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Method and apparatus for assessing a time interval during which a refresh device can be maintained in a self-refresh mode by an associated energy source. The refresh device is initially operated in a self-refresh mode to maintain the device in a selected state. The time interval during which the ref

Method and apparatus for assessing a time interval during which a refresh device can be maintained in a self-refresh mode by an associated energy source. The refresh device is initially operated in a self-refresh mode to maintain the device in a selected state. The time interval during which the refresh device can be subsequently maintained in the refresh mode is next determined in relation to an energy requirement value obtained during the self-refresh mode and an energy capacity value from the associated energy source. The energy capacity value is preferably obtained by fully discharging the associated energy source. Preferably, the refresh device is characterized as a dynamic random access memory (DRAM), and the associated energy source is characterized as a rechargeable backup battery. A selected test pattern is preferably written to the refresh device and maintained thereby during the self-refresh mode.

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1. A method comprising a step of determining a time interval over which a refresh device is subsequently maintainable in a self-refresh mode by an associated energy source, said interval comprising multiple charge decay and refresh cycles for the device, wherein the time interval of the determining

1. A method comprising a step of determining a time interval over which a refresh device is subsequently maintainable in a self-refresh mode by an associated energy source, said interval comprising multiple charge decay and refresh cycles for the device, wherein the time interval of the determining step is determined by use of a timing circuit in relation to an energy requirement value of the device obtained during device operation and an energy capacity value of the energy source. 2. The method of claim 1, wherein the determining step comprises assessing a nominal charge level of the device and repetitively supplying additional charge to the device to maintain said nominal charge level. 3. TheA method of claim 1comprising a step of determining a time interval over which a refresh device is subsequently maintainable in a self-refresh mode by an associated energy source, said interval comprising multiple charge decay and refresh cycles for the device, wherein the time interval of the determining step is determined in relation to an energy requirement value of the device obtained during device operation and an energy capacity value of the energy source, wherein the energy capacity value is obtained by discharging the energy source through a separate load. 4. The method of claim 1, wherein the associated energy source is characterized as comprising a backup battery and wherein the time interval begins with device operation and ends when the battery reaches a depleted condition no longer capable of supplying sufficient charge to the device to continue said refresh operation. 5. The method of claim 1, wherein the energy requirement value is obtained in relation to a current sense resistor coupled to the device. 6. The method of claim 1, wherein the determining step further comprises further deriving the time interval in relation to a previous energy requirement value obtained during a previous operation of the device. 7. The method of claim 1, wherein the device is characterized as comprising a dynamic random access memory (DRAM). 8. TheA method of claim 6, whereincomprising a step of determining a time interval over which a refresh device is subsequently maintainable in a self-refresh mode by an associated energy source, said interval comprising multiple charge decay and refresh cycles for the device, wherein the time interval of the determining step is determined in relation to an energy requirement value of the device obtained during device operation and an energy capacity value of the energy source, wherein the determining step further comprises further deriving the time interval in relation to a previous energy requirement value obtained during a previous operation of the device, the operating step further comprises writing a selected test pattern to the DRAM, wherein the DRAM maintains said test pattern during said refresh mode. 9. An apparatus configured to carry out thea method of claim 1comprising a step of determining a time interval over which a refresh device is subsequently maintainable in a self-refresh mode by an associated energy source, said interval comprising multiple charge decay and refresh cycles for the device, wherein the time interval of the determining step is determined using a timing circuit in relation to an energy requirement value of the device obtained during device operation and an energy capacity value of the energy source. 10. An apparatus comprising a refresh device, an associated energy source and a control block adapted to determine a maximum interval over which the refresh device is subsequently maintainable in a self-refresh mode by the energy source, said interval beginning with device operation and ending when the refresh device can no longer supply sufficient charge to continue said self-refresh mode, the apparatus further comprising a current sense resistor coupled to the refresh device, wherein the control block determines an energy requirement value in relation to a voltage drop across said resistor and determines said interval in relation to the energy requirement value. 11. The apparatus of claim 10, wherein during the self-refresh mode the refresh device assesses a nominal charge level stored therein and repetitively applies additional charge to maintain said nominal charge level. 12. The apparatus of claim 10, wherein the control block is further adapted to transition the refresh device from an operational mode wherein a charge level of the refresh device is selectively altered by a second device to said self-refresh mode, wherein during said self-refresh mode the refresh device is decoupled from the second device and continuously maintains a selected charge level. 13. The apparatus of claim 10, wherein the control block is further adapted to discharge the associated energy source through a load to obtain an energy capacity value used to determine said interval. 14. The apparatus of claim 13, further comprising a first energy source configured to supply energy to the refresh device, wherein the associated energy source is characterized as comprising a backup battery which is selectively recharged by the first energy source, and wherein the control block further inhibits said recharging of the backup battery by the first energy source while the backup battery is discharged through said load. 15. The apparatus of claim 10, wherein the refresh device is characterized as comprising a cache memory device used to temporarily store data transferred between a data storage device and a host device. 16. The apparatus of claim 10, further comprising a voltage regulator which regulates input energy supplied to the refresh device during the self-refresh mode, wherein the control block further determines an efficiency of the voltage regulator during said self-refresh mode. 17. The apparatus of claim 15, wherein the control block is further adapted to write a selected test pattern to the cache memory device prior to operation of the cache memory device in the self-refresh mode so that the cache memory device refreshes the selected test pattern during the self-refresh mode. 18. A method comprising: determining, by use of a circuit including programmable computer circuit, a time interval over which a refresh device is subsequently maintainable in a mode permissive of a self-refresh operation by an associated energy source, the time interval including multiple charge cycles for the device, wherein the programmable computer circuit determines the time interval in relation to an energy requirement value of the device obtained during device operation and an energy capacity value of the energy source. 19. For use in a system including a memory device, a method comprising: providing power-related degradation data associated with the memory device;based on the power-related degradation data and threshold criteria applicable to at least part of the memory device, using a computing circuit during the operational life of the memory device to execute an algorithm for assessing integrity of the memory device and, in response thereto, generating data for scheduling maintenance of the system.