Method for obtaining a structure factor of an amorphous material, in particular amorphous glass
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G01N-023/20
G01N-023/207
출원번호
US-0055414
(2009-07-08)
등록번호
US-8600004
(2013-12-03)
우선권정보
FR-08 04168 (2008-07-22)
국제출원번호
PCT/EP2009/058698
(2009-07-08)
§371/§102 date
20110411
(20110411)
국제공개번호
WO2010/009982
(2010-01-28)
발명자
/ 주소
Bouty, Olivier
출원인 / 주소
Commissariat a l'Energie Atomique et aux Energies Alternatives
대리인 / 주소
Baker & Hostetler LLP
인용정보
피인용 횟수 :
0인용 특허 :
3
초록▼
An incident X-ray is emitted in a wide angular sector toward an amorphous material specimen which backscatters the X-rays. The method comprises: a step of recording experimental photon intensity measurements as a function of the angle of incidence;a step of correcting the experimental intensity, tak
An incident X-ray is emitted in a wide angular sector toward an amorphous material specimen which backscatters the X-rays. The method comprises: a step of recording experimental photon intensity measurements as a function of the angle of incidence;a step of correcting the experimental intensity, taking into account at least the absorption phenomena inside the specimen dependent on the penetration length l of the incident wave inside the specimen before reflection;a normalization step referring the corrected intensity arising from the experimental intensity to an electron intensity according to a normalization coefficient (α);a step of calculating a discretized function Q.i(Q), i being a reduced intensity arising from the measurements of the corrected and normalized experimental intensity and Q being the modulus of the wave scattering vector proportional to the quantity (sin θ)/λ, 2θ being the scattering angle and λ being the length of the wave emitted, the normalization constant (α) varying in a recursive manner so as to minimize the slope of the affine straight line obtained by linear regression over the values of the function Q.i(Q), during each iteration the values of the reduced intensity being calculated for a penetration length l, the function Q.i(Q) sought corresponding to the minimum slope;a step of determining the structure factor on the basis of the distribution of the radial atomic concentration ρ(r) dependent on Q.i(Q).
대표청구항▼
1. A method for obtaining the structure factor of an amorphous material on the basis of a spectrum of X-ray scattering inside a specimen of said material recorded experimentally, at least one X-ray being emitted as an incident ray toward said specimen and reflected toward a detector, the incident X-
1. A method for obtaining the structure factor of an amorphous material on the basis of a spectrum of X-ray scattering inside a specimen of said material recorded experimentally, at least one X-ray being emitted as an incident ray toward said specimen and reflected toward a detector, the incident X-ray scanning the surface of the specimen according to a given angle of incidence, comprising: a step of recording experimental photon intensity measurements performed by the detector as a function of the angle of incidence;a step of correcting the experimental intensity, taking into account at least the absorption phenomena inside the specimen, the amount of intensity absorbed at each measurement being dependent on the penetration length l of the incident wave inside the specimen before reflection;a normalization step referring the corrected intensity arising from the experimental intensity to an electron intensity according to a normalization coefficient (α);a step of calculating a discretized function Q.i(Q), i being a reduced intensity, which is the ratio (Icd/Ici) of the reflected dependent coherent intensity over the reflected independent coherent intensity, arising from the measurements of the corrected and normalized experimental intensity and Q being the modulus of the wave scattering vector proportional to the quantity (sin θ)/λ, 2θ being the scattering angle and λ being the length of the wave emitted, the normalization constant (α) varying in a recursive manner so as to minimize the slope of the affine straight line obtained by linear regression over the values of the function Q.i(Q), during each iteration the values of the reduced intensity being calculated for a penetration length l, the function Q.i(Q) sought corresponding to the minimum slope; anda step of determining the structure factor on the basis of the distribution of the radial atomic concentration ρ(r) dependent on Q.i(Q). 2. The method as claimed in claim 1, wherein the function Q.i(Q) sought corresponds to the zero slope. 3. The method as claimed in claim 1, wherein the reduced intensity is obtained on the basis of the experimental intensity corrected for the phenomena of absorption, polarization and residual gas Imeasured corrected and the independent incoherent intensity Iii and independent coherent intensity Ici: i=Imeasuredcorrected-(Iii+Ici)Ici. 4. The method as claimed in claim 1, wherein the normalization coefficient α is given by the following relation: α=∫0∞Q2IexpⅆQ-2π2ρ0(∑jZj)2∫0∞Q2(Ielasticind+Iinelasticind)ⅆQ,ρ0 being the mean atomic density corresponding to the inverse of the volume of the atoms present in a unit of composition of the specimen, Iexp being the experimental intensity, Ielastic ind and Iinelastic ind being the elastic independent and inelastic independent reflected intensity and Zj corresponding to the atomic number of an atom j. 5. The method as claimed in claim 1, wherein the function Q.i(Q) obtained is related to the radial atomic concentration distribution function ρ(r) by the following relation: r[ρ(r)-ρ(0)]=12π2∫à∞Qi(Q)sinQrⅆQ,the radius r being the distance from a given atom, the scattering center, ρ(r) being the atomic concentration in a spherical shell of radius r and of thickness dr. 6. The method as claimed in claim 1, wherein the X scattering method is the so-called large angle scattering method (WAXS). 7. The method as claimed in claim 1, wherein the material is amorphous glass. 8. The method as claimed in claim 7, wherein the glass may envelop radioactive elements.
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이 특허에 인용된 특허 (3)
Barton Scott W. ; Calandra Peter M., Angle dispersive x-ray spectrometer.
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