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Tuning capacitance to enhance FET stack voltage withstand 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-029/788
출원번호 US-0046560 (2011-03-11)
등록번호 US-8536636 (2013-09-17)
발명자 / 주소
  • Englekirk, Robert Mark
출원인 / 주소
  • Peregrine Semiconductor Corporation
대리인 / 주소
    Jaquez & Associates
인용정보 피인용 횟수 : 30  인용 특허 : 304

초록

An RF switch to controllably withstand an applied RF voltage Vsw, or a method of fabricating such a switch, which includes a string of series-connected constituent FETs with a node of the string between each pair of adjacent FETs. The method includes controlling capacitances between different nodes

대표청구항

1. A method of fabricating a stacked RF switch that includes a multiplicity of series connected constituent transistors in a series string for which internal nodes are those between each pair of adjacent transistors, the method comprising: coupling a discrete capacitive feature to one or more intern

이 특허에 인용된 특허 (304)

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