초록 ▼

A method for forming conductive contacts and interconnects in a semiconductor structure, and the resulting conductive components are provided. In particular, the method is used to fabricate single or dual damascene copper contacts and interconnects in integrated circuits such as memory devices and m

A method for forming conductive contacts and interconnects in a semiconductor structure, and the resulting conductive components are provided. In particular, the method is used to fabricate single or dual damascene copper contacts and interconnects in integrated circuits such as memory devices and microprocessor.

대표청구항 ▼

1. A method of forming a contact in an opening in an insulative material, comprising: forming a non-metal barrier material over the insulative material within the opening;depositing a conductive material over the non-metal barrier material to fill the opening; andreflowing the conductive material in

1. A method of forming a contact in an opening in an insulative material, comprising: forming a non-metal barrier material over the insulative material within the opening;depositing a conductive material over the non-metal barrier material to fill the opening; andreflowing the conductive material in an atmosphere selected to allow formation of a substantially void-free layer of conductive material at a temperature of less than 400° C. 2. The method of claim 1, wherein said atmosphere includes hydrogen and an inert gas. 3. The method of claim 2, wherein said atmosphere is subjected to a plasma formation process. 4. The method of claim 3, wherein said plasma formation process includes microwave excitation. 5. The method of claim 4, wherein said microwave excitation is performed at a pressure of about 1 Torr and a temperature of about 400° C. 6. The method of claim 2, wherein the mixing ratio of hydrogen to inert gas is between 3% and 5%. 7. The method of claim 6, wherein the inert gas is krypton. 8. The method of claim 1, wherein said depositing step is selected from the group consisting of ionized sputtering and evaporation. 9. The method of claim 1, wherein said reflow step is performed at a temperature between 300° C. and 350° C. 10. The method of claim 9, wherein said reflow step is performed at a temperature of about 320° C. 11. A contact in an opening in an insulative material, produced by the process of: forming a non-metal barrier material over the insulative material within the opening;depositing a conductive material over the non-metal barrier material to fill the opening; andreflowing the conductive material in an atmosphere selected to allow formation of a substantially void-free layer of conductive material at a temperature of less than about 400° C. 12. The contact of claim 11, wherein said atmosphere includes hydrogen and an inert gas. 13. The contact of claim 12, wherein said atmosphere is subjected to a plasma formation process. 14. The contact of claim 13, wherein said plasma formation process includes microwave excitation. 15. The contact of claim 14, wherein said microwave excitation is performed at a pressure of about 1 Torr and a temperature of about 400° C. 16. The contact of claim 12, wherein the mixing ratio of hydrogen to inert gas is between 3% and 5%. 17. The contact of claim 16, wherein the inert gas is krypton. 18. The contact of claim 11, wherein said depositing step is selected from the group consisting of ionized sputtering and evaporation. 19. The contact of claim 18, wherein said reflow step is performed at a temperature between 300° C. and 350° C. 20. The contact of claim 19, wherein said reflow step is performed at a temperature of about 320° C. 21. A contact in an opening in an insulative material, produced by the process of: forming a non-metal barrier material over the insulative material within the opening;depositing a conductive material over the non-metal barrier material to fill the opening selected from the group of ionized sputtering and metal evaporation; and reflowing the conductive material in an atmosphere selected to allow formation of a substantially void-free layer of conductive material at a temperature of about 320° C.