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A measurement system comprising a light source unit, a projection unit and an optics unit is disclosed. The light source unit is configured to generate a plurality of modulated phase shifted light beams. The projection unit is configured to reflect the modulated phase shifted light beams onto an obj

A measurement system comprising a light source unit, a projection unit and an optics unit is disclosed. The light source unit is configured to generate a plurality of modulated phase shifted light beams. The projection unit is configured to reflect the modulated phase shifted light beams onto an object surface. The optics unit is configured to capture the modulated phase shifted light beams from the object surface. The measurement system further comprises a photodetector and a processor. The photodetector is configured to receive the modulated phase shifted light beams from the optics unit to generate electrical signals. The processor is configured to retrieve position information of the object surface based on the electrical signals from the photodetector. A measurement method is also presented.

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1. A measurement system, comprising: a light source unit configured to generate a plurality of modulated phase shifted light beams;a projection unit configured to reflect the modulated phase shifted light beams onto an object surface;an optics unit configured to capture the modulated phase shifted l

1. A measurement system, comprising: a light source unit configured to generate a plurality of modulated phase shifted light beams;a projection unit configured to reflect the modulated phase shifted light beams onto an object surface;an optics unit configured to capture the modulated phase shifted light beams from the object surface;a photodetector configured to receive the modulated phase shifted light beams from the optics unit to generate electrical signals; anda processor configured to retrieve position information of the object surface based on the electrical signals from the photodetector, wherein the position information comprises depths or Z coordinates of a point on the object surface along a Z-axis, wherein after the modulated phase shifted beams from the point on the object are detected by the photodetector, intensity pulses are generated in the respective electrical signals, wherein the processor is further configured to:identify positions of maximum values and half maximum valves on the respective intensity pulses,collect point values on sections between the maximum value positions and the half maximum value positions on the respective intensity pulses, andfit the sections based on the collected point values into respective normal curves, and wherein peak values on the normal curves are intensity values of the respective modulated phase shifted beam. 2. The measurement system of claim 1, wherein the light source unit comprises a light source and a modulator configured to modulate the light source to generate the modulated phase shifted light beams. 3. The measurement system of claim 1, wherein the projection unit comprises a rotatable element configured to reflect the modulated phase shifted light beams onto an object surface. 4. The measurement system of claim 3, wherein the rotatable element is configured to reflect the modulated phase shifted light beams onto an object surface during rotation of the rotatable element. 5. The measurement system of claim 4, wherein a rotating angle of the rotation element is in a range of from 9.22° to 22.5°. 6. The measurement system of claim 1, wherein the optics unit comprises a first optic element and a second optic element disposed between the object and the photodetector. 7. A measurement method, comprising: reflecting, a plurality of modulated phase shifted light beams from a light source unit onto an object surface;capturing the modulated phase shifted light beams from the object surface via an optics unit;detecting the modulated phase shifted light beams from the optics unit to generate electrical signals via a photodetector; andprocessing, the electrical signals from the photodetector via a processor, wherein the electrical signals from the photodetector are processed via the processor to retrieve position information of the object surface; and wherein the position information comprises depths or Z coordinates of a point on the object surface along a Z-axis, wherein after the modulated phase shifted beams from the point on the object are detected by the photodetector, intensity pulses are genenerated in the respective electrical signals, wherein the measurement method further comprising;identifying positions of maximum values and half maximum valves on the respective intensity pulses,collecting, point values on sections between the maximum value positions and the half maximum value positions on the respective intensity pulses, andfitting the sections based on the collected point values into respective normal curves, and wherein peak values on the normal curves are intensity values of the respective modulated phase shifted beam. 8. The measurement method of claim 7, wherein the modulated phase shifted light beams are reflected via a rotatable element. 9. The measurement method of claim 8, wherein a rotating angle of the rotation element is in a range of from 9.22° to 22.5°. 10. The measurement method of claim 8, wherein each of the modulated phase shifted light beams comprises a sinusoidal intensity. 11. The measurement method of claim 10, further comprising modulating rotation of the rotatable element with a triangle wave having a plurality of rising edges and a plurality of respective falling edges before the modulated phase shifted light beams are reflected by the rotatable element. 12. The measurement method of claim 11, wherein the rising edges and the falling edges have a consistent slope, respectively. 13. The measurement method of claim 11, further comprising multiplying the sinusoidal intensity of each modulated light beam with a square wave after the rotatable element is modulated with the triangle wave and before the modulated light beams are reflected by the rotatable element. 14. The measurement method of claim 13, wherein the square wave has the same frequency as a rotation frequency of the rotatable element. 15. The measurement method of claim 10, further comprising performing a linear correction to the rotatable element before the modulated phase shifted light beams are reflected by the rotatable element. 16. The measurement method of claim 10, wherein the light source unit generates a first group of three phase shifted light beams and a second group of three phase shifted light beams after the first group of the three phase shifted light beams are processed via the processor. 17. The measurement method of claim 16, wherein the sinusoidal intensity of each of the phase shifted light beams in the first group comprises one period, and wherein the sinusoidal intensity of each of the phase shifted light beams in the second group comprises more than one period. 18. The measurement of claim 17, wherein the processor processes the first group of the three phase shifted light beams to obtain a rough position information and a phase order of the point on the object surface, and wherein the processor processes the second group of the three phase shifted light beams to obtain a refined position information of the point on the object surface based on the phase order.