IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0007347
(2011-01-14)
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등록번호 |
US-8497714
(2013-07-30)
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발명자
/ 주소 |
- Garbossa, Cristian
- Vecchiato, Andrea
- Flaibani, Marco
- Orietti, Enrico
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출원인 / 주소 |
- Infineon Technologies Austria AG
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대리인 / 주소 |
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인용정보 |
피인용 횟수 :
2 인용 특허 :
6 |
초록
▼
In an embodiment, a method of driving a switch transistor includes activating the switch transistor by charging a control node of the switch transistor at a first charging rate for a first time duration. After charging the control node of the switch transistor at the first charging rate, the control
In an embodiment, a method of driving a switch transistor includes activating the switch transistor by charging a control node of the switch transistor at a first charging rate for a first time duration. After charging the control node of the switch transistor at the first charging rate, the control node of the switch transistor is further charged at a second charging rate until the control node of the switch transistor reaches a target signal level, where the second charging rate is less than the first charging rate.
대표청구항
▼
1. A method of driving a switch transistor, the method comprising: activating the switch transistor, wherein the activating comprises: charging a control node of the switch transistor at a first charging rate for a first time duration;measuring a voltage at the control node of the switching transist
1. A method of driving a switch transistor, the method comprising: activating the switch transistor, wherein the activating comprises: charging a control node of the switch transistor at a first charging rate for a first time duration;measuring a voltage at the control node of the switching transistor, wherein the measuring comprises converting the voltage at the control node of the switching transistor to a first current; andafter charging the control node of the switch transistor at the first charging rate, charging the control node of the switch transistor at a second charging rate until the control node of the switch transistor reaches a target signal level, wherein the charging the control node at the second charging rate comprises determining whether the control node has reached the target level based on the measuring by comparing the first current to a reference current, and wherein the second charging rate is less than the first charging rate. 2. The method of claim 1, wherein charging the control node of the of the switch transistor at a first charging rate occurs during a Miller Plateau period of the switch transistor. 3. The method of claim 1, wherein the first time duration is a predetermined time duration. 4. The method of claim 1, further comprising deactivating the switch transistor, deactivating comprises discharging the control node of the switch transistor. 5. The method of claim 1, wherein charging the control node of the of the switch transistor at the first charging rate comprises charging the control node with a first charging current; andcharging the control node of the switch transistor at the second charging rate comprises charging the control node with a second charging current, the second charging current less than the first charging current. 6. The method of claim 1, wherein activating the switch transistor comprises activating a PMOS transistor of a high-side driver. 7. The method of claim 1, further comprising driving the switch transistor with a pulse width modulated signal. 8. The method of claim 7, wherein driving the switch transistor with a pulse width modulated signal comprises activating the switch transistor periodically when a duty cycle of the pulse width modulation signal is 100% or 0%. 9. The method of claim 8, wherein activating the switch transistor comprises setting a latch having a set input directly coupled to an output of a comparator via a logic circuit, the logic circuit having a first input coupled to a first input of the logic circuit; andactivating the switch transistor periodically comprises asserting a first logic signal coupled to a second input of the logic circuit. 10. The method of claim 1, wherein activating the switch transistor comprises setting a latch having a set input directly connected to an output of a comparator. 11. An integrated circuit comprising: a switch transistor;a variable rate charging circuit configured to be coupled to a control node of the switch transistor, the variable rate charging circuit configured to activate the switch transistor by first charging the control node of the switch transistor at a first charging rate, and then charging the control node of the switch transistor at a second charging rate, the second charging rate less than the first charging rate, wherein the variable rate charging circuit comprises a variable current source configured to output a first current when charging the control node at the first charging rate, and a second current when charging the control node at the second charging rate, wherein the first current is greater than the second current, anda timer circuit coupled to the variable current source, wherein the timer causes the variable rate charging circuit to output the first current for a predetermined period of time; anda controller circuit coupled to the variable rate charging circuit and configured to be coupled to the control node of the switch transistor, the controller circuit configured to measure a signal at the control node of the switch transistor,determine if the signal at the control node of the switch transistor has reached a predetermined signal level, andsignal the variable rate charging circuit to stop charging the control node of the switch transistor when the control node of the switch transistor has reached the predetermined signal level. 12. The integrated circuit of claim 11, further comprising a discharge circuit configured to discharge the control node of the switch transistor. 13. The integrated circuit of claim 11, wherein the variable current source comprises a plurality of current sources. 14. The integrated circuit of claim 11, wherein the variable rate charging circuit is configured to drive a high-side PMOS switch transistor, and wherein the control node of the switch transistor comprises a gate of the PMOS switch transistor. 15. The integrated circuit of claim 11, wherein: the controller circuit comprises a first comparator having an output directly connected to a set input of a latch; andthe variable rate charging circuit is coupled to the latch of the controller circuit. 16. The integrated circuit of claim 11, wherein: the controller circuit comprises a first comparator having an output coupled to a set input of a latch via a logic circuit, the logic circuit having a first logic input coupled to the output of the first comparator and a second input coupled to a periodic activation signal configured to be asserted when a duty of a voltage of the control node of the switch transistor is about 100%; andthe variable rate charging circuit is coupled to the latch of the controller circuit. 17. The integrated circuit of claim 16, wherein: the latch further comprises a reset input coupled to an output of a second comparator; andthe second comparator is coupled to a reference current circuit comprising a reference current transistor, a first resistor coupled between and ground node and a gate of the reference current transistor, and a second resistor coupled between a reference voltage node and the gate of the reference current transistor. 18. A circuit for driving a high-side switch transistor, the circuit comprising: an input node for receiving an activation signal;an output node configured to be coupled to a gate of the switch transistor;a variable current source coupled to the output node, the variable current source configured to output a first current and a second current, the first current greater than the second current;a measuring circuit coupled to the output node, the measuring circuit measuring a voltage at the output node; anda control circuit coupled to the measuring circuit, the control circuit configured to cause the variable current source to output the first current for a first period of time when the activation signal is asserted,cause the variable current source to stop outputting the first current after the first period of time has expired and then output the second current,cause the variable current source to stop outputting the second current after the measuring circuit determines that the output node has reached a target voltage. 19. The circuit of claim 18, wherein the control circuit is further configured to cause the variable current source to stop outputting current when the activation signal is de-asserted. 20. The circuit of claim 18, wherein: the variable current source comprises a first current source and a second current source; andthe control circuit comprises a pulse circuit comprising an output coupled to a control terminal of the first current source, the pulse circuit configured to output a pulse of a fixed duration,a latch comprising an output coupled to an input of the pulse circuit and a control terminal of the second current source,a set input coupled to the activation signal, anda reset input coupled to an output of the measuring circuit. 21. The circuit of claim 18, further comprising the high side switching transistor. 22. The circuit of claim 21, wherein the variable current source, the measuring circuit, the control circuit, and the high-side switching transistor are disposed on a same integrated circuit. 23. The circuit of claim 18, further comprising a level shifter coupled between the input node and the control circuit. 24. The circuit of claim 20, wherein the set input is coupled to the activation signal via a first comparator, wherein the set input is directly connected to an output of the first comparator. 25. The circuit of claim 20, wherein the set input is coupled to the activation signal via a first comparator, wherein the set input is coupled to an output of the first comparator via a logic circuit, the logic circuit having a first logic input coupled to the output of the first comparator and a second input coupled to a periodic activation signal configured to be asserted when a duty of the activation signal is about 100%. 26. A switched-mode power supply comprising: a high-side driver coupled to a high-side switch transistor, wherein the high side driver is configured to charge a gate of the high-side switch transistor at a first charging rate for a first time duration, and then charge the gate of the high-side switch transistor at a second charging rate until a control node of the high-side switch transistor reaches a target signal level, wherein the first charging rate is faster than the second charging rate, wherein the high side driver comprises a variable current source coupled to an output of a latch, andthe latch comprises a set input directly connected to an output of a first comparator. 27. The switched-mode power supply of claim 26, further comprising an inductor coupled to a drain of the high-side switch transistor. 28. The switched-mode power supply of claim 26, wherein the high-side switch transistor comprises a PMOS device. 29. A method of driving a switch transistor, the method comprising: activating the switch transistor, wherein the activating comprises: charging a control node of the switch transistor at a first charging rate for a first time duration, andafter charging the control node of the switch transistor at the first charging rate, charging the control node of the switch transistor at a second charging rate until the control node of the switch transistor reaches a target signal level, wherein the second charging rate is less than the first charging rate; anddriving the switch transistor with a pulse width modulated signal. 30. The method of claim 29, wherein charging the control node of the of the switch transistor at a first charging rate occurs during a Miller Plateau period of the switch transistor. 31. The method of claim 29, wherein the first time duration is a predetermined time duration. 32. The method of claim 29, further comprising deactivating the switch transistor, deactivating comprises discharging the control node of the switch transistor. 33. The method of claim 29, further comprising: measuring a voltage at the control node of the switching transistor; anddetermining whether the control node has reached the target signal level based on the measuring. 34. The method of claim 33, wherein: measuring the voltage at the control node of the switching transistor comprises converting the voltage at the control node of the switching transistor to a first current; anddetermining whether the control node has reached the target signal level comprises comparing the first current to a reference current. 35. The method of claim 29, wherein charging the control node of the of the switch transistor at the first charging rate comprises charging the control node with a first charging current; andcharging the control node of the switch transistor at the second charging rate comprises charging the control node with a second charging current, the second charging current less than the first charging current. 36. The method of claim 29, wherein activating the switch transistor comprises activating a PMOS transistor of a high-side driver. 37. The method of claim 29, wherein driving the switch transistor with a pulse width modulated signal comprises activating the switch transistor periodically when a duty cycle of the pulse width modulation signal is 100% or 0%. 38. The method of claim 29, wherein activating the switch transistor comprises setting a latch having a set input directly connected to an output of a comparator. 39. A method of driving a switch transistor, the method comprising: activating the switch transistor, wherein the activating comprises: charging a control node of the switch transistor at a first charging rate for a first time duration;after charging the control node of the switch transistor at the first charging rate, charging the control node of the switch transistor at a second charging rate until the control node of the switch transistor reaches a target signal level, wherein the second charging rate is less than the first charging rate; andsetting a latch having a set input directly connected to an output of a comparator. 40. The method of claim 39, wherein charging the control node of the of the switch transistor at a first charging rate occurs during a Miller Plateau period of the switch transistor. 41. The method of claim 39, wherein the first time duration is a predetermined time duration. 42. The method of claim 39, further comprising deactivating the switch transistor, deactivating comprises discharging the control node of the switch transistor. 43. The method of claim 39, further comprising: measuring a voltage at the control node of the switching transistor; anddetermining whether the control node has reached the target signal level based on the measuring. 44. The method of claim 43, wherein: measuring the voltage at the control node of the switching transistor comprises converting the voltage at the control node of the switching transistor to a first current; anddetermining whether the control node has reached the target signal level comprises comparing the first current to a reference current. 45. The method of claim 39, wherein charging the control node of the of the switch transistor at the first charging rate comprises charging the control node with a first charging current; andcharging the control node of the switch transistor at the second charging rate comprises charging the control node with a second charging current, the second charging current less than the first charging current. 46. The method of claim 39, wherein activating the switch transistor comprises activating a PMOS transistor of a high-side driver. 47. The method of claim 39, further comprising driving the switch transistor with a pulse width modulated signal. 48. The method of claim 47, wherein driving the switch transistor with a pulse width modulated signal comprises activating the switch transistor periodically when a duty cycle of the pulse width modulation signal is 100% or 0%. 49. A switched-mode power supply comprising: a high-side driver coupled to a high-side switch transistor, wherein the high side driver is configured to charge a gate of the high-side switch transistor at a first charging rate for a first time duration, and then charge the gate of the high-side switch transistor at a second charging rate until a control node of the high-side switch transistor reaches a target signal level,the first charging rate is faster than the second charging rate,the high side driver comprises a variable current source coupled to an output of a latch, andthe latch comprises a set input coupled to an output of a first comparator via a logic circuit, the logic circuit having a first logic input coupled to the output of the first comparator and a second input coupled to a periodic activation signal configured to be asserted when a duty of the high side switch driver is about 100%. 50. The switched-mode power supply of claim 49, further comprising an inductor coupled to a drain of the high-side switch transistor. 51. The switched-mode power supply of claim 49, wherein the high-side switch transistor comprises a PMOS device.
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