[특허]Polymorphic automatic test systems and methods

Polymorphic automatic test systems and methods 원문보기

IPC분류정보
국가/구분	United States(US) Patent 등록
국제특허분류(IPC7판)	G01R-031/28 G01R-031/00 G06F-009/46 G06F-009/45 G06F-009/44
출원번호	US-0660593 (2010-03-01)
등록번호	US-8296612 (2012-10-23)
발명자 / 주소	Luff, Edwin F. Platsidakis, Michael
출원인 / 주소	Practical Engineering Inc.
대리인 / 주소	Zitkowsky, Ivan David
인용정보	피인용 횟수 : 0 인용 특허 : 42

초록 ▼

An Analog/mixed signal automatic test system includes a software architecture that creates a virtual composite instruments through novel software dynamic allocation of low level resources. These virtual composite instruments provide backwards and forwards compatibility to a variety of automatic test equipment, known or available on the market. The virtual composite instruments are free from the normal constraints imposed by hardware implementations. Creation of the virtual composite instruments allows a single piece of automatic test equipment system to emulate many implementations of automatic test equipment, providing higher utilization, and therefore a lower cost test solution for device manufacturers. The test instruments are preferably object controls and are preferably instantiated and controlled by the test system server. This allows multiple users to control the tester simultaneously across, for example, the Internet.

대표청구항 ▼

1. A composite instrument component for use in an automatic test instrument, comprising: at least two resource instrument components being associated with at least two test elements;a composite instrument template for combining at least two said resource instrument components to form an interactive object, anda test program component including information for sequencing said at least two test elements for testing an analog/mixed signal semiconductor device under test. 2. The composite instrument component of claim 1, wherein at least one of said test elements is a hardware test element. 3. The composite instrument component of claim 1, wherein at least one of said test elements includes a combined hardware-software test element. 4. The composite instrument component of claim 3, wherein said combined hardware-software test element includes an analog-to-digital converter (ADC) and an analyzer using a Fast Fourier Transform (FFT) technique. 5. The composite instrument component of claim 1, wherein said interactive object includes definitions provided in a Teradyne test system. 6. The composite instrument component of claim 5, wherein said resource instrument components are controlled by a Teradyne test system language. 7. The composite instrument component of claim 1, wherein said interactive object includes definitions provided in an LTX test system. 8. The composite instrument component of claim 7, wherein said resource instrument components are controlled by an LTX test system language. 9. The composite instrument component of claim 1, wherein said interactive object includes definitions provided in a Credence test system. 10. The composite instrument component of claim 9, wherein said resource instrument components are controlled by a Credence test system language. 11. The composite instrument component of claim 1, wherein said interactive object includes definitions provided in a specifically designed test system. 12. The composite instrument component of claim 11, wherein said resource instrument components are controlled by a language of said specifically designed test system. 13. The composite instrument component of claim 1 wherein said test elements are hardware sub-components. 14. The composite instrument component of claim 1 wherein said test elements are hardware components. 15. The composite instrument component of claim 14, wherein at least one of said hardware components is a high-level discrete instrument. 16. The composite instrument component of claim 15, wherein said high-level discrete instrument is a digital multimeter. 17. The composite instrument component of claim 15, wherein said high-level discrete instrument is a voltage source. 18. The composite instrument component of claim 15, wherein said high-level discrete instrument is a frequency generator. 19. A dynamic resource allocation component for use in an automatic test instrument for testing a semiconductor device, comprising: a list of resource instrument components including their availability status, anda map of virtual composite physical resource addresses, configured for dynamic allocation of components for running multiple devices under test (DUT). 20. The dynamic resource allocation component of claim 19 wherein each of said resource instrument components is associated with at least two test elements. 21. The dynamic resource allocation component of claim 20, wherein at least one of the test elements is a hardware test element. 22. The dynamic resource allocation component of claim 20, wherein at least one of the test elements includes a combined hardware-software test element. 23. A server executable for use in an automatic test instrument, comprising: at least two resource instrument components;a virtual composite instrument component corresponding to a hardware resource;a dynamic resource allocation component; anda site component interacting with said dynamic resource allocation component allocating virtual composite instrument and available said resources. 24. The server executable of claim 23, wherein said virtual composite instrument component includes: at least two resource instrument components being associated with at least two test elements; anda composite instrument template for combining at least two said resource instrument components to form an interactive object. 25. The server executable of claim 24, wherein said dynamic resource allocation component includes: a list of resource instrument components including their availability status; anda map of virtual composite physical resource addresses. 26. A server executable for use in an automatic test instrument, comprising: at least two virtual composite instrument components corresponding to at least two hardware resources associated with a hardware layer;a dynamic resource allocation component for allocating dynamically said virtual composite instrument components for running multiple devices under test (DUT); anda site component interacting with said dynamic resource allocation component assembling virtual composite instrument components from available said resources. 27. The server executable of claim 26, wherein said virtual composite instrument component includes: at least two resource instrument components being associated with at least two test elements; anda composite instrument template for combining at least two said resource instrument components to form an interactive object. 28. The server executable of claim 27, wherein said dynamic resource allocation component includes: a list of resource instrument components including their availability status; anda map of virtual composite physical resource addresses. 29. The server executable of claim 27, wherein at least one of said test elements is a hardware test element. 30. The server executable of claim 27, wherein at least one of said test elements includes a combined hardware-software test element.

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IPC	Description
A	생활필수품
A62	인명구조; 소방(사다리 E06C)
A62B	인명구조용의 기구, 장치 또는 방법(특히 의료용에 사용되는 밸브 A61M 39/00; 특히 물에서 쓰이는 인명구조 장치 또는 방법 B63C 9/00; 잠수장비 B63C 11/00; 특히 항공기에 쓰는 것, 예. 낙하산, 투출좌석 B64D; 특히 광산에서 쓰이는 구조장치 E21F 11/00)
A62B-1/08	.. 윈치 또는 풀리에 제동기구가 있는 것

내보내기 구분	파일저장 인쇄 메일전송
구성항목	기본정보 상세정보 관리번호, 국가코드, 자료구분, 상태, 출원번호, 출원일자, 공개번호, 공개일자, 등록번호, 등록일자, 발명명칭(한글), 발명명칭(영문), 출원인(한글), 출원인(영문), 출원인코드, 대표IPC 관리번호, 국가코드, 자료구분, 상태, 출원번호, 출원일자, 공개번호, 공개일자, 공고번호, 공고일자, 등록번호, 등록일자, 발명명칭(한글), 발명명칭(영문), 출원인(한글), 출원인(영문), 출원인코드, 대표출원인, 출원인국적, 출원인주소, 발명자, 발명자E, 발명자코드, 발명자주소, 발명자 우편번호, 발명자국적, 대표IPC, IPC코드, 요약, 미국특허분류, 대리인주소, 대리인코드, 대리인(한글), 대리인(영문), 국제공개일자, 국제공개번호, 국제출원일자, 국제출원번호, 우선권, 우선권주장일, 우선권국가, 우선권출원번호, 원출원일자, 원출원번호, 지정국, Citing Patents, Cited Patents
저장형식	Text(ASCII format) Excel format PIAS분석(.xls)
메일정보	받는사람 (필수) @ 보내는사람 (선택) @ 제목 내용 KISTI 검색결과 이메일 서비스
안내	총 건의 자료가 검색되었습니다. 다운받으실 자료의 인덱스를 입력하세요. (1-10,000) 검색결과의 순서대로 최대 10,000건 까지 다운로드가 가능합니다. 데이타가 많을 경우 속도가 느려질 수 있습니다.(최대 2~3분 소요) 다운로드 파일은 UTF-8 형태로 저장됩니다. 파일의 내용이 제대로 보이지 않을실 때는 웹브라우저 상단의 보기 -> 인코딩 -> 자동선택 여부를 확인하십시오. ~ Text(ASCII format) Excel format

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Polymorphic automatic test systems and methods 원문보기

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