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Methods, systems, and apparatuses are provided for creating bond delaminations in a controlled fashion within adhesively bonded structures. In one embodiment, a system for inducing a defect in a bond of a bonded article includes a laser and a laser processor head. The laser processor head includes a

Methods, systems, and apparatuses are provided for creating bond delaminations in a controlled fashion within adhesively bonded structures. In one embodiment, a system for inducing a defect in a bond of a bonded article includes a laser and a laser processor head. The laser processor head includes a housing, a lens disposed within the housing, at least one magnet disposed within the housing, and at least one sensor disposed within the housing. The system is capable of applying a laser pulse of sufficient energy fluence to cause localized weaknesses in the bond.

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1. A method for inducing a defect in a bond of a bonded article, the method comprising: providing a bonded article having at least two articles, including a first article bonded to a second article, wherein the bond between the first article and the second article has a strength which is substantial

1. A method for inducing a defect in a bond of a bonded article, the method comprising: providing a bonded article having at least two articles, including a first article bonded to a second article, wherein the bond between the first article and the second article has a strength which is substantially in accordance with a full strength specification;applying a pulse of laser energy to a front surface of the first article;inducing a stress wave in the first article such that at least a portion of the stress wave propagates through the first article, the bond, and the second article, and the stress wave at least partially reflects off a back surface of the second article, wherein at least a portion of the reflected stress wave propagates back through the second article to at least the bond and is of sufficient magnitude to induce a defect in the bond; anddetecting the defect, wherein the detecting comprises electromagnetically detecting a stress wave signature. 2. The method of claim 1, further comprising inspecting the bond prior to applying the laser pulse. 3. The method of claim 1, further comprising inspecting the bond subsequent to applying the laser pulse. 4. The method of claim 1, further comprising monitoring bond defect growth by fatigue stress tests. 5. The method of claim 1, further comprising inspecting the bond by non-destructive means. 6. A method for repairing a bonded article, comprising: providing a bonded article having at least two parts, including a first part and a second part, the bonded article further including a bond with at least one defect, wherein the first part and the second part are bonded in substantial accordance with a full strength specification;applying a plurality of laser pulses to a surface of the first part in an area at least partially surrounding the defect, the laser pulses comprising sufficient energy fluence to generate localized disbonds in the bond in the area at least partially surrounding the defect;separating the first part from the second part; andinspecting the bond using laser bond inspection. 7. The method of claim 6, further comprising detecting the defect in the bond. 8. A method for creating stress relief points in a bonded article, comprising: providing a bonded article including at least two parts, including a first part and a second part adhered together with a bond, wherein the first part and the second part are bonded in substantial accordance with a full strength specification; andexposing a surface of the first part with a plurality of laser pulses in a predetermined geometric arrangement, wherein the laser pulses comprise sufficient energy fluence to cause localized weaknesses in the bond. 9. The method of claim 8, wherein the bond comprises at least one defect prior to exposing. 10. The method of claim 8, further comprising inspecting the bond using laser bond inspection. 11. The method of claim 8, further comprising detecting the localized weaknesses in the bond subsequent to the exposing. 12. A system for inducing a defect in a bond of a bonded article, comprising: a laser; anda laser processor head comprising a housing, a lens disposed within the housing, at least one magnet disposed within the housing, and at least one sensor disposed within the housing, wherein the system is capable of applying a laser pulse of sufficient energy fluence to cause localized weaknesses in the bond, wherein the bond has a strength which is substantially in accordance with a full strength specification prior to applying the laser pulse. 13. The system of claim 12, further comprising an articulated arm capable of delivering a laser beam from the laser to the laser processor head. 14. The system of claim 12, further comprising a controller.