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Imaging systems, imaging device analysis systems, imaging device analysis methods, and light beam emission methods are described. According to one aspect, an imaging device analysis method includes receiving initial light comprising a plurality of wavelengths of light, filtering some of the waveleng

Imaging systems, imaging device analysis systems, imaging device analysis methods, and light beam emission methods are described. According to one aspect, an imaging device analysis method includes receiving initial light comprising a plurality of wavelengths of light, filtering some of the wavelengths of the initial light forming a plurality of light beams comprising different wavelengths of light, after the filtering, optically communicating the light beams of the different wavelengths of light to an imaging device, receiving the light beams using the imaging device, and analyzing the imaging device using light, wherein the light beams comprising the different wavelengths of light are emitted beams after the receiving.

대표청구항 ▼

1. An imaging device analysis system comprising: a light source configured to emit initial light comprising a plurality of wavelengths of light; a filter assembly optically coupled with the light source and configured to receive the initial light, wherein the filter assembly comprises a planar mask

1. An imaging device analysis system comprising: a light source configured to emit initial light comprising a plurality of wavelengths of light; a filter assembly optically coupled with the light source and configured to receive the initial light, wherein the filter assembly comprises a planar mask opaque with respect to the initial light and defining spatially separated apertures for receiving respective a plurality of optical filters that are individually configured to filter some of the wavelengths of light from the initial light and to pass a respective discrete light beam comprising at least one of the wavelengths of light, wherein respective ones of the optical filters have different respective passbands such that the wavelengths of light of the light beams passed by the respective optical filters are different, and the optical filters are disposed in different respective ones of the apertures of the mask; and an emission interface optically coupled with the filter assembly and configured to emit the light beams to an imaging device configured to capture images responsive to received light. 2. The system of claim 1 wherein the light source is configured to emit broadband light having wavelengths across substantially an entirety of the visible spectrum. 3. The system of claim 1 wherein the optical filters are individually configured to pass a respective peak wavelength spectrally separated from a peak wavelength of at least one immediately spectrally adjacent optical filter by substantially the same spectral spacing. 4. The system of claim 1 wherein the optical filters are individually configured to pass light of substantially a single peak wavelength. 5. The system of claim 1 wherein the emission interface sequentially emits individual ones of the light beams. 6. The system of claim 1 wherein the emission interface simultaneously emits the light beams. 7. The system of claim 1 wherein the emission interface emits the light beams having substantially the same intensity. 8. The system of claim 1 further comprising a homogenizer optically coupled with the filter assembly and configured to homogenize light from the light source, wherein for each of the optical filters, the homogenizer comprises a respective light tunnel that receives and homogenizes the initial light emitted by the light source to produce a discrete beam of homogenized light that is received by the optical filter. 9. The system of claim 1 further comprising a diffuser optically coupled with the filter assembly. 10. The system of claim 1 wherein each of the optical filters is configured to slide into and out of position in a respective one of the apertures of the mask.