$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Substrate cleaning technique employing multi-phase solution 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B08B-003/04
출원번호 US-0743283 (2007-05-02)
등록번호 US-8388762 (2013-03-05)
발명자 / 주소
  • Freer, Erik M.
  • deLarios, John M.
  • Ravkin, Michael
  • Korolik, Mikhail
  • Redeker, Fritz C.
출원인 / 주소
  • Lam Research Corporation
인용정보 피인용 횟수 : 1  인용 특허 : 40

초록

A method and system for cleaning opposed surfaces of a semiconductor wafer having particulate matter thereon. The method includes generating relative movement between a fluid and the substrate. The relative movement is in a direction that is transverse to a normal to one of the opposed surfaces and

대표청구항

1. A method for cleaning a substrate having opposed surfaces, one of which includes contaminants thereon, said method comprising: placing the substrate in an immersion tank filled with a solution;generating relative movement between the solution and said substrate in a direction transverse to a norm

이 특허에 인용된 특허 (40)

  1. Kottman Rickie A. (Dallas TX) Terrill Robert E. (Carrollton TX) Wise Ann E. (Dallas TX), Apparatus and method for edge cleaning.
  2. Bergman Eric J. ; Hess Mignon P., Apparatus and method for processing the surface of a workpiece with ozone.
  3. Hayashi Eiichiro (Shiga JPX) Fujikawa Kazunori (Shiga JPX), Apparatus and method for rinsing and drying substrate.
  4. Hethcoat Gary L. (Ontario CA), Apparatus for cleaning and/or fluxing circuit card assemblies.
  5. Chung-Yi Lin TW, Automatic wall cleansing apparatus.
  6. Gockel Thomas R. ; Olson Lorin ; Ryle Lynn ; Whitelaw Brett A. ; Ravkin Michael, Brush box containment apparatus.
  7. Talieh Homayoun, Chemical mechanical polishing with a small polishing pad.
  8. Kamikawa Yuji,JPX ; Kuroda Osamu,JPX ; Soejima Kenji,JPX ; Nomura Tsuyoshi,JPX, Cleaning and drying apparatus, wafer processing system and wafer processing method.
  9. Herrick Bradford James ; Baxter Mark D., Compressed air foam generator.
  10. Miyashita Naoto,JPX ; Abe Masahiro,JPX, Double side cleaning apparatus for semiconductor substrate.
  11. Matsukawa Hiroyuki,JPX ; Yonemizu Akira,JPX ; Matsushita Michiaki,JPX ; Fujimoto Akihiro,JPX ; Takekuma Takashi,JPX ; Yaegashi Hidetami,JPX ; Fukuda Takahide,JPX, Double-sided substrate cleaning apparatus and cleaning method using the same.
  12. Shuzo Sato JP; Takuo Ihira JP, Flattening polishing device and flattening polishing method.
  13. Gray Paul T. ; Masters David R., Foam producing apparatus and method.
  14. Bunkofske Raymond James, Method and apparatus for coating a semiconductor wafer.
  15. Mertens, Paul; Meuris, Marc; Heyns, Marc, Method and apparatus for localized liquid treatment of the surface of a substrate.
  16. Paul Mertens BE; Marc Meuris BE; Marc Heyns BE, Method and apparatus for localized liquid treatment of the surface of a substrate.
  17. Ravkin Michael, Method and apparatus for processing a wafer.
  18. Paul Mertens BE; Mark Meuris BE; Marc Heyns BE, Method and apparatus for removing a liquid from a surface of a rotating substrate.
  19. Starov Vladimir ; Basha Syed S. ; Shrinivasan Krishnan ; Reinhardt Karen A. ; Kabansky Aleksandr, Method and apparatus for removing post-etch residues and other adherent matrices.
  20. Lee, Keum Joo; Ko, Yong Sun; Hwang, In Seak, Method for cleaning damaged layers and polymer residue from semiconductor device.
  21. Mathuni Josef,DEX, Method for etching damaged zones on an edge of a semiconductor substrate, and etching system.
  22. Leenaars Adriaan F. M. (Eindhoven NLX) Huethorst Johanna A. M. (Eindhoven NLX) Marra Johannes (Eindhoven NLX), Method for removing in a centrifuge a liquid from a surface of a substrate.
  23. Yamasaka Miyako,JPX, Method for washing and drying substrates.
  24. Nasser-Ghodsi, Mehran; Wood, Phil, Methods and apparatus for dishing and erosion characterization.
  25. de Larios, John Martin; Ravkin, Mike; Travis, Glen; Keller, Jim; Krusell, Wilbur, Methods for wafer proximity cleaning and drying.
  26. Britten Jerald A. (Oakley CA), Moving zone Marangoni drying of wet objects using naturally evaporated solvent vapor.
  27. Takahashi Kazuo,JPX, Polishing machine.
  28. Matthews Robert R. (Richmond CA), Process and apparatus for the treatment of semiconductor wafers in a fluid.
  29. Krusell, Wilbur; de Larios, John M.; Ravkin, Mike, Single wafer residue, thin film removal and clean.
  30. Burris William Alan, Sparger.
  31. Voegeli Douglas W. (Shoreview MN), Sparger.
  32. Matsuno, Kousaku; Iga, Masao; Ueda, Takeji; Kanayasu, Jun; Shikami, Satoshi, Substrate cleaning apparatus.
  33. Dickinson, C. John; Jansen, Frank; Murphy, Daimhin P., Substrate processing apparatus and related systems and methods.
  34. David T. Frost ; Oliver David Jones ; Mike Wallis, Substrate processing in an immersion, scrub and dry system.
  35. Fumio Morita JP; Masataka Fujiki JP; Hitoshi Oka JP; Noriyuki Oroku JP; Yuichirou Tanaka JP, Substrate treating apparatus.
  36. Kittle Paul A., Surface treatment of semiconductor substrates.
  37. Kittle, Paul A., Surface treatment of semiconductor substrates.
  38. Paul A. Kittle, Surface treatment of semiconductor substrates.
  39. Lyons Paul Wallace ; Acampora Alfonse Anthony, Transport processor interface and video recorder/playback apparatus in a field structured datastream suitable for conveying television information.
  40. Fuentes,Ricardo I., Wet processing using a fluid meniscus, apparatus and method.

이 특허를 인용한 특허 (1)

  1. Lill, Thorsten; Vahedi, Vahid; Kristoffersen, Candi; Bailey, III, Andrew D.; Shen, Meihua; Raghavan, Rangesh; Bultman, Gary, Equipment front end module for transferring wafers and method of transferring wafers.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로