Methods for employing stroboscopic signal amplification and surface enhanced raman spectroscopy for enhanced trace chemical detection
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G01J-003/44
G01J-003/28
G01J-003/00
B82Y-020/00
출원번호
US-0020419
(2008-01-25)
등록번호
US-8363215
(2013-01-29)
발명자
/ 주소
Henry, Kent D.
Yamona, Blase
Lovell, John S.
출원인 / 주소
ADA Technologies, Inc.
인용정보
피인용 횟수 :
2인용 특허 :
82
초록
In one embodiment, a method and system is provided for detecting target materials using a combination of stroboscopic signal amplification and Raman spectroscopy techniques.
대표청구항▼
1. A method for detecting a target material, comprising: providing a metal surface, the metal being at least one member of Group 11 (IB) of the Periodic Table of the Elements;contacting, in an irradiating chamber, a sample fluid with the metal surface, the sample fluid having a direction of flow, th
1. A method for detecting a target material, comprising: providing a metal surface, the metal being at least one member of Group 11 (IB) of the Periodic Table of the Elements;contacting, in an irradiating chamber, a sample fluid with the metal surface, the sample fluid having a direction of flow, the direction of flow being at a first angle relative to a plane of the metal surface;irradiating the metal surface with radiation to produce scattered radiation, the radiation having an optical path that is at a second angle relative to the plane of the metal surface, the second angle ranging from about 80 to about 90 degrees;determining, by a computer, a reference signal, the reference signal being associated with an intensity of radiation scattered by the metal surface in the substantial absence of analytes and/or the reference signal being associated with an intensity of radiation scattered by a coating previously applied to the metal target being adsorbed on the surface;determining, by a computer, an analyte signal, the analyte signal being associated with an intensity of radiation scattered by analytes located on the metal surface;determining, by a computer for a selected current measurement, a ratio of the reference signal to an analyte signal; andanalyzing, by a detector, the scattered radiation for spectral information associated with a target material. 2. The method of claim 1, wherein the metal surface is nano-textured and further comprising before the contacting step: illuminating a surface with a strobe light while applying at least one of a positive and negative fluid pressure to the irradiated surface to form the sample fluid; andcollecting and transporting the sample fluid through a conduit to the irradiating chamber. 3. The method of claim 2, wherein the metal surface is nano-textured, wherein the conduit is unheated and has a length of no more than about 2 cm, and wherein the radiation has a wavelength ranging from about 5330 to about 10640 Angstroms. 4. The method of claim 2, wherein the strobe light and radiation source are located in a handheld unit, wherein the detector and power source are located in a discrete base unit, wherein a fiber optic extends between the handheld unit and the base unit, wherein the handheld unit comprises a head containing the strobe light and radiation source and a handgrip, and wherein the head is rotable relative to the handgrip to adjust a position of the strobe light relative to a surface to be sampled. 5. The method of claim 4, wherein an access door in the head provides access to the metal surface and wherein, when the access door is in an open position, power to the radiation source is switched off and, when the access door in a closed position, power to the radiation source is switched on. 6. The method of claim 1, wherein the irradiating step comprises the substeps: passing the radiation through a first lens to form a collimated beam;reflecting the radiation off of a beam splitter to direct the collimated beam along the optical path, the beam splitter reflecting at least most of the radiation along the optical path;passing the directed colliminated beam through a second lens to form a converged beam, the converged beam being focused on the metal surface;passing the scattered radiation through the second lens to form a colliminated beam of scattered radiation;passing the collimated beam of scattered radiation through the beam splitter, the beam splitter passing at least most of the collimated beam of scattered radiation along a second optical path;thereafter passing the collimated beam through a third lens to form a converged beam of scattered radiation, the converged beam of scattered radiation being focused on a fiber optic; andtransporting, by the fiber optic, the converged beam to the detector. 7. The method of claim 1, wherein the irradiating step comprises the substeps: passing the radiation through a beam splitter to direct the beam along the optical path;passing the directed radiation through a second lens to form a converged beam, the converged beam being focused on the metal surface;passing the scattered radiation through the second lens to form a colliminated beam of scattered radiation;reflecting the collimated beam off of the beam splitter, the beam splitter reflecting at least most of the collimated beam along a second optical path;thereafter passing the scattered collimated beam through a prism to direct the scattered collimated beam along the second optical path;thereafter passing the scattered collimated beam through a second lens to form a converged beam of scattered radiation, the converged beam of scattered radiation being focused on a fiber optic; andtransporting the converged beam, by the fiber optic, to the detector. 8. The method of claim 1, wherein the first angle is non-zero and has a magnitude of no more than about 65 degrees. 9. The method of claim 1, wherein the first angle ranges from about 65 to about 90 degrees. 10. The method of claim 1, further comprising: at least one of heating and cooling, by a thermal-electric device, the metal surface during the contacting step; andwhen the metal surface is cooled and after the contacting step, directing the contacted sample fluid with a heat rejecting side of the thermal-electric device to remove thermal energy. 11. The method of claim 1, further comprising: electrically charging, by a first polarity, the sample fluid upstream of the metal surface; andwherein the metal surface has a second polarity opposite to the first polarity to electrically attract any target material in the sample fluid. 12. The method of claim 1, wherein the metal surface comprises a plurality of differing regions, each region being configured to adsorb differing target materials, wherein, in the irradiating step, each region is irradiated. 13. A method for detecting a plurality of differing target materials, comprising: forming, on a metal surface, a plurality of differing regions, each region being configured to adsorb differing target materials and the metal being at least one member of Group 11 (IB) of the Periodic Table of the Elements;contacting, in an irradiating chamber, a sample fluid with the metal surface;irradiating, with radiation, each of the plurality of differing regions to produce scattered radiation;determining, by a computer, a reference signal, the reference signal being associated with an intensity of radiation scattered by the metal surface in the substantial absence of analytes and/or the reference signal being associated with an intensity of radiation scattered by a coating previously applied to the metal target being adsorbed on the surface;determining, by a computer, an analyte signal, the analyte signal being associated with an intensity of radiation scattered by analytes located on the metal surface;determining, by a computer for a selected current measurement, a ratio of the reference signal to an analyte signal; andanalyzing, by a detector, the scattered radiation for spectral information associated with each of the plurality of target materials. 14. The method of claim 13, wherein each of the differing regions has a differing level of affinity for adsorbing differing target materials. 15. The method of claim 14, wherein each of the regions has differing active groups attached to the metal surface. 16. The method of claim 13, wherein, in the contacting step, a direction of flow of the sample fluid is at a first angle relative to a plane of the textured metal surface, wherein, in the thereafter irradiating step, the radiation has an optical path that is at a second angle relative to the plane of the textured metal surface, the second angle ranging from about 80 to about 90 degrees; and further comprising: performing, for a selected current measurement, at least one of the following steps: (i) determining, by a computer and based on the ratio, a cumulative amount of analyte adsorbed on the metal surface in multiple prior measurements made using the metal surface and the selected current measurement;(ii) determining, by a computer and based on the ratio, a remaining operational life of the metal surface, the remaining operational life being related to an amount of active surface remaining in the metal surface; and(iii) by a computer, setting a set of zero analyte spectral characteristics equal to spectral characteristics in the analyte signal for the selected measurement, wherein the zero analyte spectral characteristics are later differenced from second spectral characteristics in a second analyte signal to produce delta spectral characteristics, the second analyte signal being from a second measurement performed after the selected measurement, and wherein the delta spectral characteristics is used to detect the presence of additional analytes on the metal surface. 17. A method for processing Raman signals, comprising: determining, by a computer, a reference signal, the reference signal being associated with an intensity of radiation scattered by a metal surface in the substantial absence of analytes and/or the reference signal being associated with an intensity of radiation scattered by a coating previously applied to the metal target being adsorbed on the surface, the metal being at least one member of Group 11 (IB) of the Periodic Table of the Elements;thereafter determining, by a computer, an analyte signal, the analyte signal being associated with an intensity of radiation scattered by analytes located on the metal surface;reusing the metal surface for multiple sample measurements; anddetermining, by a computer for a selected current measurement, a ratio of the reference signal to an analyte signal and performing, by a computer, at least one of the following steps: (i) determining, based on the ratio, a cumulative amount of analyte adsorbed on the metal surface in multiple prior measurements made using the metal surface and the selected current measurement;(ii) determining, based on the ratio, a remaining operational life of the metal surface, the remaining operational life being related to an amount of active surface remaining in the metal surface; and(iii) setting a set of zero analyte spectral characteristics equal to spectral characteristics in the analyte signal for the selected measurement, wherein the zero analyte spectral characteristics are later differenced from second spectral characteristics in a second analyte signal to produce delta spectral characteristics, the second analyte signal being from a second measurement performed after the selected measurement, and wherein the delta spectral characteristics is used to detect the presence of additional analytes on the metal surface. 18. The method of claim 17, wherein substep (i) is performed. 19. The method of claim 17, wherein substep (ii) is performed. 20. The method of claim 17, wherein substep (iii) is performed. 21. The method of claim 17, wherein the thereafter determining step comprises the sub-steps: contacting, in an irradiating chamber, a sample fluid with the metal surface, the sample fluid having a direction of flow, the direction of flow being at a first angle relative to a plane of the textured metal surface;thereafter irradiating the textured metal surface with radiation to produce scattered radiation, the radiation having an optical path that is at a second angle relative to the plane of the textured metal surface, the second angle ranging from about 80 to about 90 degrees;analyzing, by a detector, the scattered radiation for spectral information associated with a target material, wherein the metal surface comprises a plurality of differing regions, each region being configured to adsorb differing target materials, wherein, in the irradiating step, each region is irradiated.
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