초록

Devices, systems, and methods for processing sample materials. The sample materials may be located in a plurality of process chambers in the device, which is rotated during heating of the sample materials.

대표청구항 ▼

The invention claimed is: 1. A method of processing sample material comprising:providing a device comprising a process chamber array, wherein the process chamber array comprises a first chamber and a second chamber;providing sample material in the process chamber array;moving the sample material wit

The invention claimed is: 1. A method of processing sample material comprising:providing a device comprising a process chamber array, wherein the process chamber array comprises a first chamber and a second chamber;providing sample material in the process chamber array;moving the sample material within the process chamber array by rotating the device;providing paramagnetic particles within the sample material located in the process chamber array;locating a magnet proximate the device; androtating the device such that the paramagnetic particles within the sample material in the process chamber array are subjected to the magnetic field of the magnet during the rotating.