IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0496907
(2006-08-01)
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등록번호 |
US-8270049
(2012-09-18)
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발명자
/ 주소 |
|
출원인 / 주소 |
|
대리인 / 주소 |
|
인용정보 |
피인용 횟수 :
3 인용 특허 :
115 |
초록
▼
A method is provided for characterizing color separation misregistration of a printer device using color separations of a color space for marking substrate. The method includes providing an input image including a pattern of patches including at least one measurement patch, each measurement patch ha
A method is provided for characterizing color separation misregistration of a printer device using color separations of a color space for marking substrate. The method includes providing an input image including a pattern of patches including at least one measurement patch, each measurement patch having at least a first and second color separation of the color space, and marking a substrate in accordance with the input image for generating an output image having a marked pattern of patches which corresponds to the pattern of patches. Spectral reflectance of at least one respective patch of the marked patch pattern of the output image is measured and respective spectral reflectance values corresponding to the measuring are generated. Misregistration is characterized between the at least first and second color separations of each measurement patch of the at least one measurement patch based on the spectral reflectance values.
대표청구항
▼
1. A method for characterizing color separation misregistration of a printer device using a color space having N color separations for marking a substrate, comprising: providing an input image including a pattern of patches including at least one measurement patch, each measurement patch including a
1. A method for characterizing color separation misregistration of a printer device using a color space having N color separations for marking a substrate, comprising: providing an input image including a pattern of patches including at least one measurement patch, each measurement patch including at least a first and second line screen each having a set of at least two lines, wherein the set of at least two lines corresponding to the respective at least said first and second line screens are each formed of different color separations of the N color separations, respectively, wherein the first line screen is shifted relative to the second line screen using only one phase shift so that the at least two lines of the first line screen partially overlap the at least two lines of the second line screen forming at least one overlapping portion;marking said substrate in accordance with the input image for generating an output image having a marked pattern of patches which corresponds to the pattern of patches;measuring spectral reflectance of at least one respective patch of the marked patch pattern of the output image, wherein the measuring includes measuring the spectral reflectance of the at least one overlapping portion marked on the substrate;generating respective spectral reflectance values corresponding to the measuring;characterizing misregistration between the color separations associated with each of the at least first and second line screens of a marked measurement patch that corresponds to a measurement patch of the at least one measurement patch based on the spectral reflectance value that corresponds to the marked measurement patch, wherein the pattern of patches further includes a plurality of calibration patches; andusing spectral reflectance values corresponding to a marked plurality of calibration patches of the marked patch pattern that corresponds to the plurality of calibration patches for the characterizing the misregistration, andwherein the plurality of calibration patches includes a plurality of Neugebauer patches, including a Neugebauer patch formed of a different grouping for each possible permutation of the N color separations of the color space, including the substrate itself, the method further comprising:using spectral reflectance values corresponding to a marked plurality of Neugebauer patches of the marked patch pattern that corresponds to the plurality of Neugebauer patches for the characterizing the misregistration. 2. The method according to claim 1, wherein the pattern of patches further includes a plurality of calibration patches, the method further comprising: using spectral reflectance values corresponding to a marked plurality of calibration patches of the marked patch pattern that corresponds to the plurality of calibration patches for the characterizing the misregistration. 3. The method according to claim 1, the method further comprising generating a calibration data structure storing a plurality of entries, each entry having a spectral reflectance value and corresponding misregistration data indicative of degree and direction of misregistration between at least two color separations; wherein the characterizing the misregistration comprises:identifying the calibration data structure entry having a spectral reflectance value that optimally matches the measured reflectance; andusing the corresponding misregistration data to characterize the misregistration. 4. The method according to claim 1, wherein the method further comprises: using the measured spectral reflectance values corresponding to the marked plurality of Neugebauer patches for determining transmission spectra for the marked plurality of Neugebauer primary patches; andusing the transmission spectra for the marked plurality of Neugebauer primary patches for characterizing the misregistration. 5. The method according to claim 1, wherein the at least two lines of the at least first and second line screens are parallel. 6. The method according to claim 5, wherein the plurality of calibration patches comprises a plurality of single separation patches, each respective single separation patch including a single different line screen for each of the at least first and second line screens, the method further comprising: using spectral reflectance values corresponding to a marked plurality of single separation patches of the marked patch pattern that corresponds to the plurality of single separation patches for the characterizing the misregistration. 7. The method according to claim 6, wherein the method further comprises: using the measured spectral reflectance values corresponding to the marked plurality of single separation patches for determining at least one of a scattering probability coefficient a, and a width of the parallel lines of each respective marked single separation patch; andusing the determined at least one of the scattering probability coefficient and line width information of the respective marked single separation patches for the characterizing the misregistration. 8. The method according to claim 1, wherein each measurement patch of the at least one measurement patch includes all of the N color separations included in the color space; and misregistration for each of the color separations relative to another color separation included in the color space is determined, and N is greater than 2. 9. The method according to claim 1, wherein each measurement patch of the at least one measurement patch has at least a first, second and third color separation, and misregistration between at least the first and third color separations and between the second and third color separations is determined based on one spectral reflectance measurement of the measurement patch. 10. A method for characterizing color separation misregistration of a printer device using a color space having N color separations for marking a substrate, comprising: providing an input image including a pattern of patches including at least one measurement patch, each measurement patch including at least a first and second line screen each having a set of at least two lines, wherein the set of at least two lines corresponding to the respective at least said first and second line screens are each formed of different color separations of the N color separations, respectively, wherein the first line screen is shifted relative to the second line screen using only one phase shift so that the at least two lines of the first line screen partially overlap the at least two lines of the second line screen forming at least one overlapping portion;marking said substrate in accordance with the input image for generating an output image having a marked pattern of patches which corresponds to the pattern of patches;measuring spectral reflectance of at least one respective patch of the marked patch pattern of the output image, wherein the measuring includes measuring the spectral reflectance of the at least one overlapping portion marked on the substrate;generating respective spectral reflectance values corresponding to the measuring; andcharacterizing misregistration between the color separations associated with each of the at least first and second line screens of a marked measurement patch that corresponds to a measurement patch of the at least one measurement patch based on the spectral reflectance value that corresponds to the marked measurement patch, generating a calibration data structure storing a plurality of entries, each entry having a spectral reflectance value and corresponding misregistration data indicative of degree and direction of misregistration between at least two color separations;wherein the characterizing the misregistration comprises: identifying the calibration data structure entry having a spectral reflectance value that optimally matches the measured reflectance; andusing the corresponding misregistration data to characterize the misregistration, andwherein generating the calibration data structure includes applying a line spread function. 11. A processor assembly including at least one tangible processor for receiving a spectral reflectance value corresponding to spectral reflectance measurements of respective patches of a pattern of patches included in an output image output by a printer device using N color separations of a color space for marking a substrate, the pattern of patches including a measurement patch including at least a first, second and third line screen each having a set of at least two lines, the sets of lines formed of a first, second and third color separation of the N color separations, respectively; the processor assembly including a misregistration determination module including a series of programmable instructions executable by the at least one processor for characterizing misregistration between the first, second, and third color separations of the measurement patch based on a single spectral reflectance value associated with the measurement patch,wherein the pattern of patches includes a plurality of Neugebauer patches, including a Neugebauer patch formed of a different grouping for each possible permutation of the N color separations of the color space, including no color separation; andwherein the misregistration determination module:uses measured spectral reflectance values corresponding to the marked plurality of Neugebauer patches for determining transmission spectra for the marked plurality of Neugebauer primary patches; anduses the transmission spectra for the marked plurality of Neugebauer primary patches for characterizing the misregistration. 12. The processor assembly according to claim 11, wherein the misregistration determination module further generates a calibration data structure storing a plurality of entries, each entry having a spectral reflectance value and corresponding misregistration data indicative of degree and direction of misregistration between at least two color separations; and wherein the characterizing the misregistration comprises:identifying the calibration data structure entry having a spectral reflectance value that optimally matches the measured reflectance; andusing the corresponding misregistration data to characterize the misregistration. 13. The processor assembly according to claim 11, wherein the at least two lines of the at least first, second, and third line screens of the measurement patch are parallel lines, and wherein a line formed of the first color separation simultaneously partially overlaps a line formed of the second color separation and a line formed of the third color separation, forming at least one overlapping portion, and wherein the spectral reflectance value is associated with the at least one overlapping portion marked on the substrate. 14. The processor assembly according to claim 11, wherein misregistration between at least the first and third color separations and between the second and third color separations is determined based on one spectral reflectance measurement of the measurement patch. 15. A processor assembly including at least one tangible processor for receiving a spectral reflectance value corresponding to spectral reflectance measurements of respective patches of a pattern of patches included in an output image output by a printer device using N color separations of a color space for marking a substrate, the pattern of patches including a measurement patch including at least a first, second and third line screen each having a set of at least two lines, the sets of lines formed of a first, second and third color separation of the N color separations, respectively; the processor assembly including a misregistration determination module including a series of programmable instructions executable by the at least one processor for characterizing misregistration between the first, second, and third color separations of the measurement patch based on a single spectral reflectance value associated with the measurement patch,wherein the at least two lines of the at least first, second, and third line screens of the measurement patch are parallel lines, and wherein a line formed of the first color separation simultaneously partially overlaps a line formed of the second color separation and a line formed of the third color separation, forming at least one overlapping portion, and wherein the spectral reflectance value is associated with the at least one overlapping portion marked on the substrate,wherein the pattern of patches further includes a plurality of single separation patches, each respective single separation patch including a single different line screen of the at least first, second, and third line screens; andwherein the misregistration determination:uses measured spectral reflectance values corresponding to the marked plurality of single separation patches for determining at least one of a scattering probability coefficient a , and a width of the at least two parallel lines of each respective marked single separation patch; anduses the determined at least one of the scattering probability coefficient and line width information of the respective marked single separation patches for characterizing the misregistration. 16. A processor assembly having a memory device storing a calibration data structure storing a plurality of entries, each entry having a single spectral reflectance value and corresponding misregistration data indicative of degree and direction of misregistration between N color separations of a color space, wherein N is greater than 2; wherein each entry corresponds to a measurement patch formed of at least a first, second, and third line screen each having a set of at least two lines, wherein the set of lines corresponding to the respective at least first, second, and third line screens are each formed of different color separations of the N color separations, respectively, wherein the first, second, and third line screens are shifted relative to each other using only one phase shift so that the at least two lines of the first line screen partially overlap the at least two lines of at least one of the second and third line screens forming at least one overlapping portion, andthe spectral reflectance value corresponding to each entry is related to spectral reflectance of the entry's at least one overlapping portion,wherein the misregistration data includes fast scan direction data and slow scan direction data each indicative of degree and direction of misregistration in the respective scan direction; andwherein the data structure is generated based on spectral reflectance measurements of a plurality of calibration patches comprising:a plurality of Neugebauer patches, including a Neugebauer patch formed of a different grouping for each possible permutation of the N color separations, including no color separation; anda plurality of single separation patches, each formed of a different color separation of the N color separations and including a single line screen having parallel lines formed of the corresponding color separation. 17. The processor assembly according to claim 16, wherein the single spectral reflectance value associated with each entry represents an actual measurement of spectral reflectance of a marked measurement patch having N color separations, and the corresponding misregistration data describes misregistration of the N color separations included in the marked measurement patch.
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