IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0793860
(2010-06-04)
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등록번호 |
US-8416409
(2013-04-09)
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발명자
/ 주소 |
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출원인 / 주소 |
- Lockheed Martin Corporation
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대리인 / 주소 |
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인용정보 |
피인용 횟수 :
0 인용 특허 :
30 |
초록
▼
A method of obtaining information about a target by using an ellipsometric technique of illuminating the target with coherent light beams from moveable light sources and recording reflections from the target. By analyzing the reflections, the surface material refractive index or dielectric tensors m
A method of obtaining information about a target by using an ellipsometric technique of illuminating the target with coherent light beams from moveable light sources and recording reflections from the target. By analyzing the reflections, the surface material refractive index or dielectric tensors may be classified to yield information about the surface material properties. The beams can be emitted at different polarities and/or different frequencies. Ultra-coherent lasers can be used to produce beams that illuminate targets up to 100 kilometers from the beam source.
대표청구항
▼
1. A method of ellipsometric reconnaissance comprising: a. providing a first moveable object having a first light source and a second moveable object having a second light sourceb. illuminating a target with light from the first light source;c. illuminating the target with light from the second ligh
1. A method of ellipsometric reconnaissance comprising: a. providing a first moveable object having a first light source and a second moveable object having a second light sourceb. illuminating a target with light from the first light source;c. illuminating the target with light from the second light source having at least one operating parameter different from light from the first light beam;d. receiving at least a portion of light from the first and second light sources that has reflected from the target; ande. using a computer to identify the target surface material based on the received reflected light. 2. The method of claim 1, further comprising illuminating the target with the first light source at an angle of incidence different from that of step (b). 3. The method of claim 1, further comprising illuminating the target with the second light source at an angle of incidence different from that of step (c). 4. The method of claim 1, wherein step (e) comprises measuring a light parameter change caused by reflection of the light from the target surface. 5. The method of claim 1, wherein the light parameters of step (c) are selected from the list consisting of polarization, wavelength, frequency, flux, amplitude, and phase. 6. The method of claim 1, further comprising repeating steps (b) and (c) so that different portions of the target are illuminated. 7. The method of claim 1, wherein the first and second light sources each comprise a laser. 8. The method of claim 1, wherein the light from the first and second light sources has a wavelength selected from the list consisting of from about 100 THz to about 200 THz, from about 125 THz to about 175 THz, and about 150 THz. 9. The method of claim 1, wherein the light from the first and second light sources is coherent up to at least about 100 kilometers. 10. The method of claim 1, further comprising calibrating the first and second light sources by directing light from the first and second light sources to a surface of a calibration target having a known material, receiving light reflecting from the surface of the calibration target, and comparing parameters of the received light reflected from the target with received light reflected from the calibration target. 11. The method of claim 1, wherein the moveable cable objects are selected from the list consisting of aircraft, spacecraft, water craft, land based vehicles, and personnel moveable objects. 12. The method of claim 1, further comprising, maximizing range of incidence angles formed by the light from the sources contacting the target surface. 13. The method of claim 1, further comprising identifying different materials on the target surface. 14. A method of analyzing a target comprising: a. creating a first reflection from the target by illuminating the target with a first light from a first moveable object;b. creating a second reflection from the target by illuminating the target with a second light from a second. moveable object, the second light having an operating parameter offset from the operating parameter of the first light;c. receiving the first and second reflections; andd. using adaptive optics to correct distortion in one of the reflections;e. comparing the first and second reflections in a computer to identify a material on a portion of the target proximate where the first and second lights illuminate the target. 15. The method of claim 14. wherein the light parameter of step (b) is selected from the list consisting of polarization, wavelength, frequency, flux, amplitude, and phase. 16. The method of claim 14, further comprising repeating steps (a) and (b) at a different angle of incidence between the light and target. 17. The method of claim 14, further comprising forming the light using an ultra coherent laser adapted to generate a laser that is coherent up to around 100 kilometers. 18. A method of identifying a target having a surface, the method comprising: a. directing at the target from a first moveable object, a first light beam that is coherent up to around 100 kilometers that illuminates the target and forms a first reflection;b. directing at the target from a second moveable object, a second light beam that illuminates the target and forms a second reflection, the second light beam having an operating parameter different from the first light beam;c. receiving the reflections;d. comparing the operating parameters of the first and second light beams respectively to the first and second reflections; ande. using a computer to identify material on the target based on the results of step (d). 19. The method of claim 18, further comprising repeating steps (a) and (b) at different angles of incidence. 20. The method of claim 18, further comprising repeating steps (a) and (b), wherein the repeated steps (a) and (b) include illuminating different portions of the target and repeating step (e), wherein repeated step (e) includes identifying material on the different portions of the target.
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