IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0751432
(2010-03-31)
|
등록번호 |
US-8376611
(2013-02-19)
|
발명자
/ 주소 |
|
출원인 / 주소 |
- O2Micro International Limited
|
인용정보 |
피인용 횟수 :
3 인용 특허 :
12 |
초록
▼
A temperature detection circuit includes a sensor, an integrated circuit (IC) chip, and a resistor. The sensor is operable for sensing a temperature. The IC chip can compare a sense voltage indicative of the temperature with a threshold voltage indicative of a temperature threshold to determine a te
A temperature detection circuit includes a sensor, an integrated circuit (IC) chip, and a resistor. The sensor is operable for sensing a temperature. The IC chip can compare a sense voltage indicative of the temperature with a threshold voltage indicative of a temperature threshold to determine a temperature condition. The IC chip has a substantially constant parameter. The resistor is externally coupled to the IC chip. The IC chip maintains a current ratio, including a ratio of a first current flowing through the sensor to a second current flowing through the resistor, equal to the substantially constant parameter.
대표청구항
▼
1. A temperature detection circuit comprising; a sensor operable for sensing a temperature;an integrated circuit (IC) chip coupled to said sensor and operable for comparing a sense voltage indicative of said temperature with a threshold voltage indicative of a temperature threshold to determine a te
1. A temperature detection circuit comprising; a sensor operable for sensing a temperature;an integrated circuit (IC) chip coupled to said sensor and operable for comparing a sense voltage indicative of said temperature with a threshold voltage indicative of a temperature threshold to determine a temperature condition, said IC chip having a substantially constant parameter; anda resistor externally coupled to said IC chip, wherein said IC chip maintains a current ratio, comprising a ratio of a first current flowing through said sensor to a second current flowing through said resistor, equal to said substantially constant parameter. 2. The temperature detection circuit as claimed in 1, wherein said IC chip further comprises: a first current source coupled to said sensor and operable for providing said first current; anda second current source coupled to said resistor and operable for providing said second current,wherein said sensor provides said sense voltage based on said first current. 3. The temperature detection circuit as claimed in claim 2, wherein said IC chip further comprises: a switching circuit coupled to said first and second current sources and operable for enabling and disabling current paths of said first and second currents. 4. The temperature detection circuit as claimed in claim 1, wherein said IC chip further comprises: a reference voltage generator coupled to said resistor and operable for generating a reference voltage which is applied to said resistor to generate said second current; anda current mirror coupled to said sensor and said resistor and operable for mirroring said second current to generate said first current according to said substantially constant parameter,wherein said sensor provides said sense voltage based on said first current. 5. The temperature detection circuit as claimed in claim 4, wherein said IC chip further comprises: a switching circuit coupled to said current mirror and operable for enabling and disabling current paths of said first and second currents. 6. The temperature detection circuit as claimed in claim 4, wherein said reference voltage generator is operable for providing a plurality of threshold voltages indicative of a plurality of temperature thresholds. 7. The temperature detection circuit as claimed in claim 6, wherein said IC chip further comprises: a plurality of comparators operable for comparing said threshold voltages with said sense voltage. 8. The temperature detection circuit as claimed in claim 4, wherein said temperature condition is determined by a comparison of the resistance of said sensor to a function of said reference voltage, said threshold voltage, said substantially constant parameter, and the resistance of said resistor. 9. The temperature detection circuit as claimed in claim 1, wherein a reference voltage across said resistor is used as said threshold, voltage, and a voltage of said sensor is used as said sense voltage. 10. The temperature detection circuit as claimed in claim 9, wherein said temperature condition is determined by a comparison of the resistance of said sensor to a function of said substantially constant parameter and the resistance of said resistor. 11. The temperature detection circuit as claimed in claim 1, wherein said IC chip further comprises: a reference voltage generator coupled to said sensor and operable for generating said threshold voltage which is applied to said sensor to generate said first current; anda current mirror coupled to said sensor and said resistor and operable for mirroring said first current to generate said second current according to said substantially constant parameter,wherein said resistor provides said sense voltage based on said second current. 12. The temperature detection circuit as claimed in claim 11, wherein said temperature condition is determined by a comparison of the resistance of said sensor to a function of said substantially constant parameter and the resistance of said resistor. 13. The temperature detection circuit as claimed in claim 11, wherein said IC chip further comprises: a switching circuit coupled to said current mirror and operable for enabling and disabling current paths of said first and second currents. 14. The temperature detection circuit as claimed in claim 1, wherein said IC chip further comprises an analog to digital converter (ADC) operable for converting said sense voltage to a digital signal. 15. The temperature detection circuit as claimed in claim 1, wherein said sensor comprises a thermistor externally coupled to said IC chip. 16. A method comprising: maintaining a current ratio of a first current flowing through a sensor to a second current flowing through a resistor to be equal to a substantially constant parameter of an integrated circuit (IC) chip, said resistor externally coupled to said IC chip;comparing a sense voltage indicative of a temperature with a threshold voltage indicative of a temperature threshold; andgenerating a temperature detection signal indicative of a condition of said temperature according to a result of said comparing. 17. The method as claimed in claim 16, further comprising: using a voltage across said resistor as said threshold voltage; andproviding said sense voltage by said sensor. 18. The method as claimed in claim 17, wherein said temperature detection signal is determined by a comparison of the resistance of said sensor to a function of said substantially constant parameter and the resistance of said resistor. 19. The method as claimed in claim 16, further comprising: generating a reference voltage by a reference voltage generator;applying said reference voltage to generate said second current by said resistor;mirroring said second current to generate said first current according to said substantially constant parameter; andproviding said sense voltage based on said first current by said sensor. 20. The method as claimed in claim 19, wherein said temperature detection signal is determined by a comparison of the resistance of said sensor to a function of said threshold voltage, said reference voltage, said substantially constant parameter, and the resistance of said resistor. 21. The method as claimed in claim 16, further comprising: enabling and disabling current paths of said first and second currents. 22. The method as claimed in claim 16, further comprising: converting said sense voltage to a digital signal. 23. The method as claimed in claim 16, further comprising: generating said threshold voltage by a reference voltage generator;applying said threshold voltage to generate said first current by said sensor;mirroring said first current to generate said second current according to said substantially constant parameter; andusing a voltage across said resistor as said sense voltage. 24. The method as claimed in claim 23, wherein said temperature detection signal is determined by a comparison of the resistance of said sensor to a function of said substantially constant parameter and the resistance of said resistor. 25. An electronic system comprising: a power source;a load coupled to said power source and operable for receiving power from said power source; anda temperature detection circuit coupled to said power source and operable for detecting a temperature of said power source, said temperature detection circuit including an IC chip and peripheral elements of said IC chip including a sensor and a resistor externally coupled to said IC chip, wherein said IC chip maintains a current ratio of a current flowing through said sensor to a current flowing through said resistor equal to a substantially constant parameter, and wherein the resistance of said sensor is equal to a function determined by the resistance of said resistor and said substantially constant parameter when said temperature of said power source reaches a temperature threshold. 26. The electronic system as claimed in claim 25, wherein said IC chip comprises a reference voltage generator operable for generating a reference voltage across said resistor and a threshold voltage indicative of said temperature threshold, wherein said function is further determined by said reference voltage and said threshold voltage. 27. The, electronic system as claimed in claim 25, wherein said temperature detection circuit is operable for providing a temperature detection signal indicative of a temperature condition selected from the group consisting of: a normal condition, an over-temperature condition, and an under-temperature condition. 28. The electronic system as claimed in claim 25, wherein said sensor comprises a thermistor externally coupled to said IC chip.
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