IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0541431
(2006-09-29)
|
등록번호 |
US-8105135
(2012-01-31)
|
발명자
/ 주소 |
- Laconto, Ronald W.
- Haerle, Andrew G.
|
출원인 / 주소 |
- Saint-Gobain Ceramics & Plastics, Inc.
|
대리인 / 주소 |
|
인용정보 |
피인용 횟수 :
0 인용 특허 :
21 |
초록
▼
A polishing slurry includes liquid medium and particulate abrasive. The particulate abrasive includes soft abrasive particles, hard abrasive particles, and colloidal silica particles, wherein the soft abrasive particles have a Mohs hardness of not greater than 8 and the hard abrasive particles have
A polishing slurry includes liquid medium and particulate abrasive. The particulate abrasive includes soft abrasive particles, hard abrasive particles, and colloidal silica particles, wherein the soft abrasive particles have a Mohs hardness of not greater than 8 and the hard abrasive particles have a Mohs hardness of not less than 8, and wherein the soft abrasive particles and the hard abrasive particles are present at a weight ratio of not less than 2:1.
대표청구항
▼
1. A polishing slurry comprising: liquid medium; andparticulate abrasive comprising soft abrasive particles, hard abrasive particles, and colloidal silica particles, wherein the soft abrasive particles have a positive surface charge and have a Mohs hardness of not greater than 6 and the hard abrasiv
1. A polishing slurry comprising: liquid medium; andparticulate abrasive comprising soft abrasive particles, hard abrasive particles, and colloidal silica particles, wherein the soft abrasive particles have a positive surface charge and have a Mohs hardness of not greater than 6 and the hard abrasive particles have a Mohs hardness of not less than 9, and wherein the soft abrasive particles and the hard abrasive particles are present at a weight ratio of not less than 2:1,wherein the slurry has a basic pH and is at least partially flocculated, having soft agglomerates containing the soft abrasive particles, hard abrasive particles, and colloidal silica particles. 2. The polishing slurry of claim 1, wherein the soft abrasive particles comprise ceria. 3. The polishing slurry of claim 1, wherein the hard abrasive particles comprise diamond. 4. The polishing slurry of claim 1, wherein the soft abrasive particles and the hard abrasive particles are present at a weight ratio of not less than 5:1. 5. The polishing slurry of claim 4, wherein the soft abrasive particles and the hard abrasive particles are present at a weight ratio of not less than 10:1. 6. The polishing slurry of claim 1, wherein the particulate abrasive comprises 50 to 95 wt % soft abrasive particles, 0.5 to 15 wt % hard abrasive particles and 4.5 to 35 wt % colloidal silica particles. 7. The polishing slurry of claim 6, wherein the particulate abrasive comprises 70 to 95 wt % soft abrasive particles, 0.5 to 15 wt % hard abrasive particles and 4.5 to 29.5 wt % colloidal silica particles. 8. The polishing slurry of claim 1, wherein the average particle size of the colloidal silica particles is within a range of about 3 to 200 nm. 9. The polishing slurry of claim 1, wherein the hard abrasive particles have an average particle size within a range of about 0.02 to 50 μm. 10. The polishing slurry of claim 1, wherein the slurry is essentially free of aggregates containing the soft abrasive particles, the hard abrasive particles, and the colloidal silica particles. 11. The polishing slurry of claim 1, wherein the slurry has a pH of 12 or higher. 12. The polishing slurry of claim 1, wherein the agglomerates have not undergone heat treatment or curing. 13. A polishing slurry comprising: liquid medium; andparticulate abrasive comprising ceria particles, diamond particles, and colloidal silica particles, wherein the ceria particles have a positive surface charge and form not less than 50 wt % of the particulate abrasive,wherein the slurry has a pH of 9 or higher and is at least partially flocculated, having soft agglomerates containing the ceria particles, diamond particles, and colloidal silica particles. 14. The polishing slurry of claim 13, wherein the ceria particles and the diamond particles are present at a weight ratio of not less than 10:1. 15. The polishing slurry of claim 13, wherein colloidal silica particles are present in an amount effective to at least partially flocculate the slurry. 16. The polishing slurry of claim 13, wherein the particulate abrasive comprises 50 to 95 wt % ceria particles, 0.5 to 15 wt % diamond particles and 4.5 to 35 wt % colloidal silica particles. 17. The polishing slurry of claim 13, wherein the average particle size of the colloidal silica particles is within a range of about 3 to 200 nm. 18. A polishing slurry comprising: liquid medium; andparticulate abrasive comprising soft abrasive particles having a positive surface charge and present in an amount of x wt % of the particulate abrasive, hard abrasive particles present in an amount of y wt % of the particulate abrasive, and colloidal silica particles present in an amount of z wt % of the particulate abrasive, wherein the hard abrasive particles have a Mohs hardness greater than the Mohs hardness of the soft abrasive particles, and wherein x+z>2y,wherein the slurry has a pH of 9 or higher and is at least partially flocculated, having soft agglomerates containing the soft abrasive, hard abrasive, and colloidal silica particles, the soft abrasive particles, hard abrasive particles, and colloidal silica particles being weakly bonded together, and free of covalent bonding therebetween. 19. The polishing slurry of claim 18, wherein x+z>8y.
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