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System and method for scanning of probe arrays 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06K-009/00
출원번호 US-0480888 (2012-05-25)
등록번호 US-8391582 (2013-03-05)
발명자 / 주소
  • Weiner, Nathan K.
  • Odoy, Patrick J.
  • Schultz, Eric
  • Jones, Mark
  • Overbeck, James T.
  • DeWeerd, Herman
  • Stura, David A.
  • Bukys, Albert K.
  • Woolaver, Tim J.
  • Regan, Thomas P.
  • Bradbury, David
  • McKenzie, Eric E.
  • DiPaolo, Roger
  • Miles, Christopher
  • Katz, Joel M.
  • Ksenia, Oleinik-Ovod
출원인 / 주소
  • Affymetrix, Inc.
인용정보 피인용 횟수 : 10  인용 특허 : 106

초록

An embodiment of a scanning system is described including optical elements that direct an excitation beam at a probe array, detectors that receive reflected intensity data responsive to the excitation beam, where the reflected intensity data is responsive to a focusing distance between an optical el

대표청구항

1. A system for scanning a probe array, the system comprising: one or more optical elements configured to direct an excitation beam at a substrate, wherein the substrate includes the probe array;one or more detectors configured to receive reflections from the substrate generated by the excitation be

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