IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0255823
(2008-10-22)
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등록번호 |
US-8393934
(2013-03-12)
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발명자
/ 주소 |
|
출원인 / 주소 |
|
대리인 / 주소 |
Thorpe North & Western LLP
|
인용정보 |
피인용 횟수 :
14 인용 특허 :
221 |
초록
▼
A CMP pad conditioner comprises a plurality of abrasive segments. Each abrasive segment includes a segment blank and an abrasive layer attached to the segment blank, the abrasive layer including a superhard abrasive material. A pad conditioner substrate is also provided. Each of the plurality of abr
A CMP pad conditioner comprises a plurality of abrasive segments. Each abrasive segment includes a segment blank and an abrasive layer attached to the segment blank, the abrasive layer including a superhard abrasive material. A pad conditioner substrate is also provided. Each of the plurality of abrasive segments is permanently affixed to the pad conditioner substrate in an orientation that enables removal of material from a CMP pad by the abrasive layer as the pad conditioner and the CMP pad are moved relative to one another.
대표청구항
▼
1. A CMP pad conditioner, comprising: a plurality of blade abrasive segments, each blade abrasive segment including: an elongated blade segment blank; andan abrasive layer attached to the blade segment blank, the abrasive layer including a superhard abrasive material;a plurality of particle abrasive
1. A CMP pad conditioner, comprising: a plurality of blade abrasive segments, each blade abrasive segment including: an elongated blade segment blank; andan abrasive layer attached to the blade segment blank, the abrasive layer including a superhard abrasive material;a plurality of particle abrasive segments, each particle abrasive segment including: a particle segment blank; andan abrasive layer attached to the particle segment blank, the abrasive layer including a plurality of superabrasive particles; anda pad conditioner substrate;each of the plurality of blade abrasive segments and the particle abrasive segments being permanently affixed to the pad conditioner substrate in an alternating pattern and in an orientation that enables removal of material from a CMP pad by the abrasive layers as the pad conditioner and the CMP pad are moved relative to one another. 2. The pad conditioner of claim 1, wherein a longitudinal axis of each of the plurality of blade abrasive segments is aligned along a radius of the pad conditioner substrate. 3. The pad conditioner of claim 1, wherein each of the abrasive layers includes an abrading surface or point, and wherein the abrading surfaces or points are leveled relative to one another such that no abrading surface or point protrudes above another abrading surface or point by more than about 30 microns. 4. The pad conditioner of claim 1, wherein the plurality of blade abrasive segments are radially distributed about a face of the pad conditioner substrate. 5. The pad conditioner of claim 1, wherein the abrasive layers of the blade abrasive segments comprise polycrystalline diamond blades. 6. The pad conditioner of claim 5, wherein at least a portion of the abrasive layers of the blade abrasive segments have a serrated cutting edge. 7. The pad conditioner of claim 5, wherein at least a portion of the abrasive layers of the blade abrasive segments are have a flat cutting edge. 8. The pad conditioner of claim 1, wherein an alternating pattern includes single blade abrasive segments alternating between particle abrasive segments. 9. The pad conditioner of claim 1, wherein an alternating pattern includes a group of two or more blade abrasive segments alternating between particle abrasive segments. 10. The pad conditioner of claim 1, wherein the abrasive layers of the particle abrasive segments include individual abrasive particles. 11. The pad conditioner of claim 1, wherein the plurality of abrasive layers are attached to the blade segment blanks and the particle segment blanks with an organic material layer including a member selected from the group consisting of: amino resins, acrylate resins, alkyd resins, polyester resins, polyamide resins, polyimide resins, polyurethane resins, phenolic resins, phenolic/latex resins, epoxy resins, isocyanate resins, isocyanurate resins, polysiloxane resins, reactive vinyl resins, polyethylene resins, polypropylene resins, polystyrene resins, phenoxy resins, perylene resins, polysulfone resins, acrylonitrile-butadiene-styrene resins, acrylic resins, polycarbonate resins, polyimide resins, and combinations thereof. 12. The pad conditioner of claim 1, wherein the abrasive layers are attached to the blade segment blanks and the particle segment blanks with a brazing alloy. 13. The pad conditioner of claim 1, wherein the plurality blade abrasive segments and particle abrasive segments are attached to the conditioner substrate with an organic material layer including a member selected from the group consisting of: amino resins, acrylate resins, alkyd resins, polyester resins, polyamide resins, polyimide resins, polyurethane resins, phenolic resins, phenolic/latex resins, epoxy resins, isocyanate resins, isocyanurate resins, polysiloxane resins, reactive vinyl resins, polyethylene resins, polypropylene resins, polystyrene resins, phenoxy resins, perylene resins, polysulfone resins, acrylonitrile-butadiene-styrene resins, acrylic resins, polycarbonate resins, polyimide resins, and combinations thereof. 14. The pad conditioner of claim 1, wherein the plurality blade abrasive segments and particle abrasive segments are attached to the conditioner substrate with a brazing alloy. 15. A method of conditioning a CMP pad surface, comprising: moving a dresser surface and the CMP pad surface relative to one another, such that the dresser surface alternately shaves and furrows the CMP pad surface. 16. A method of forming a CMP pad conditioner, comprising: positioning a plurality of blade abrasive segments and a plurality of particle abrasive segments as in claim 1 in an alternating arrangement on a face of a pad conditioner substrate in an orientation that enables removal of material from a CMP pad by the abrasive layers as the pad conditioner and the CMP pad are moved relative to one another; andpermanently affixing the plurality of blade abrasive segments and the plurality of particle abrasive segments to the pad conditioner substrate. 17. The method of claim 16, wherein the plurality of blade abrasive segments and the plurality of particle abrasive segments are attached to the conditioner substrate with an organic material layer including a member selected from the group consisting of: amino resins, acrylate resins, alkyd resins, polyester resins, polyamide resins, polyimide resins, polyurethane resins, phenolic resins, phenolic/latex resins, epoxy resins, isocyanate resins, isocyanurate resins, polysiloxane resins, reactive vinyl resins, polyethylene resins, polypropylene resins, polystyrene resins, phenoxy resins, perylene resins, polysulfone resins, acrylonitrile-butadiene-styrene resins, acrylic resins, polycarbonate resins, polyimide resins, and combinations thereof. 18. The method of claim 16, wherein the plurality of blade abrasive segments and the plurality of particle abrasive segments are attached to the conditioner substrate with a brazing alloy. 19. The method of claim 16, wherein the plurality of blade abrasive segments and the plurality of particle abrasive segments are leveled with respect to one another using a reverse casting technique. 20. A method of conditioning a CMP pad, comprising: pressing a CMP pad dresser into a CMP pad;moving the CMP pad dresser and the CMP pad relative to one another, such that compression of the CMP pad dresser into the CMP pad is minimized due to an alternating arrangement of blade abrasive segments and particle abrasive segments affixed to the CMP pad dresser.
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