$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Alignment assembly 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B23Q-003/18
  • B25B-001/10
  • B25B-005/10
  • B25B-005/00
  • B27B-005/18
  • B27B-027/06
  • B27B-003/28
  • B27B-027/04
  • B26D-001/18
  • H01L-021/68
출원번호 US-0853901 (2007-09-12)
등록번호 US-8267388 (2012-09-18)
발명자 / 주소
  • Xu, Ying
출원인 / 주소
  • Xradia, Inc.
대리인 / 주소
    Houston & Associates, LLP
인용정보 피인용 횟수 : 5  인용 특허 : 61

초록

Alignment assembly is used to center a sample on a moving stage system. The alignment assembly includes a pair of slides stacked on a stage with linear perpendicular movement relative to each other, and at least one actuator that is preferably physically separate from the linear slides and stage. Th

대표청구항

1. A method for aligning a sample on an alignment assembly that resides on a rotation stage, to an axis of rotation of the rotation stage, using an actuator to move the alignment assembly, the alignment assembly comprising two orthogonal linear slides and an external measurement device to measure a

이 특허에 인용된 특허 (61)

  1. Williams Andrew S. (Brea CA), Actuator system and method.
  2. Akieda, Shinichiro; Nakamura, Akio, Actuator with hit prevention mechanism.
  3. Neff Edward A. (Rancho Santa Fe CA) Moss John (San Bernardino CA), Actuator with translational and rotational control.
  4. La Rocco ; Lawrence, Adaptor for machine tool fixture.
  5. Asano,Toshiya; Shibata,Yugo, Alignment apparatus, exposure apparatus, and device manufacturing method.
  6. Asano,Toshiya; Shibata,Yugo, Alignment apparatus, exposure apparatus, and device manufacturing method.
  7. Oetiker Hans (Horgen CHX), Apparatus and method for automatically installing clamps.
  8. Rentzsch,Wolfgang, Apparatus and method for positioning an optical component.
  9. Heffron,Allan J.; Brechtelsbauer,Earl O.; St. Pierre,Marc D., Apparatus and method for rolling workpieces.
  10. Beduhn Mark William ; Howard ; Jr. Jimmy Harrell, Apparatus and method of precisely preloading a bearing onto a shaft.
  11. Arntson, Paul R.; Outous, Ronald W.; Boyl-Davis, Theodore M.; Buttrick, Jr., James N., Apparatus for manufacturing operations using non-contact position sensing.
  12. Getreuer Kurt W., Apparatus for moving a carriage assembly from an initial position to a target position.
  13. Foreman, John T.; Powers, Galen R.; Lattis, Matthew C., Apparatus for preparing multiple eyeglass lenses.
  14. Fendley, James R.; Kraner, James L.; Pekosh, Raymond J., Automatic gun mount alignment apparatus.
  15. Brunetti Andrea,ITX ; Innocenti Emilia Norberti,ITX ; Cipriani Carlo,ITX ; Rassitti Giancarlo,ITX ; Tagliaferri Alvaro,ITX, Automatic positioning mechanism.
  16. Fredrickson, Clyde R.; Wismer, Mark, Automatic truss jig setting system.
  17. Raleigh Freddie L. (Centerville OH), Bridge type coordinate measuring machine.
  18. Fox Phillip S., Component holding system.
  19. Sato Mikio,JPX ; Takeishi Hiroaki,JPX, Drive control apparatus.
  20. Novak W. Thomas, Dual guide beam stage mechanism with yaw control.
  21. Lee Martin E., Exposure apparatus having reaction frame.
  22. Ebihara, Akimitsu, Exposure apparatus, and device manufacturing method.
  23. Foreman, John T.; Powers, Galen R.; Lattis, Matthew C., Eyeglass lens forming apparatus with sensor.
  24. Craythorn, Rupert Andrew; Fuhrmeister, Ralph; Matthews, Shane Peter; Gostylla, Wojciech; Blacket, Stuart Edmund; Clew, Nicholas Richard; Butler, Michael, Fastening machines.
  25. Xu, Ying, Five axis compensated rotating stage.
  26. Miyazaki Chuuichi (Tsukuba JPX) Akatsu Toshio (Ushiku JPX) Mori Sadao (Ibaraki JPX), Laser gauge interferometer and locating method using the same.
  27. Ishii Hiroshi (Kashihara JPX) Sawai Hiroyuki (Nabari JPX) Ozaki Masaaki (Tenri JPX) Kagawa Toshiaki (Tenri JPX), Linear driving apparatus.
  28. Estes, Robert A.; Kahn, Jon B., Lockable motor drive.
  29. Bornhors ; Jr. Kenneth F. (Centerville OH) Izor Kim E. (Miamisburg OH) Seitz David R. (Vandalia OH), Method and apparatus for positioning at least one engraving head.
  30. Jensen James W. (Boulder CO), Method and device for providing longitudinal and lateral stretch control in laminated webs.
  31. Rodney,Paul F.; Spross,Ronald L., Method and system to model, measure, recalibrate, and optimize control of the drilling of a borehole.
  32. David Constant V. (4952 Field St. San Diego CA 92110), Method for fabricating and inserting reinforcing spikes in a 3-D reinforced structure.
  33. Lee Martin E., Method for making apparatus with dynamic support structure isolation and exposure method.
  34. Silverbrook,Kia, Method of capturing and processing sensed images.
  35. Brooks Peter Everett ; Gabrielson Lance Allen, Method of centering a disk pack of a disk drive.
  36. Foreman,John T.; Powers,Galen R.; Lattis,Matthew C., Method of monitoring components of a lens forming apparatus.
  37. Mark William Beduhn ; Jimmy Harrell Howard, Jr., Method of mounting a bearing onto a shaft.
  38. Ahne,Adam J.; Chapman,Alexander L.; Kroger,Patrick L.; Vessels,Jay W., Methods and apparatuses for sensing rotational position of a component in a printing device.
  39. Baker Gregory N. (Boca Raton FL) Bateson John E. (Boca Raton FL) Brown Earl T. (Boca Raton FL) Delgado Hortensia E. (Boca Raton FL) Siegl Ludwig R. (Highland Beach FL) Thomas ; Jr. Delbert C. (Boca R, Microprocessor controlled positioning system.
  40. Hall,Donald R., Modular architecture sensing and computing platform.
  41. Hall,Donald R., Modular architecture sensing and computing platform.
  42. Oikawa Shiro,JPX, Nondestructive test apparatus.
  43. Van Eijk Jan (Eindhoven NLX) Van Engelen Gerard (Eindhoven NLX) Cox Hendrikus H. M. (Eindhoven NLX) Beekman Henricus E. (Eindhoven NLX) Jacobs Fransiscus M. (Eindhoven NLX), Optical lithographic device having a machine frame with force compensation.
  44. Inoue Kiyoshi (Tokyo JPX), Path-controlled machining method.
  45. Novak W. Thomas (Hillsborough CA) Premji Zahirudeen (Boulder CO) Nayak Uday G. (San Jose CA) Ebihara Akimitsu (San Mateo CA), Precision motion stage with single guide beam and follower stage.
  46. Silverbrook,Kia, Printing device for use with a printing cartridge having capacitive sensor identification.
  47. Ganssle, Eugene R.; Miller, Claude P., Reflector antenna mounted in thermal distortion isolation.
  48. Demarest David D. ; Shaw Teresa, Robotic control system for needle sorting and feeder apparatus.
  49. Park Sang-Il ; Linker Frederick I. ; Smith Ian R., Scanning probe microscope having a single viewing device for on-axis and oblique angle views.
  50. Sawai, Hiroyuki; Ishii, Hiroshi, Stage device capable of moving an object to be positioned precisely to a target position.
  51. Iwata Mikio (Ibaraki JPX) Kariya Takao (Tokyo JPX) Ohtsuka Masaru (Yokohama JPX), Stage mechanism.
  52. Aalund, Martin; Remis, Steve; Lita, Alexandra; Ciu, Guokun; Loiler, Brian; Rhodes, Ray, Substrate handling system for aligning and orienting substrates during a transfer operation.
  53. Andrews,Scott; Judell,Neil; Richard Earl,Bills; Tiemeyer,Timothy R., System and method for signal processing for a workpiece surface inspection system.
  54. Foreman,John T.; Powers,Galen R.; Lattis,Matthew C.; Lossman,Loren C.; Joel,Larry, System for preparing eyeglasses lens with filling station.
  55. Parks, James; Gehret, Robert S.; Livingston, Scott; O'Banion, Michael L.; Welsh, Robert P.; Taylor, William Scott; Huston, Todd L.; Zehr, Edwin G.; Stropkay, Scott; Weissburg, David Louis; Nichols, M, Table saw.
  56. Raffi Codilian ; George S. Bouchaya, Temperature monitoring method of a disk drive voice coil motor from a traveled distance.
  57. Hollis ; Jr. Ralph L. (Yorktown Heights NY), Ultrafast electro-dynamic X, Y and Theta Positioning Stage.
  58. Wu, Kung Chris, Wafer aligner.
  59. Fan Long-Sheng ; Fontana ; Jr. Robert Edward ; Furuhata Tomotake,JPX ; Reiley Timothy Clark ; Zappe Hans Helmut, Wobble motor microactuator for fine positioning and disk drive incorporating the microactuator.
  60. Ichihara,Masaru; Yoshino,Shinji; Inoue,Hiroyuki; Kinoshita,Toshio; Ohuchi,Kazuo, X-ray inspection apparatus and X-ray inspection method.
  61. Wang,Yuxin; Yun,Wenbing; Scott,David Dean, X-ray micro-tomography system optimized for high resolution, throughput, image quality.

이 특허를 인용한 특허 (5)

  1. Jywe, Wen-Yuh; Shen, Jing-Chung; Yang, Chin-Tien; Liu, Chien-Hung; Ju, Jau-Jiu; Wu, Chia-Hung; Huang, Chun-Chieh; Duan, Lili; Lee, Yuan-Chin, Manufacturing-process equipment.
  2. Ruden, Shawn Allen; Roberts, Bryan Charles, Noncontact positioning of a workpiece.
  3. Grimes, Jeffrey J.; Hogan, Dennis P., Nozzle alignment tool for a fluid dispensing apparatus.
  4. Hwu, En-Te, Optical module for X-ray microscope.
  5. Reinhardt, John C., Rotation stage.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로