IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0565511
(2004-07-13)
|
등록번호 |
US-8303577
(2012-11-06)
|
우선권정보 |
DE-103 33 562 (2003-07-23) |
국제출원번호 |
PCT/EP2004/007733
(2004-07-13)
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§371/§102 date |
20080114
(20080114)
|
국제공개번호 |
WO2005/011544
(2005-02-10)
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발명자
/ 주소 |
- Dick, Manfred
- Vogelsang, Hartmut
|
출원인 / 주소 |
|
대리인 / 주소 |
Patterson Thuente Christensen Pedersen, P.A.
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인용정보 |
피인용 횟수 :
0 인용 특허 :
10 |
초록
▼
The invention relates to a method for determining an actual value of at least one system parameter or a deviation from a set value of at least one parameter of a system for the treatment of an eye using a treatment laser beam emitted by said system. According to the invention, the surface of a calib
The invention relates to a method for determining an actual value of at least one system parameter or a deviation from a set value of at least one parameter of a system for the treatment of an eye using a treatment laser beam emitted by said system. According to the invention, the surface of a calibrating body is ablated with at least a partial beam of the treatment laser beam with a predetermined ablation program. The surface ablated by the treatment laser beam is examined by means of aberrometry and/or profilometry. The actual value of the system parameter or the deviation from the set value of the system parameter is determined on the basis of the examination data detected during the examination.
대표청구항
▼
1. A method for determining an actual value of at least one laser system parameter or a deviation from a desired value of the at least one laser system parameter of an eye treatment system emitting a treatment laser beam, the method comprising: ablating a surface of a calibrating body alternately or
1. A method for determining an actual value of at least one laser system parameter or a deviation from a desired value of the at least one laser system parameter of an eye treatment system emitting a treatment laser beam, the method comprising: ablating a surface of a calibrating body alternately or simultaneously with ablating a surface of an eye by at least one partial beam of the treatment laser beam according to a predetermined ablation program the ablating resulting in an ablated surface of the calibrating body;examining the ablated surface of the calibrating body ablated with the treatment laser beam with at least one of aberrometry or profilometry to obtain examination data; andusing the examination data to determine an actual value of the at least one laser system parameter or a deviation from a desired value of the at least one laser system parameter and to adjust the at least one laser system parameter during ablating of the surface of the calibrating body and the surface of the eye. 2. The method of claim 1, further comprising selecting said calibrating body to be plate-shaped in an area to be ablated. 3. The method of claim 1, further comprising selecting said calibrating body to be spherically-shaped in an area to be ablated. 4. The method of claim 1, further comprising selecting said calibrating surface comprises a shape of a corneal portion of an eye to be treated. 5. The method of claim 1, further comprising selecting said calibrating body to be polymethylmethacrylate. 6. The method of claim 1, wherein said calibrating body is non-transmitting for a wavelength of optical radiation used for measurement during said examination. 7. The method of claim 1, further comprising separating said treatment laser beam from optical radiation used for examination. 8. The method of claim 7, wherein the separating is performed using a filter. 9. The method of claim 1, further comprising arranging said calibrating body in a working plane of the eye treatment system during examination. 10. The method of claim 1, further comprising splitting said treatment laser beam and ablating said calibrating body with a first beam portion and treating the eye with another beam portion. 11. The method of claim 1, further comprising providing a measurement ray bundle to examine said calibrating body and coupling said measurement ray bundle colinearly to at least one of said partial beams to ablate said calibrating body. 12. The method of claim 1, further comprising modifying a wavefront to examine an ablation condition of said ablated surface with aberrometry. 13. The method of claim 1, further comprising evaluating wavefront data relating to a wavefront to examine an ablation condition of said calibrating body with aberrometry. 14. The method of claim 1, further comprising performing said profilometry using an optically operating method. 15. The method of claim 1, further comprising determining said actual value or deviation from the desired value from the examination data for at least two system parameters. 16. The method of claim 1, further comprising comparing examination data with corresponding reference data. 17. The method of claim 1, further comprising examining a reference body having a predetermined ablation pattern by at least one of aberrometry or profilometry and using said examination data as reference data. 18. The method of claim 1, wherein the method is carried out in a cyclic manner, further comprising determining reference data for a current cycle of ablating the surface of the calibrating body using examination data of a preceding cycle. 19. The method of claim 1, further comprising determining at least one correction parameter value as a function of at least one of said determined actual value or deviation from the desired value, said correction parameter value usable to reduce at least one deviation from a desired condition. 20. The method of claim 1, further comprising modifying at least one corresponding setting of an adjusting unit of the treatment system as a function of at least one of the determined actual value or deviation from the desired value to reduce deviations from a desired condition or function. 21. The method of claim 1, further comprising modifying at least one of a position or an intensity of said treatment laser beam over time to achieve a predetermined ablation profile according to at least one of the determined actual value or deviation from the desired value. 22. The method of claim 1, further comprising modifying at least one of a position or an intensity of the treatment laser beam over time to achieve at least one parameter value for a program according to at least one of the determined actual value or the deviation from the desired value. 23. The method of claim 1, further comprising automatically changing a setting of the treatment system using at least one of the determined actual value or deviation from the desired value to reduce the deviation between actual value and desired values. 24. The method of claim 1, further comprising selecting the system parameter from the group consisting of: at least one of centration or position of the deflecting unit relative to a system for tracking eye movements;at least one of the mean total fluence, energy, or power of the treatment laser beam;a half-width of the treatment laser beam;information about a spot shape of the treatment laser beam;an energy distribution in a treatment spot;characteristics of a transition zone between optically active and inactive ablation zones and their relation to beam parameters;at least one of a short-term and long-term stability of or fluctuations in total fluence, total energy, or total power of the treatment laser beam;short-term and long-term drift in the deflecting unit;deviations from an optimal working distance;an efficiency of suction or removal of fumes generated by ablated material during ablation;temperature stability; anda dependence of the system parameters on other ambient parameters. 25. A system parameter determining device for determining at least one actual value of a laser system parameter or a deviation from a desired value of at least one laser system parameter of a system for treatment of an eye by a treatment laser beam emitted by said system, the device comprising: an examining unit that examines_at least one portion of an ablated surface of an ablated calibrating body by at least one of aberrometry or profilometry, the ablated calibrating body being subject to ablation alternately or simultaneously with the eye; andan evaluating unit operably coupled to the examining unit to determine an actual value of the system parameter or a deviation from the desired value of the system parameter with examination data determined during examination of the ablated calibrating body and operably coupled to the system for treatment of an eye by a treatment laser beam to return feedback information to the system for treatment of an eye by a treatment laser beam regarding the at least one laser system parameter during ablating of the surface of the calibrating body and the surface of the eye. 26. The device of claim 25, further comprising a filter and a photo detector, wherein said filter is selectively arranged to precede said photo detector in a beam path of said treatment laser beam, wherein said filter does not transmit optical radiation having a polarization or a wavelength of said treatment laser beam. 27. The device of claim 25, wherein said examining unit comprises an aberrometer. 28. The device of claim 25, wherein said aberrometer comprises a Hartmann-Shack sensor. 29. The device of claim 25, wherein said examining unit comprises an optically operating profilometer. 30. The device of claim 25, wherein said evaluating unit is configured to determine at least one of said actual value or deviation from a corresponding desired value from examination data for at least two system parameters. 31. The device of claim 25, wherein said evaluating unit is configured to determine the deviation from the desired value by comparing said examination data with corresponding reference data. 32. The device of claim 31, further comprising a memory for storing said reference data. 33. The device of claim 31, further comprising a reference body having a predetermined reference ablation pattern already applied thereto. 34. The device of claim 31, wherein said evaluating unit is configured to determine reference data during cyclic detection of examination data for a current cycle of ablating the surface of the calibrating body from examination data of a preceding cycle. 35. The device of claim 25, further comprising a correction value determining device to determine at least one correction parameter value of the treatment system as a function of at least one of the determined actual value or deviation from the desired value to reduce the deviation between the actual value and desired value. 36. The device of claim 25, wherein the system parameter is selected from the group consisting of: at least one of centration or position of the deflecting unit relative to a system for tracking eye movements;at least one of the mean total fluence, energy, or power of the treatment laser beam;a half-width of the treatment laser beam;information about a spot shape of the treatment laser beam;an energy distribution in a treatment spot;characteristics of a transition zone between optically active and inactive ablation zones and their relation to beam parameters;at least one of a short-term and long-term stability of or fluctuations in total fluence, total energy, or total power of the treatment laser beam;short-term and long-term drift in the deflecting unit;deviations from an optimal working distance;an efficiency of suction or removal of fumes generated by ablated material during ablation;temperature stability; anda dependence of the system parameters on other ambient parameters.
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