Method of making an antireflective silica coating, resulting product and photovoltaic device comprising same
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
H02N-006/00
H05B-006/00
출원번호
US-0000319
(2007-12-11)
등록번호
US-8450594
(2013-05-28)
발명자
/ 주소
Varaprasad, Desaraju V.
출원인 / 주소
Guardian Industries Corp.
대리인 / 주소
Nixon & Vanderhye P.C.
인용정보
피인용 횟수 :
0인용 특허 :
37
초록▼
A low-index silica coating may be made by forming a silica precursor having a radiation curable composition including a radiation curable monomer and/or a photoinitiator, and also including a silica sol comprising a silane and/or a colloidal silica. The silica precursor may be deposited on a substra
A low-index silica coating may be made by forming a silica precursor having a radiation curable composition including a radiation curable monomer and/or a photoinitiator, and also including a silica sol comprising a silane and/or a colloidal silica. The silica precursor may be deposited on a substrate (e.g., glass substrate or silicon wafer) to form a coating layer. The coating layer may then be cured via exposure to electromagnetic radiation, such as UV radiation. Then, the cured coating layer may be fired using temperature(s) of from about 550 to 700° C., in forming the low-index silica based coating. The low-index silica based coating may be used as an antireflective (AR) film on a front glass substrate of a photovoltaic device (e.g., solar cell) in certain example instances.
대표청구항▼
1. A method of making a low-index silica based coating, the method comprising: forming a silica precursor comprising (a) a radiation curable composition comprising a radiation curable monomer and a photoinitiator, and (b) a silica sol comprising a silane and/or a colloidal silica;depositing the sili
1. A method of making a low-index silica based coating, the method comprising: forming a silica precursor comprising (a) a radiation curable composition comprising a radiation curable monomer and a photoinitiator, and (b) a silica sol comprising a silane and/or a colloidal silica;depositing the silica precursor on a substrate to form a coating layer, such that the coating layer is directly over and in contact with the substrate;curing the coating layer using at least exposure to electromagnetic radiation; andafter said curing, firing the coating layer in an oven at a temperature of from about 550 to 700° C. for a duration of from about 1 to 10 minutes, to form the low-index silica based coating, wherein the low-index coating has a refractive index less than 1.32 at 550nm. 2. The method of claim 1, wherein the step of depositing comprises spin-coating, roller-coating, or spray-coating. 3. The method of claim 1, wherein said curing comprises exposing the coating layer to ultraviolet (UV) radiation for curing. 4. The method of claim 3, wherein said curing comprises exposing the coating layer to UV radiation for from about 5 to 120 seconds. 5. The method of claim 1, wherein the silica sol does comprises a silane which comprises (3-glycidoxypropyl)trimethoxysilane. 6. The method of claim 1, wherein the silica precursor further comprises an antifoaming additive. 7. The method of claim 1, wherein the silica precursor further comprises a solvent comprising an alcohol. 8. The method of claim 1, wherein a weight percentage of the photoinitiator in the radiation curable composition ranges between 0.1 and 10% by weight. 9. The method of claim 1, wherein a weight percentage of silicon dioxide in the silica precursor ranges between from 0.1 to 10% by weight of the silica precursor. 10. The method of claim 1, wherein the radiation curable composition comprises a UV-curable epoxy, a UV-curable acrylate, and/or a UV-curable isocyanate. 11. The method of claim 1, wherein the low-index coating has a thickness between 500 and 4000 Åafter firing in the oven. 12. The method of claim 1, wherein the low-index coating has a refractive index less than 1.28 at 550nm. 13. The method of claim 1, wherein the low-index coating has a refractive index less than 1.25 at 550nm. 14. The method of claim 1, wherein the substrate comprises glass. 15. The method of claim 1, wherein the substrate comprises a silicon wafer. 16. The method of claim 14, further comprising the step of depositing a high index coating on the substrate prior to the step of depositing the silica precursor on the substrate. 17. A photovoltaic device comprising a photoelectric transfer film and the low-index coating made according to claim 16, wherein the low-index coating is provided on a light incident side of a front glass substrate of the photovoltaic device. 18. A method of making a photovoltaic device including a low-index silica based coating used in an antireflective coating, the method comprising: depositing a high index coating on a glass substrate;depositing a medium index coating over the high index coating, the medium index coating having an index of refraction that is lower than that of the high index coating, and higher than that of a low index coating;forming a silica precursor comprising (a) a radiation curable composition comprising a radiation curable monomer, and (b) a silica sol comprising a silane and/or a colloidal silica;depositing the silica precursor on the medium index coating to form the low index coating, wherein the high index coating, medium index coating, and low index coating form a coating layer;curing the coating layer using at least exposure to electromagnetic radiation;after said curing, firing the coating layer using elevated temperature(s) of from about 550 to 700° C. to form the low-index silica based coating; andusing the glass substrate with the low-index silica based coating thereon as a front glass substrate of the photovoltaic device so that the low-index silica based coating is provided on a light incident side of the glass substrate. 19. The method of claim 18, wherein the step of depositing comprises spin-coating, roller-coating, or spray-coating. 20. The method of claim 18, whereiri said curing comprises exposing the coating layer to ultraviolet (UV) radiation for curing. 21. The method of claim 20, wherein said curing comprises exposing the coating layer to UV radiation for from about 5 to 120 seconds. 22. A photovoltaic device comprising: a photovoltaic film, and at least a glass substrate on a light incident side of the photovoltaic film;an antireflection coating provided on the glass substrate;wherein the antireflection coating comprises at least a layer provided on the glass substrate, the layer comprising a high index coating; and a coating layer over the high index coating, the coating layer produced using a method comprising the steps of: forming a silica precursor comprising (a) a radiation curable composition comprising a radiation curable monomer and a photoinitiator and (b) a silica sol comprising a silane and/or a colloidal silica; depositing the silica precursor on a glass substrate to form the coating layer; curing the coating layer through exposure to electromagnetic radiation; and firing the coating layer in an oven at a temperature ranging from 550 to 700° C. for a duration between 1 and 10 minutes.
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