IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0802538
(2010-06-07)
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등록번호 |
US-8340245
(2012-12-25)
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발명자
/ 주소 |
- Herranz, Michel
- Franco, Luis Roso
- Labajos, Francisco Martin
- Curto, Belen
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출원인 / 주소 |
- Sentinel Scanning Corporation
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대리인 / 주소 |
|
인용정보 |
피인용 횟수 :
4 인용 특허 :
153 |
초록
▼
In exemplary embodiments of the present invention, containers, such as, for example, those used in transportation and shipping, can be inspected by using a CT X-ray scanning system with a large area detector plate. In exemplary embodiments of the present invention the detector plate can directly con
In exemplary embodiments of the present invention, containers, such as, for example, those used in transportation and shipping, can be inspected by using a CT X-ray scanning system with a large area detector plate. In exemplary embodiments of the present invention the detector plate can directly convert X-rays transmitted through the container into visible light, thus forming light patterns on the outer surface of the plates. The plates can then be analyzed using, for example, CCD or ICCD cameras and a data processor so as to form real-time 2D and/or 3D images of objects in the container. In exemplary embodiments of the present invention each such plate can comprise a coating of X-ray converting material such as, for example, a phosphor on a metallic plate. In exemplary embodiments of the present invention an exemplary scanning system can, for example, rotate a rotor having an X-ray source on one side of an axis of rotation, and a detector including such detector plates on the other side of the axis. In exemplary embodiments of the present invention a container can be moved, through an opening in the rotor and support structure in synchronization with the rotor, such as, for example, by transporting the container on rails.
대표청구항
▼
1. An inspection system, comprising: a scanner support structure with an opening;a rotor mounted on said scanner support structure, said rotor mounted so as to rotate about an axis of rotation running through the opening, said rotor including: an X-ray source, anda detector, the detector being posit
1. An inspection system, comprising: a scanner support structure with an opening;a rotor mounted on said scanner support structure, said rotor mounted so as to rotate about an axis of rotation running through the opening, said rotor including: an X-ray source, anda detector, the detector being positioned to receive X-rays emitted from said X-ray source; anda drive device configured to move a container through said opening, a braking system configured to stop the rotation of said rotor at each of two stop positions and reverse the direction of rotation of said rotor at each of said stop positions, and move said container from a first reading position to a second reading position during the deceleration, stopping, and acceleration of said rotor at each of said stop positions. 2. The inspection system of claim 1, wherein said detector comprises a plate that directly converts incident X-rays into electromagnetic radiation of a wavelength differing from the wavelength of the X-rays. 3. The inspection system of claim 1, wherein said opening is one of: (i) greater than or equal to 3 meters in diameter, (ii) greater than or equal to 3.5 meters in diameter, (iii) greater than or equal to 4 meters in diameter, (iv) greater than or equal to 5 meters in diameter, (v) less than or equal to 2 meters in diameter and (vi) less than or equal to 1.5 meters in diameter. 4. The inspection system of claim 1, further comprising a data processor for processing the X-rays received by said detector to generate 2D and/or 3D images of at least some of the contents of a container placed in the opening. 5. The inspection system of claim 4, wherein said 2D and/or 3D images are color enhanced by the data processor. 6. The inspection system of claim 5, wherein said color enhancing assigns different colors to objects, as a function of their density. 7. The inspection system of claim 1, wherein said opening is of a size and shape to allow a transportation container to pass through it. 8. The inspection system of claim 1, wherein said detector comprises a coating on said a substrate, said coating comprising a mixture of: a phosphor compound that converts X-rays into electromagnetic radiation of a wavelength differing from the wavelength of said X-rays; anda protective compound that provides protection to said phosphor. 9. The inspection system of claim 8, wherein said coating further comprises a reflector compound that amplifies said electromagnetic radiation. 10. The inspection system of claim 9, wherein said phosphor compound is selected from the group consisting of CaWO4, YTaO4, Gd2O2S and LaOBr. 11. The inspection system of claim 9, wherein said phosphor compound is doped or activated with rare earth elements.
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