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Devices systems, and methods can characterize an optical surface of an object. A wavefront sensor system focuses light energy propagating from the object to form a pattern on a detector. The system maps the pattern to an array with a transform function such as a Fourier transform. The values of arra

Devices systems, and methods can characterize an optical surface of an object. A wavefront sensor system focuses light energy propagating from the object to form a pattern on a detector. The system maps the pattern to an array with a transform function such as a Fourier transform. The values of array correspond to characteristic locations and signals in a transform space, for example an intensity of spatial frequency signals in frequency space. The characteristic location and intensity of these signals in transform space are used to measure the optical surface. For example, a characteristic frequency of a spatial frequency intensity peak in Fourier transform space can be used to estimate the location of spots on the detector. Alternatively, the characteristics can be used to the measure sphere, cylinder and axis of a wavefront, wavefront elevation maps and point spread functions, often without locating positions of individual spots on the detector.

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1. A method of measuring an optical surface of a tissue system, the method comprising: forming a spatial distribution pattern on a detector by focusing a light energy propagating from the tissue system through several lenslets of a lenslet array onto the detector so that the pattern includes several

1. A method of measuring an optical surface of a tissue system, the method comprising: forming a spatial distribution pattern on a detector by focusing a light energy propagating from the tissue system through several lenslets of a lenslet array onto the detector so that the pattern includes several spots of light energy;mapping the pattern to a transform array by transforming the pattern with a transform function so that the array comprises values corresponding to locations distributed in a spatial frequency space, each of the values of the array corresponding to an associated local intensity, in the frequency space of the several spots of the pattern;identifying a shape characteristic of the optical surface from a selected value, wherein the selected value is selected from the values of the transform array and corresponds to an associated local intensity, at the corresponding location in the frequency space, of the several spots; andselecting the selected value in response to identifying the selected value as a peak value from within the array. 2. The method of claim 1 wherein: the pattern comprises a two dimensional spatial light intensity distribution pattern;the array comprises a two dimensional array having values corresponding to a first coordinate reference along a first dimension in a transform space and a second coordinate reference along a second dimension in the transform space; andthe characteristic corresponds to a first coordinate location along the first dimension and a second coordinate location along the second dimension. 3. The method of claim 2 further comprising identifying a second characteristic from the array, the second characteristic corresponding to a third coordinate reference along the first dimension and a fourth coordinate reference along the second dimension. 4. The method of claim 1, wherein the shape characteristic comprises a spherocylindrical power of the surface. 5. The method of claim 1, wherein the shape characteristic comprises a high-order aberration of the surface. 6. A system for determining an optical aberration characteristic of a surface of a tissue system, the system comprising: an optical system having an optical path and a lenslet array, the lenslet array including several lenslets and configured for forming several spots corresponding, to the several lenslets;a detector disposed along the optical path and configured for measuring a spatial light distribution energy pattern focused by the lenselet array, the pattern including the several spots;a processor coupled to the detector and configured to map the pattern to a signal in a transform space and determine the characteristic from the signal, wherein the processor is configured to map the pattern to an array having values corresponding to locations distributed in a frequency space, each of the values of the array corresponding to an associated local frequency intensity of the several spots of the pattern, wherein the processor is configured to determine the characteristic from a selected value from among the values of the transform array, the selected value corresponding to an associated local frequency intensity, in the frequency space, of the several spots, and wherein the processor is further configured to select the value such that the value comprises a peak value from within the array. 7. The system of claim 6, wherein the optical system is configured so that the pattern comprises a two dimensional spatial light intensity distribution pattern and wherein the processor is configured so that the array comprises a two dimensional array having values corresponding to a first coordinate reference along a first dimension in the transform space and a second coordinate reference along a second dimension in the transform space and wherein the characteristic corresponds to a first coordinate location along the first dimension and a second coordinate location along the second dimension, and wherein the processor is configured to identify a second characteristic from the transform array, the second characteristic corresponding to third coordinate reference along the first dimension and a fourth coordinate reference along the second dimension. 8. The system of claim 6, wherein the shape characteristic comprises a spherocylindrical power of the surface. 9. The system of claim 6, wherein the shape characteristic comprises a high-order aberration of the surface.