumamoto-ken JPX) Anai Noriyuki (Kumamoto-ken JPX) Nomura Masafumi (Kumamoto-ken JPX), Hydrophobic treatment method involving delivery of a liquid process agent to a process space.
  34. Tsuda,Hisanori; Kamio,Masaru; Gofuku,Ihachiro; Sato,Yasue; Shimada,Yoshiyuki; Mitani,Hiromasa; Seino,Kazuyuki; Nishimura,Takashi, Image display apparatus having ion pump and electron-emitting devices in communication via mesh or stripe shaped member.
  35. de Lomenie Romain Beau ; Carlson David K., Inert barrier for high purity epitaxial deposition systems.
  36. Jeon, Joong S.; Halliyal, Arvind, Integrated process for fabrication of graded composite dielectric material layers for semiconductor devices.
  37. Hiroaki Saeki JP, Load-lock mechanism and processing apparatus.
  38. Ballou Jon M. (Danvers MA), Low compliance seal for gas-enhanced wafer cooling in vacuum.
  39. Brown William ; Herchen Harald ; Nzeadibe Ihi ; Merry Walter, Low volume gas distribution assembly for a chemical downstream etch tool.
  40. Takeda,Toshihiko; Kamio,Masaru; Yamashita,Masataka; Sato,Yasue; Oda,Hitoshi; Yamamoto,Keisuke; Tamura,Miki; Kawasaki,Hideshi; Jindai,Kazuhiro, Manufacturing method of an image forming apparatus.
  41. Asai, Masayuki; Kitayama, Kanako, Manufacturing method of semiconductor device and substrate processing apparatus.
  42. Nomura, Ichiro; Nakata, Kohei; Kaneko, Tetsuya; Miyazaki, Toshihiko; Sato, Yasue; Ohnishi, Toshikazu, Method and apparatus for manufacturing image displaying apparatus.
  43. Nomura,Ichiro; Nakata,Kohei; Kaneko,Tetsuya; Miyazaki,Toshihiko; Sato,Yasue; Ohnishi,Toshikazu, Method and apparatus for manufacturing image displaying apparatus.
  44. Saenger, Annette; Sell, Bernhard; Seidl, Harald; Hecht, Thomas; Gutsche, Martin, Method and device for depositing thin layers via ALD/CVD processes in combination with rapid thermal processes.
  45. Parent,Wayne M.; Goshi,Gentaro, Method and system for cooling a pump.
  46. Livesay William R. ; Ross Matthew F. ; Rubiales Anthony L., Method for curing spin-on-glass film utilizing electron beam radiation.
  47. Kim, Kyong-Min; Song, Han-Sang, Method for forming Ta2O5 dielectric layer by using in situ N2O plasma treatment.
  48. Won,Seok jun; Park,Young wook; Hyung,Yong woo, Method for forming a thin film.
  49. Andideh Ebrahim ; Wong Larry, Method for preparing carbon doped oxide insulating layers.
  50. Schuegraf, Klaus F., Method for reducing base to collector capacitance and related structure.
  51. Kazuo Maeda JP; Yuhko Nishimoto JP, Method of film formation and method for manufacturing semiconductor device.
  52. Werkhoven, Christiaan J.; Raaijmakers, Ivo; Haukka, Suvi P., Method of forming graded thin films using alternating pulses of vapor phase reactants.
  53. Sandhu,Gurtej S., Methods of forming trench isolation in the fabrication of integrated circuitry, methods of fabricating memory circuitry, integrated circuitry and memory integrated circuitry.
  54. Rulkens,Ron; Hausmann,Dennis M.; Tarafdar,Raihan M.; Papasouliotis,George D.; Nie,Bunsen; Tipton,Adrianne K.; Tobin,Jeff, Mixed alkoxy precursors and methods of their use for rapid vapor deposition of SiOfilms.
  55. Papasouliotis,George D., Optimal operation of conformal silica deposition reactors.
  56. Papasouliotis,George D., Optimal operation of conformal silica deposition reactors.
  57. Agarwal Vishnu K., Photo-assisted remote plasma apparatus and method.
  58. Ishizaka,Tadahiro, Plasma enhanced atomic layer deposition system having reduced contamination.
  59. Joseph T. Hillman, Processing system and method for chemical vapor deposition of a metal layer using a liquid precursor.
  60. Hausmann, Dennis M.; Tipton, Adrianne K.; Van Cleemput, Patrick A.; Nie, Bunsen; Juarez, Francisco J.; Pong, Teresa, Properties of a silica thin film produced by a rapid vapor deposition (RVD) process.
  61. Chen, Ruey-Min; Chung, Jun-Wen; Hsu, Chun-Che, Red-emitting organic electroluminescent compound.
  62. Gilboa Yitzhak Eric ; Brosilow Benjamin,ILX ; Levy Sagy ; Spielberg Hedvi ; Bransky Itai,ILX, Selective hemispherical grain silicon deposition.
  63. Kinoshita Yoshimi (Amagasaki JPX) Kanda Tomoyuki (Amagasaki JPX) Kitano Katsuhisa (Amagasaki JPX) Yoshida Kazuo (Amagasaki JPX) Ohnishi Hiroshi (Amagasaki JPX) Yamanishi Kenichiro (Amagasaki JPX) Sas, Semiconductor producing apparatus comprising wafer vacuum chucking device.
  64. Boitnott Charles A. ; Caughran James W. ; Egbert Steve, Semiconductor wafer processing carousel.
  65. Tarafdar,Raihan M.; Papasouliotis,George D.; Rulkens,Ron; Hausmann,Dennis M.; Tobin,Jeff; Tipton,Adrianne K.; Nie,Bunsen, Sequential deposition/anneal film densification method.
  66. Okase Wataru,JPX, Substrate treatment system.
  67. Takahashi Nobuaki (Hachioji JPX), Surface treatment method and apparatus.
  68. Saeki Hiroaki (Yamanashi JPX), Vacuum processing apparatus.
  69. Khanh Tran ; Tom Kelly ; Arin Chang ; Guy Mendez, Wafer processing apparatus and method.

이 특허를 인용한 특허 (16)

  1. Sung, Edward; Smith, Colin F.; Hamilton, Shawn M., Anti-transient showerhead.
  2. Murata, Kazutoshi; Mori, Yasunari, Atomic layer deposition apparatus and thin film forming method.
  3. Kashyap, Dhritiman S.; Cohen, David G.; Sharma, Davinder, Cascade design showerhead for transient uniformity.
  4. Palagashvili, David; Willwerth, Michael D.; Erenstein, Alex; Liu, Jingbao, Chamber with uniform flow and plasma distribution.
  5. Chandrasekharan, Ramesh; Leeser, Karl; Xia, Chunguang; Tucker, Jeremy, Chemical deposition apparatus having conductance control.
  6. Du, Zhiyou; Xing, Peijin; Fan, Wenyuan; Jiang, Yinxin, Chemical vapor deposition apparatus and its cleaning method.
  7. Gaff, Keith William; Busche, Matthew; Ricci, Anthony; Povolny, Henry S.; Stevenot, Scott, Edge seal for lower electrode assembly.
  8. Schaefer, David; Chhatre, Ambarish; Gaff, Keith William; Lee, Sung, Edge seal for lower electrode assembly.
  9. Schaefer, David; Chhatre, Ambarish; Gaff, Keith William; Lee, Sung; Lai, Brooke Mesler, Edge seal for lower electrode assembly.
  10. Takagi, Toshio, Film deposition apparatus and film deposition method.
  11. Endo, Rick; Dedontney, Jay; Tsung, James, Method and apparatus for variable conductance.
  12. Tzu, Gwo-Chuan; Yuan, Xiaoxiong; Khandelwal, Amit; Wang, Benjamin Cheng; Gelatos, Avgerinos V.; Wu, Kai; Karazim, Michael P.; Lin, Jing; Cuvalci, Olkan, Methods and apparatus for thermal based substrate processing with variable temperature capability.
  13. Onodera, Naomi; Gokon, Kiyohiko; Sato, Jun, Plasma process apparatus and plasma process method.
  14. Onodera, Naomi; Gokon, Kiyohiko; Sato, Jun, Plasma process method.
  15. Verghese, Mohith; Fondurulia, Kyle; White, Carl; Shero, Eric; Babic, Darko; Terhorst, Herbert; Peussa, Marko; Yan, Min, Reaction system for growing a thin film.
  16. Meinhold, Henner W.; Doble, Dan M.; Lau, Stephen Yu-Hong; Wilson, Vince; Srinivasan, Easwar, Temperature controlled showerhead.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로