IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0372138
(2012-02-13)
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등록번호 |
US-8445825
(2013-05-21)
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발명자
/ 주소 |
- Gross, Erik
- Campbell, Charles
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출원인 / 주소 |
- AMO Manufacturing USA, LLC.
|
대리인 / 주소 |
AMO Manufacturing USA, LLC
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인용정보 |
피인용 횟수 :
0 인용 특허 :
36 |
초록
▼
Devices systems, and methods can characterize an optical surface of an object. A wavefront sensor system focuses light energy propagating from the object to form a pattern on a detector. The system maps the pattern to an array with a transform function such as a Fourier transform. The values of arra
Devices systems, and methods can characterize an optical surface of an object. A wavefront sensor system focuses light energy propagating from the object to form a pattern on a detector. The system maps the pattern to an array with a transform function such as a Fourier transform. The values of array correspond to characteristic locations and signals in a transform space, for example an intensity of spatial frequency signals in frequency space. The characteristic location and intensity of these signals in transform space are used to measure the optical surface. For example, a characteristic frequency of a spatial frequency intensity peak in Fourier transform space can be used to estimate the location of spots on the detector. Alternatively, the characteristics can be used to the measure sphere, cylinder and axis of a wavefront, wavefront elevation maps and point spread functions, often without locating positions of individual spots on the detector.
대표청구항
▼
1. A method of measuring an optical surface of a tissue system, the method comprising: forming a spatial light intensity distribution pattern on a detector by focusing light energy propagating from the tissue system onto the detector so that the focused pattern defines several light energy physical
1. A method of measuring an optical surface of a tissue system, the method comprising: forming a spatial light intensity distribution pattern on a detector by focusing light energy propagating from the tissue system onto the detector so that the focused pattern defines several light energy physical locations distributed across the detector;mapping the light intensity distribution pattern to a transform array by transforming the light intensity distribution pattern with a transform function so that the array comprises values corresponding to coordinate reference locations distributed in a spatial frequency space, each of the values of the array corresponding to an associated local intensity, in the frequency space, of the several physical locations of the pattern on the detector; andidentifying a shape characteristic of the optical surface from a selected value, wherein the selected value is elected from the values of the transform array. 2. The method of claim 1, wherein the light energy from the tissue system is focused through several lenslets of a lenslet array onto the detector so that the pattern includes several spots of light energy, each spot being at an associated one of the physical locations. 3. The method of claim 2 wherein the physical locations of the pattern of spots on the detector are distributed across the detector with irregular spacing between the spots, and wherein the spatial frequency space comprises a frequency dimension, and wherein the local intensity varies along the frequency dimension in response to the irregular spacing of the several spots. 4. The method of claim 2 wherein the physical locations of the pattern on the detector are distributed across the detector with irregular spacing and wherein the spatial frequency space comprises a frequency dimension, and wherein the local intensity varies along the frequency dimension in response to the irregular spacing of the pattern. 5. The method of claim 1 wherein: the pattern comprises a two dimensional spatial light intensity distribution pattern;the array comprises a two dimensional array having values corresponding to a first coordinate reference along a first dimension in a transform space and a second coordinate reference along a second dimension in the transform space; andthe characteristic corresponds to a first coordinate location along the first dimension and a second coordinate location along the second dimension. 6. The method of claim 5 further comprising identifying a second characteristic from the array, the second characteristic corresponding to a third coordinate reference along the first dimension and a fourth coordinate reference along the second dimension. 7. The method of claim 1, further comprising manipulating the transform array such that an origin of the coordinate system appears centered in the transform array. 8. The method of claim 7, wherein the transform array comprises a first quadrant, a second quadrant, a third quadrant, and a fourth quadrant and wherein the step of shifting the transform array comprises swapping the first quadrant with the third quadrant and the second quadrant with the fourth quadrant. 9. The method of claim 1, wherein the step of identifying a shape characteristic of the optical surface is performed without determining the physical location of light energy. 10. The method of claim 1, wherein the shape characteristic comprises a spherocylindrical power of the surface. 11. The method of claim 1, wherein the step of identifying a shape characteristic of the optical surface from a selected value further comprises ascertaining a coordinate reference location of the selected value and calculating skew-periodic coefficients of the transform array with the coordinate reference location. 12. The method of claim 11, wherein the step of identifying a shape characteristic of the optical surface from a selected value further comprises calculating data space skew-coefficients with the skew-periodic coefficients of the transform array. 13. The method of claim 12, wherein the step of identifying a shape characteristic of the optical surface from a selected value further comprises calculating a refractive component of the optical surface with the data space skew-coefficients. 14. A system for determining an optical aberration characteristic of a surface of a tissue system, the system comprising: an optical system having an optical path and configured for forming several spots corresponding to a substantially point source of light on the tissue system;a detector disposed along the optical path and configured for measuring a spatial light distribution energy pattern focused by the optical system, the pattern including the several spots;a processor coupled to the detector and configured to map the spatial light distribution energy pattern to a signal in a transform space and determine the characteristic from the signal, wherein the processor is configured to map the spatial light distribution energy pattern to an array having values corresponding to locations distributed in a frequency space, each of the values of the array corresponding to an associated local frequency intensity of the several spots of the pattern, and wherein the processor is further configured to determine the characteristic from a selected value from among the values of the transform array by ascertaining a coordinate reference location of the selected value and calculating skew-periodic coefficients of the transform array with the coordinate reference location, the selected value corresponding to an associated local frequency intensity, in the frequency space, of the several spots. 15. The system of claim 14, wherein the optical system is configured so that the pattern comprises a two dimensional spatial light intensity distribution pattern and wherein the processor is configured so that the array comprises a two dimensional array having values corresponding to a first coordinate reference along a first dimension in the transform space and a second coordinate reference along a second dimension in the transform space and wherein the characteristic corresponds to a first coordinate location along the first dimension and a second coordinate location along the second dimension, and wherein the processor is configured to identify a second characteristic from the transform array, the second characteristic corresponding to third coordinate reference along the first dimension and a fourth coordinate reference along the second dimension. 16. A non-transitory computer-readable storage medium comprising a set of computer executable instructions for determining a shape of an optical surface of an object, wherein execution of the instructions by a computer processor causes the processor to carry out the steps of: receiving data, wherein the data comprises light signal data from a pattern distributed across a detector;mapping the light signal data to a transform array corresponding to signals in a transform space so that the array has values corresponding to locations distributed in the transform space, each value of the array corresponding to an associated local frequency intensity of the signal of the pattern on the detector;identifying an optical surface characteristic from the transform array from a selected value from among the values of the transform array by ascertaining a coordinate reference location of the selected value and calculating skew-periodic coefficients of the transform array with the coordinate reference location; anddetermining the shape of the optical surface of the object from the identified characteristic; andtransmitting the determined shape of the optical surface available for external use outside the computer. 17. A method of measuring a shape of an optical surface, the method comprising: forming a spatial distribution pattern on a detector by focusing a light energy propagating from the optical surface onto the detector;mapping the spatial distribution pattern to a transform array by transforming the spatial distribution pattern with a transform function so that the array has values corresponding to locations distributed in a frequency space, each value of the array corresponding to an associated local intensity of a frequency throughout the pattern on the detector; andidentifying the shape of the optical surface from a value by ascertaining a coordinate reference location of the value and calculating skew-periodic coefficients of the transform array with the coordinate reference location, wherein the value is selected from within the transform array and corresponds to an associated local intensity of a frequency, in the frequency space, of the pattern.
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