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An apparatus is provided that includes a field reflector and a plurality of pairs of object reflectors. The apparatus also includes a plurality of source and detector port pairs, where each source port is configured to pass a beam of radiation, and each detector port is configured to receive a beam

An apparatus is provided that includes a field reflector and a plurality of pairs of object reflectors. The apparatus also includes a plurality of source and detector port pairs, where each source port is configured to pass a beam of radiation, and each detector port is configured to receive a beam of radiation. The source and detector ports of each pair are positioned proximate an outer edge of the field reflector such that an optical axis of the field reflector lies between the respective source port and detector port. The object reflectors and source and detector port pairs are arranged such that each source and detector port pair is associated with a respective pair of object reflectors forming a distinct channel, where the source and detector port pair, and centers of the associated pair of object reflectors, of each channel lie in a distinct plane.

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1. An apparatus comprising: a field reflector having an optical axis and a reflective surface;a plurality of pairs of object reflectors each of which has a reflective surface arranged to face the reflective surface of the field reflector; anda plurality of source port and detector port pairs facing

1. An apparatus comprising: a field reflector having an optical axis and a reflective surface;a plurality of pairs of object reflectors each of which has a reflective surface arranged to face the reflective surface of the field reflector; anda plurality of source port and detector port pairs facing the reflective surfaces of the object reflectors, the source port and detector port of each pair being positioned proximate an outer edge of the field reflector such that the optical axis of the field reflector lies between the respective source port and detector port, wherein each source port is configured to pass a beam of radiation to propagation between the field reflector and object reflectors, and each detector port is configured to receive a beam of radiation propagating between the field reflector and object reflectors,wherein the object reflectors and source port and detector port pairs are arranged such that each source port and detector port pair is associated with a respective pair of object reflectors forming a distinct channel, and wherein the source port and detector port pair, and centers of the associated pair of object reflectors, of each channel lie in a distinct plane. 2. The apparatus of claim 1, wherein the object reflectors and source port and detector port pairs are arranged such that the distinct planes of the channels intersect with a non-obtuse angle of intersection of approximately 360°/2n, where n represents the number of channels. 3. The apparatus of claim 1, wherein the object reflectors are arranged around a common point on the optical axis of the field reflector. 4. The apparatus of claim 3, wherein for each channel, the source port and detector port lie on a chord of the field reflector, and the object reflectors are tilted at an angle along an axis perpendicular to the respective chord and perpendicular to the optical axis of the field reflector. 5. The apparatus of claim 4, wherein for each channel, the chord along which the source port and detector port lie is displaced from the diameter of the field reflector. 6. The apparatus of claim 3, wherein the field and object reflectors comprise spherical, concave reflectors, arranged in a quatrefoil shape or a circle around the common point. 7. The apparatus of claim 3, wherein the common point is equidistant between the object reflectors. 8. The apparatus of claim 1, wherein for each channel, the field reflector, source port and detector port pair, and associated pair of object reflectors are arranged such that a beam of radiation passed by the source port propagates and reflects between the field reflector and respective pair of object reflectors until the beam reaches the respective detector port. 9. The apparatus of claim 1, wherein each source port is configured to pass a beam of radiation in a distinct frequency band. 10. The apparatus of claim 9, wherein each source port is configured to pass a beam of radiation in a distinct frequency band in the terahertz spectral region. 11. The apparatus of claim 9, wherein the plurality of source port and detector port pairs include at least a first source port and a second source port, the first source port being configured to pass a beam of radiation in the terahertz spectral region, and the second source port being configured to pass a beam of radiation in the infrared or visible spectral region. 12. The apparatus of claim 9, wherein the plurality of source port and detector port pairs include at least a first source port, a second source port and a third source port, the first source port being configured to pass a beam of radiation in the terahertz spectral region, the second source port being configured to pass a beam of radiation in the infrared spectral region, and the third source port being configured to pass a beam of radiation in the visible spectral region. 13. An apparatus comprising: a field reflector having an optical axis and a reflective surface;a first channel comprising: a first pair of object reflectors each of which has a reflective surface arranged to face the reflective surface of the field reflector; anda first source port and a first detector port positioned proximate an outer edge of the field reflector such that the optical axis of the field reflector lies between the first source port and first detector port, wherein the first source port and first detector port, and centers of the first pair of object reflectors, lie in a first plane; anda second channel comprising:a second pair of object reflectors each of which has a reflective surface arranged to face the reflective surface of the field reflector; anda second source port and a second detector port positioned proximate the outer edge of the field reflector such that the optical axis of the field reflector lies between the second source port and second detector port, wherein the second source port and second detector port, and centers of the second pair of object reflectors, lie in a second plane that is distinct from the first plane. 14. The apparatus of claim 13, wherein the first and second pairs of object reflectors and the first and second source ports and detector ports are arranged such that the first and second planes intersect at approximately a right angle. 15. The apparatus of claim 13, wherein the first and second pairs of object reflectors are arranged around a common point on the optical axis of the field reflector. 16. The apparatus of claim 15, wherein the first source port and first detector port lie on a first chord of the field reflector, and the object reflectors of the first pair of object reflectors are tilted at an angle along an axis perpendicular to the first chord and perpendicular to the optical axis of the field reflector, and wherein the second source port and second detector port lie on a second chord of the field reflector, and the object reflectors of the second pair of object reflectors are tilted at an angle along an axis perpendicular to the second chord and perpendicular to the optical axis of the field reflector. 17. The apparatus of claim 16, wherein each of the first chord along which the first source port and first detector port lie, and the second chord along which the second source port and second detector port lie, is displaced from the diameter of the field reflector. 18. The apparatus of claim 15, wherein the field and object reflectors comprise spherical, concave reflectors, arranged in a quatrefoil shape or a circle around the common point. 19. The apparatus of claim 15, wherein the common point is equidistant between the object reflectors. 20. The apparatus of claim 13, wherein the field reflector, first pair of object reflectors, and first source port and first detector port are arranged such that a first beam of radiation passed by the first source port propagates and reflects between the field reflector and respective first pair of object reflectors until the first beam reaches the first detector port, and wherein the field reflector, second pair of object reflectors, and second source port and second detector port are arranged such that a second beam of radiation passed by the second source port propagates and reflects between the field reflector and respective second pair of object reflectors until the second beam reaches the second detector port. 21. The apparatus of claim 13, wherein the first and second source ports are configured to pass beams of radiation in respective, distinct frequency bands. 22. The apparatus of claim 21, wherein the first and second source ports are configured to pass beams of radiation in respective, distinct frequency bands in the terahertz spectral region. 23. The apparatus of claim 21, wherein the first source port is configured to pass a beam of radiation in the terahertz spectral region, and the second source port is configured to pass a beam of radiation in the infrared or visible spectral region. 24. The apparatus of claim 13 further comprising a third channel, the third channel comprising: a third pair of object reflectors each of which has a reflective surface arranged to face the reflective surface of the field reflector; anda third source port and a third detector port positioned proximate the outer edge of the field reflector such that the optical axis of the field reflector lies between the third source port and third detector port, wherein the third source port and third detector port, and centers of the third pair of object reflectors, lie in a third plane that is distinct from the first and second planes. 25. The apparatus of claim 24, wherein the first, second and third pairs of object reflectors and the first, second and third source ports and detector ports are arranged such that the first, second and third planes intersect at approximately a 60° angle. 26. The apparatus of claim 24, wherein the first source port is configured to pass a beam of radiation in the terahertz spectral region, the second source port is configured to pass a beam of radiation in the infrared spectral region, and the third source port is configured to pass a beam of radiation in the visible spectral region. 27. An apparatus comprising: a field reflector having an optical axis and a reflective surface;a plurality of pairs of object reflectors each of which has a reflective surface arranged to face the reflective surface of the field reflector; anda plurality of source port and detector port pairs facing the reflective surfaces of the object reflectors, the source port and detector port of each pair being positioned proximate an outer edge of the field reflector such that the optical axis of the field reflector lies between the respective source port and detector port,wherein the object reflectors and source port and detector port pairs are arranged such that each source port and detector port pair is associated with a respective pair of object reflectors forming a distinct channel, the pair of object reflectors of different channels have different optical properties for supporting different frequency bands,wherein for each channel, the source port and detector port pair, and centers of the associated pair of object reflectors, lie in a distinct plane, andwherein for each channel, the source port is configured to pass a beam of radiation in a distinct frequency band to propagation between the field reflector and the associated pair of object reflectors, and the detector port is configured to receive a beam of radiation propagating between the field reflector and associated pair of object reflectors.