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Non-orthogonal particle detection systems and methods 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-015/02
출원번호 US-0043305 (2011-03-08)
등록번호 US8027035 (2011-09-13)
발명자 / 주소
  • Mitchell, John
  • Sandberg, Jon
  • Sandberg, Legal Representative, Karen R.
  • Sehler, Dwight A.
출원인 / 주소
  • Particle Measuring Systems, Inc.
대리인 / 주소
    Greenlee Sullivan P.C.
인용정보 피인용 횟수 : 9  인용 특허 : 162

초록

초록이 없습니다.

대표청구항

대표청구항이 없습니다.

이 특허에 인용된 특허 (162)

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  73. Knollenberg Robert G. (Boulder CO), Laser with stabilized external passive cavity.
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  103. Blesener James L. (White Bear Lake MN), Non-imaging laser particle counter.
  104. Bonner Robert F. (Washington DC), Non-invasive optical assessment of platelet viability.
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  109. Zaglio Enrico (Via G. B. da Farfengo 52 25127 Brescia ITX), Optical measuring device for measuring the fat contents of milk.
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  114. Rowe ; William Guy, Particle analyzer apparatus employing light-sensitive electronic detector array.
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  120. Davis, Clay; Mead, Donald; Quist, Gregory, Particle detection beam.
  121. Miyashita Haruzo (Tokyo JPX), Particle detection system.
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  129. Itoh Yuji (Chigasaki JPX), Particle measuring device with elliptically-shaped scanning beam.
  130. Unger Roger L., Particle sensor and related method offering improved particle discrimination.
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  6. Venkatesh, Vardarajan, Scalable gateways for a fabric switch.
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  8. Mitchell, John; Sandberg, Jon; Sehler, Dwight A.; Williamson, Michael; Rice, David, Two-dimensional optical imaging methods and systems for particle detection.
  9. Mitchell, John; Sehler, Dwight A.; Williamson, Michael; Rice, David; Sandberg, Jon; Sandberg, legal representative, Karen R., Two-dimensional optical imaging methods and systems for particle detection.
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