A method is provided for fabricating a stacked microelectronic assembly by steps including stacking and joining first and second like microelectronic substrates, each including a plurality of like microelectronic elements attached together at dicing lanes. Each microelectronic element has boundaries
A method is provided for fabricating a stacked microelectronic assembly by steps including stacking and joining first and second like microelectronic substrates, each including a plurality of like microelectronic elements attached together at dicing lanes. Each microelectronic element has boundaries defined by edges including a first edge and a second edge. The first and second microelectronic substrates can be joined in different orientations, such that first edges of microelectronic elements of the first microelectronic substrate are aligned with second edges of microelectronic elements of the second microelectronic substrate. After exposing traces at the first and second edges of the microelectronic elements of the stacked microelectronic substrates, first and second leads can be formed which are connected to the exposed traces of the first and second microelectronic substrates, respectively. The second leads can be electrically isolated from the first leads.
대표청구항▼
1. A stacked assembly including first and second stacked microelectronic elements, each of said first and second microelectronic elements having a first face, edges extending away from said first face and a plurality of traces extending along said first face towards said edges, wherein said first an
1. A stacked assembly including first and second stacked microelectronic elements, each of said first and second microelectronic elements having a first face, edges extending away from said first face and a plurality of traces extending along said first face towards said edges, wherein said first and second microelectronic elements have first and second different orientations, wherein at least some first traces of said first microelectronic element are electrically isolated from at least some second traces of said second microelectronic element, and said stacked assembly further includes first and second leads connected to said first and second traces, respectively, said first and second leads extending along said edges. 2. A stacked assembly as claimed in claim 1, wherein said first and second leads extend in parallel paths along at least some aligned edges of said plurality of edges. 3. A stacked assembly as claimed in claim 1, wherein said first faces of said microelectronic elements confront each other. 4. A stacked assembly as claimed in claim 1, further comprising a third microelectronic element stacked in alignment with said first and second microelectronic elements, said third microelectronic element having a third orientation different from said first and second orientations, wherein at least some third traces extend along a first face of said third microelectronic element and are electrically isolated from at least some of said first and said second traces of said first and second microelectronic elements, and said stacked assembly further includes third leads connected to said third traces, said third leads extending along said edges and being electrically isolated from said first and second leads. 5. A stacked assembly as claimed in claim 4, further comprising a fourth microelectronic element stacked in alignment with said first, second and third microelectronic elements, said fourth microelectronic element having a fourth orientation different from said first, second and third orientations, wherein at least some fourth traces extend along a first face of said fourth microelectronic element and are electrically isolated from at least some of said first, second and third traces, and said stacked assembly further includes fourth leads connected to said fourth traces, said fourth leads extending along said edges and being electrically isolated from said first, second and third leads. 6. A stacked assembly as claimed in claim 5, wherein said first faces of each of said first, second, third and fourth microelectronic elements has the same width and each said face has the same length. 7. A stacked assembly as claimed in claim 1, wherein each of said first and second microelectronic elements has north-south edges and east-west edges, wherein said traces extend from contacts adjacent to said north-south edges towards said east-west edges.
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