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Electroless deposition process on a silicon contact 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C23C-018/30
  • C23C-018/36
출원번호 US-0689176 (2010-01-18)
등록번호 US-8308858 (2012-11-13)
발명자 / 주소
  • Stewart, Michael P.
  • Weidman, Timothy W.
  • Shanmugasundram, Arulkumar
  • Eaglesham, David J.
출원인 / 주소
  • Applied Materials, Inc.
대리인 / 주소
    Patterson & Sheridan, LLP
인용정보 피인용 횟수 : 8  인용 특허 : 116

초록

Embodiments as described herein provide methods for depositing a material on a substrate during electroless deposition processes, as well as compositions of the electroless deposition solutions. In one embodiment, the substrate contains a contact aperture having an exposed silicon contact surface. I

대표청구항

1. A composition of an activation solution, comprising: a cobalt source at a concentration within a range from about 1 mM to about 100 mM;a fluoride source at a concentration within a range from about 10 mM to about 400 mM; anda hypophosphite source at a concentration within a range from about 5 mM

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  1. Gallagher, William J.; O'Sullivan, Eugene J.; Wang, Naigang, Electroless plated material formed directly on metal.
  2. Gallagher, William J.; O'Sullivan, Eugene J.; Wang, Naigang, Electroless plating of cobalt alloys for on chip inductors.
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  4. Kolics, Artur, Methods and materials for anchoring gapfill metals.
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