System to support testing of electronic devices, temperature control unit for the system, and method for controlling internal temperature of chamber of the system
A system to support the testing of electronic devices and a temperature control unit for the system are disclosed. A temperature controlling method for a chamber of the system is also disclosed. Low or high temperature air is supplied to the inside of the chamber when the electronic devices are test
A system to support the testing of electronic devices and a temperature control unit for the system are disclosed. A temperature controlling method for a chamber of the system is also disclosed. Low or high temperature air is supplied to the inside of the chamber when the electronic devices are tested at low or high temperature. External air is supplied to the inside of the chamber when the electronic devices are tested at room temperature.
대표청구항▼
1. A system to support testing of electronic devices, the system comprising: a loading device for loading the electronic devices onto a carrier board located at a loading site;a chamber having an inlet through which the carrier board is carried in and an outlet through which the carrier board is car
1. A system to support testing of electronic devices, the system comprising: a loading device for loading the electronic devices onto a carrier board located at a loading site;a chamber having an inlet through which the carrier board is carried in and an outlet through which the carrier board is carried out, the chamber receiving the carrier board, which is carried in through the inlet after the loading of the electronic devices by the loading devices, and allowing the electronic devices, loaded on the carrier board, to be assimilated with a test temperature condition and then to be tested;an unloading device for sorting the electronic devices loaded on the carrier board, according to a grade, and unloading them from the carrier board, wherein the carrier board is located at an unloading site after being carried out from the chamber through the outlet; anda temperature control unit for supplying air to the chamber to equalize the electronic devices loaded on the carrier board located in the chamber with a test condition,wherein the temperature control unit comprises:a fan for supplying air to the inside of the chamber;a fan driving device for driving the fan;a fan housing for containing the fan therein, the fan housing having a suction hole for sucking air from the chamber and a discharging hole for discharging the air to the chamber; andan external air inflow controlling device for allowing external air to flow into the fan housing when the fan is driven or for blocking the external air. 2. The system according to claim 1, wherein: the fan housing comprises an external inflow hole through which the external air flows in; andthe external air inflow controlling device comprises: a shutter member for opening or closing the external air inflow opening; anda shutter member driving device for operating the shutter member. 3. The system according to claim 2, wherein the external air inflow controlling device further comprises: a connecting member for connect the external air inflow opening to an air conditioning line, so that conditioned air flowing from the air conditioning line can be introduced to the fan housing through the external air inflow opening. 4. The system according to claim 2, wherein the external air inflow controlling device further comprises: a blocking member to prevent external foreign matter from flowing into the external air inflow opening. 5. The system according to claim 2, wherein the shutter member is automatically closed by a high or low temperature testing selection command, when high or low temperature testing is performed, and is automatically opened by a room temperature testing selection command when room temperature testing is performed. 6. The system according to claim 1, further comprising: an inlet shutter for opening or closing the inlet; andan outlet shutter for opening or closing the outlet. 7. The system according to claim 1, wherein, when the electronic devices are tested at room temperature, the inlet and outlet shutters open the inlet and the outlet and the external air inflow controlling device of the temperature control unit allows the external air to flow into the chamber. 8. A method for controlling an internal temperature of a chamber of a system to support testing of electronic devices, the method comprising: loading the electronic devices onto a carrier board located at a loading site;carrying the carrier board into a chamber through an inlet through formed in the chamber;after the electronic devices have been tested, carrying out the carrier board loaded with the electronic devices from the chamber through an outlet through formed in the chamber;unloading the electronic devices from the carrier board, wherein the electronic devices are sorted according to grade;supplying low or high temperature air to the inside of the chamber when low or high temperature testing is performed; andsupplying external air to the inside of the chamber when room temperature testing is performed. 9. The method according to claim 8, wherein the external air is temperature-conditioned by an external air-conditioner. 10. The method according to claim 8, further comprising: sealing the inside of the chamber when low or high temperature testing is performed; andopening the inside of the chamber when room temperature testing is performed. 11. A method for controlling an internal temperature of a chamber of a system to support testing of electronic devices, the method comprising: loading the electronic devices onto a carrier board located at a loading site;carrying the carrier board into a chamber through an inlet through formed in the chamber;after the electronic devices have been tested, carrying out the carrier board loaded with the electronic devices from the chamber through an outlet through formed in the chamber;unloading the electronic devices from carrier board, wherein the electronic devices are sorted according to grade;blocking external air from the inside of the chamber when low or high temperature testing is performed; andopening the inside of the chamber to the external air when room temperature testing is performed. 12. The method according to claim 11, wherein the external air is temperature-conditioned by an external air-conditioner.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.