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A system, apparatus, and method for detecting overlapped items in a sequence of items moving along a conveying path based on rigidity and thickness contour measurements.

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1. An overlap detection system for detecting overlapped items in a sequence of items transported along a conveyance path, the system comprising: a thickness measuring device positioned adjacent the conveyance path to measure a thickness of an item at a plurality of locations along a length of the it

1. An overlap detection system for detecting overlapped items in a sequence of items transported along a conveyance path, the system comprising: a thickness measuring device positioned adjacent the conveyance path to measure a thickness of an item at a plurality of locations along a length of the item; anda processing device configured to determine whether a double feed condition is present based on the thickness measurement,wherein,the processing device is further configured to:generate a thickness outline of the item based on the measured thicknesses;generate one or more edge levels corresponding to differences between adjacent thickness levels in the thickness outline;compare each edge level with a predetermined value; anddetermine whether a double feed condition is present based on the comparison,wherein a double feed condition is determined to be present when an edge level is greater than the predetermined value, andwherein a number of overlapped items corresponds with a number of edge levels which are greater than the predetermined value. 2. The system of claim 1, wherein the items in the sequence of items include one or more flat objects that are completely or partially overlapped and which have same or different shapes, sizes, dimensions, colors, and/or thicknesses. 3. The system of claim 2, wherein the flat objects include mail pieces, shingles, and/or plates. 4. The system of claim 1, wherein the processing device further includes: an outline extraction device for generating the thickness outline from data representing different thicknesses measured by the thickness measuring device;an analyzing device for analyzing the extracted thickness outline to determine discrete levels of thicknesses and to determine transition edges between areas of adjacent discrete thickness levels;a calculating device for calculating a height of each transition edge to generate the edge levels; andan evaluation device for evaluating each edge level to determine the presence of overlapped items,wherein the evaluating device further includes a comparing device to compare each edge level with the predetermined value. 5. The system of claim 1, further comprising a rigidity measuring device to measure a rigidity of the item in the sequence of items,wherein the processing device is further configured to compare the measured rigidity with a predetermined rigidity value and determine whether the item is an overlapped item based on the edge level and the rigidity comparisons. 6. The system of claim 1, further comprising: a transition section in the conveyance path for changing a direction of movement of the item along the conveyance path so as to shift overlapped items relative to each other, the changing of the direction of movement including transporting the item along a transition section in the conveyance path. 7. The system of claim 6, wherein the transition section includes any one of a bent portion, a curved portion, and an edge portion in the conveyance path. 8. The system of claim 7, further comprising a rigidity or stiffness measuring device for measuring a rigidity of the item as it moves along the transition section, wherein the processing device determines whether the item is an overlapped item based on the thickness and the rigidity measurements. 9. The system of claim 8, wherein measuring the rigidity includes measuring a deflection of the item at a predetermined position.