IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0819455
(2010-06-21)
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등록번호 |
US-8401823
(2013-03-19)
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우선권정보 |
DE-10 2009 033 614 U (2009-07-17) |
발명자
/ 주소 |
|
출원인 / 주소 |
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대리인 / 주소 |
Koppel, Patrick, Heybl & Philpott
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인용정보 |
피인용 횟수 :
3 인용 특허 :
9 |
초록
▼
An arrangement and method for assessing and diagnosing the operating state of a device under test in the presence of a disturbing ambient noise and for detecting, localizing and classifying defects of the device which affect its operational reliability and quality. At least two sensors monitor signa
An arrangement and method for assessing and diagnosing the operating state of a device under test in the presence of a disturbing ambient noise and for detecting, localizing and classifying defects of the device which affect its operational reliability and quality. At least two sensors monitor signals at arbitrary locations which are affected by signals emitted by defects and by ambient noise sources. A source analyzer receives the monitored signals, identifies the number and location of the sources, separates defect and noise sources, and analyzes the deterministic and stochastic signal components emitted by each source. Defect and noise vectors at the outputs of the source analyzer are supplied to a defect classificator which detects invalid parts of the measurements corrupted by ambient noise, accumulates the valid parts, assesses the quality of the system under test and identifies the physical causes and location of the defects.
대표청구항
▼
1. An arrangement for diagnosing the operating state of a device under test in the presence of ambient noise source and detecting, localizing and classifying defects of said device, characterized in that said arrangement comprises: an excitation means which provides a stimulus u(t) for exciting the
1. An arrangement for diagnosing the operating state of a device under test in the presence of ambient noise source and detecting, localizing and classifying defects of said device, characterized in that said arrangement comprises: an excitation means which provides a stimulus u(t) for exciting the device under test,at least two sensors measuring signals p(t,ri) at arbitrary positions ri with 1≦i≦I, and providing said measured signals to respective sensor outputs,at least two filters, each having an input which receives a respective one of said measured signals p(t,ri) from said sensors, and an output which provides a filtered signal p′(t, ri) which is incoherent with the stimulus u(t),a source analyzer having at least two inputs, each of which receives a respective one of the filtered signals p′(t,ri) from said filter outputs, and having at least one analyzer defect output providing a defect vector D(t,rd,j) which contains analyzed properties of the signal q(t,rd,j) emitted by a defect source at position rd,j with 1≦j≦J of said device under test while suppressing the signals q(t,rn,k) emitted by an ambient noise source at a different location rn,k≠rd,j, anda classificator having at least one vector input connected to receive said analyzer defect output and having a classificator output which indicates the quality status of the device under test,wherein said defect vector D(t,rd,j) comprises a deterministic component ddet(t,rd,j), a stochastic component dstoch(t,rd,j), and information about the location rd,j, andwherein said source analyzer has at least one analyzer noise output providing a noise vector N(t,rn,k) which contains analyzed properties of the signals q(t,rn,k) emitted by said ambient noise source at position rn,k with 1≦k≦K while suppressing the signals q(t,rd,j) emitted by any defect source,said classificator including an ambient noise remover having at least one device input connected with said device vector input and at least one noise input connected with said at least one noise source output, and having at least one output providing a valid defect vector D′(t,rd,j) with 1≦j≦J containing valid properties of the signal q(t,rd,j) emitted by said defect signal source on the device under test which is not corrupted by said ambient noise source. 2. An arrangement according to claim 1, characterized in that said source analyzer comprises: a source estimator having at least two inputs connected with said analyzer inputs and having at least one defect location output providing a time delay estimate τd,j or a transfer function Hd,j(f) which corresponds with the difference in the distance between the defect source and said at least two sensors, and having at least one noise location output providing an estimated time delay τn,k or an estimated transfer function Hn,k(f) which corresponds with the distance between the ambient noise source and said sensors,at least one defect analyzer, each having inputs connected with said source analyzer inputs and having a control input connected with said defect location output and having an output generating said defect vector D(t,rn,j) connected with said analyzer defect output, andat least one noise analyzer, each having inputs connected with the source analyzer inputs and having a control input connected with said noise location output and having an analysis output generating a vector N(t,rn,k) connected with said analyzer noise output. 3. An arrangement according to claim 2, characterized in that said source estimator comprises: a varying time delay unit having an input connected with one of said source estimator inputs and a control input,a cross-correlator having a first input connected with the other of said source estimator inputs, a second input connected with the output of said varying time delay unit and having an output generating a cross-correlation function versus delay time τ,a maximum detector having an input receiving said cross-correlation function and having an output generating a vector containing time delay values τj with j=1, . . . M where the cross-correlation function has maxima,a first comparator having an input receiving the time delay values τj and having an output generating a time delay value τd,j supplied to said at least one noise defect location output,a second comparator having an input receiving the time delay values τj and having an output generating a time delay value τn,k supplied to said at least one noise location output. 4. An arrangement according to claim 3, characterized in that said cross-correlator comprises: two pre-filters, each having an input connected with one of the cross-correlator inputs and each having an output generating a signal where the deterministic signal components are suppressed,a multiplier having two inputs, each connected with the output of one of said prefilters and having an output which generates a demodulated output signal, anda post filter having an input connected to said multiplier output and having an output connected to said cross-correlator output where the envelope is generated. 5. An arrangement according to claim 2, characterized in that said defect analyzer and said noise analyzer comprise: a correction filter having an input connected to one of said defect analyzer inputs and having a control input which receives the control data connected with said defect analyzer control input and having an output,at least one stochastic signal processor having a first input connected to the other of said defect analyzer inputs and having a second input connected to said output of said correction filter and having an output providing a stochastic feature dstoch(t,rd,j) to said defect analyzer output,at least one deterministic signal processor having a first input connected to the other of said defect analyzer inputs and having a second input connected to said output of said correction filter and having an output providing a deterministic feature ddet(t,rd,j) to said defect analyzer output. 6. An arrangement according to claim 5, characterized in that said deterministic signal processor comprises: an adder having two inputs, each connected to a respective one of said deterministic signal processor inputs and generating the total signal at an output,a frequency converter having an input connected to said adder output, a control input connected with an output of a frequency detector and receiving the instantaneous fundamental frequency f(t) of the stimulus u(t), and having an output providing an output signal having a constant fundamental frequency f0, anda periodic averager having an input connected to said frequency converter output and having an output connected with said deterministic signal processor output and providing the sum of adjacent sections of constant length T0=1/f0 of the input signal received at said periodic averager input. 7. An arrangement according to claim 1, characterized in that said ambient noise remover comprises: a noise detector having at least one input connected to said classificator noise input, and having a noise detector output which indicates uncorrupted data in the defect vector D(t,rd,j) with 1≦j≦J,at least one accumulator, each having an input connected with an ambient noise remover input and having a control input which is connected with the noise detector output, each accumulator comprising a memory where the instantaneous defect vector D(t,rd,j) with 1
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