초록 ▼

An inspection apparatus can comprise at least one light source for illuminating a target. The at least one light source can be disposed and/or controlled in such manner as to reduce a heat generation by the at least one light source and in such manner as to reduce a power consumption of the at least

An inspection apparatus can comprise at least one light source for illuminating a target. The at least one light source can be disposed and/or controlled in such manner as to reduce a heat generation by the at least one light source and in such manner as to reduce a power consumption of the at least one light source.

대표청구항 ▼

1. An inspection apparatus for inspecting a target, said inspection apparatus comprising: an elongated inspection tube having a proximal end and a distal end, the elongated inspection tube comprising: a head assembly disposed at the distal end of said elongated inspection tube, said head assembly ha

1. An inspection apparatus for inspecting a target, said inspection apparatus comprising: an elongated inspection tube having a proximal end and a distal end, the elongated inspection tube comprising: a head assembly disposed at the distal end of said elongated inspection tube, said head assembly having an imaging lens;a base assembly coupled to the inspection tube at the proximal end of the inspection tube, said base assembly comprising: an image sensor generating image signals representing said target; anda light source bank comprising at least one LED; anda fiber optic bundle disposed in said elongated inspection tube for receiving image forming light rays of the target from the imaging lens and relaying the image forming light rays of the target to the image sensor in the base assembly, the fiber optic bundle being arranged to conduct light from said light source bank in the base assembly to, and outwardly from, said head assembly. 2. The inspection apparatus of claim 1, wherein said light source bank comprises a plurality of LEDs. 3. An inspection apparatus comprising: an elongated inspection tube having a proximal end and a distal end, the elongated inspection tube comprising: a camera head assembly disposed at the distal end of said elongated inspection tube, said camera head assembly having an imaging lens and an image sensor generating image signals;a base assembly coupled to the inspection tube at the proximal end of the inspection tube, said base assembly comprising: a first light source bank comprising at least one LED;a fiber optic bundle disposed in said elongated inspection tube and in said base assembly, the fiber optic bundle being arranged to conduct light from said first light source bank in the base assembly and outwardly from said camera head assembly; anda second light source bank disposed in said head assembly, the second light source bank arranged to conduct light outwardly from said camera head assembly in addition to the light from said first light source bank. 4. The inspection apparatus of claim 3, wherein said inspection apparatus is configured to selectively energize said first light source bank without energizing said second light source bank until a brightness of a captured image falls below a threshold and, and wherein said apparatus is configured to energize both said first light source bank and said second light source bank on the condition that said brightness falls below said threshold. 5. The inspection apparatus of claim 3, wherein said inspection apparatus is configured to sense a temperature of said apparatus and to output a light source bank driver signal responsively to said sensed temperature. 6. The inspection apparatus of claim 3, wherein said inspection apparatus is configured to sense a temperature of said apparatus and to output a light source bank driver signal responsively to said sensed temperature, and wherein for sensing said temperature said apparatus senses a voltage across at least one of said first light source bank or said second light source bank. 7. The inspection apparatus of claim 3, wherein said second light source bank comprises at least one LED. 8. The inspection apparatus of claim 3, wherein said second light source bank comprises at least one laser diode assembly. 9. An inspection apparatus comprising: an elongated inspection tube;a head assembly disposed at a distal end of said elongated inspection tube, said head assembly having an imaging lens, the imaging lens for receiving and focusing light rays from a target;an image sensor for receiving the focused light rays from the imaging lens and for generating image signals representing the target in response to receiving the focused light rays from the imaging lens;a light source bank coupled to the head assembly for emitting light outwardly from said head assembly toward the target, wherein said light source bank comprises at least one LED;wherein said apparatus is configured to send alternating exposure control timing signals to said image sensor in such manner that said image sensor alternates sequentially between exposure on periods for receiving the focused light rays from the imaging lens and exposure off periods for not receiving the focused light rays from the imaging lens; andwherein said apparatus is further configured to output alternating light source bank driver signals for energizing and de-energizing said at least one light source bank, and wherein said light source bank driver signals are coordinated with said exposure control timing signals such that said light source bank alternates sequentially between being energized during said exposure on periods of said image sensor and being de-energized during the exposure off periods of said image sensor. 10. The inspection apparatus of claim 9, wherein said light source bank is disposed in said head assembly. 11. The inspection apparatus of claim 9, wherein said inspection apparatus includes a base assembly disposed at the proximal end of said elongated inspection tube, and wherein said light source bank is disposed in said base assembly. 12. The inspection apparatus of claim 9, wherein said inspection apparatus is configured so that said light source bank driver signal drives said light source bank at less than a maximum duty cycle during said exposure periods. 13. An inspection apparatus comprising: an elongated inspection tube;a head assembly disposed at a distal end of said elongated inspection tube, said head assembly having an imaging lens, the imaging lens for receiving and focusing light rays from a target;an image sensor for receiving the focused light rays from the imaging lens and for generating image signals representing an image of the target in response to receiving the focused light rays from the imaging lens;at least one light source bank coupled to the head assembly for emitting light outwardly from said head assembly toward the target;wherein said inspection apparatus is configured to output a light source bank driver signal for controlling an intensity of the light emitted by said at least one light source bank;wherein said inspection apparatus comprises a processor configured to examine frames of the image signals and to determine an increasing or decreasing brightness of the image of the target represented by said image signals; andwherein said inspection apparatus comprises a regulator coupled to the processor, the regulator for adjusting a power level of said light source bank driver signal for decreasing or increasing the intensity of the light emitted by said at least one light source bank in response to the determination of increasing or decreasing brightness of the image of the target, respectively. 14. The inspection apparatus of claim 13, wherein said inspection apparatus in adjusting the power level of said light source bank driver signal adjusts a peak power level of said light source bank driver signal. 15. The inspection apparatus of claim 13, wherein said inspection apparatus in adjusting the power level of said light source bank driver signal adjusts a duty cycle of said light source bank driver signal. 16. The inspection apparatus of claim 13, wherein said at least one light source bank comprises a single LED. 17. The inspection apparatus of claim 13, wherein said at least one light source bank comprises a plurality of LEDs. 18. The inspection apparatus of claim 13, wherein said at least one light source bank includes a first light source bank disposed at a location spaced apart from said head assembly and a second light source bank disposed in said head assembly. 19. The inspection apparatus of claim 13, wherein said at least one light source bank includes a first light source bank disposed at a location spaced apart from said head assembly and a second light source bank disposed in said head assembly, wherein said inspection apparatus is configured to energize said second light source bank conditionally on the condition that said brightness falls below a threshold brightness. 20. An inspection apparatus comprising: an elongated inspection tube;a head assembly disposed at a distal end of said elongated inspection tube, said head assembly having an imaging lens, the imaging lens for receiving and focusing light rays from a target;an image sensor for receiving the focused light rays from the imaging lens and for generating image signals representing the target in response to receiving the focused light rays from the imaging lens;at least one light source bank coupled to the head assembly for emitting light outwardly from said head assembly toward the target;wherein said inspection apparatus is adapted to output a light source bank driver signal for controlling an intensity of the light emitted by said at least one light source bank;wherein said inspection apparatus comprises a temperature sensor adapted to output a temperature of said image sensor; and wherein said inspection apparatus comprises a processor coupled to the temperature sensor and configured to receive the temperature of said image sensor and to reduce a power level of said light source bank driver signal for driving said at least one light source bank responsively to said received temperature of said image sensor exceeding a preselected temperature level. 21. The inspection apparatus of claim 20, wherein said temperature sensor includes a thermistor disposed proximate said image sensor, and wherein said inspection apparatus is configured so that in outputting the temperature of said image sensor, said inspection apparatus reads an output of said thermistor. 22. The inspection apparatus of claim 20, wherein said inspection apparatus in outputting a temperature of said image sensor processes said image signals. 23. The inspection apparatus of claim 20, wherein said at least one light source bank is disposed proximate said image sensor, and wherein said inspection apparatus in outputting said temperature senses a voltage across said light source bank.