IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
|
출원번호 |
US-0197948
(2008-08-25)
|
등록번호 |
US-8679420
(2014-03-25)
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발명자
/ 주소 |
- LaStella, Vincent P.
- Kupits, Kenneth
|
출원인 / 주소 |
|
대리인 / 주소 |
Stroock & Stroock & Lavan LLP
|
인용정보 |
피인용 횟수 :
1 인용 특허 :
61 |
초록
▼
A device for testing a specimen comprising a first panel, a metering aperture structure having a plurality of metering apertures formed therein for receiving the specimen therethrough, a second panel opposite the first panel, a sheet disposed between the first and second panels, the sheet including
A device for testing a specimen comprising a first panel, a metering aperture structure having a plurality of metering apertures formed therein for receiving the specimen therethrough, a second panel opposite the first panel, a sheet disposed between the first and second panels, the sheet including a test area aligned with the plurality of metering apertures, a spacer element disposed between the first panel and the sheet, wherein the metering aperture structure is spaced away from the test area thereby improving readability of the testing. A method of manufacturing a specimen testing device is also disclosed.
대표청구항
▼
1. A device having a specimen collection configuration, in which one or more specimens are collected, and a specimen testing configuration, in which the one or more specimens are tested, the device comprising: a first panel;one or more metering aperture structures disposed on the first panel, each m
1. A device having a specimen collection configuration, in which one or more specimens are collected, and a specimen testing configuration, in which the one or more specimens are tested, the device comprising: a first panel;one or more metering aperture structures disposed on the first panel, each metering aperture structure comprising one or more groups of metering apertures, each group of metering apertures for receiving a separate one of the one or more specimens therethrough;a second panel opposite the first panel;a sheet including one or more test areas, the sheet disposed between the one or more metering aperture structures and second panel when the device is in the collection configuration and each test area aligned with a separate one of the groups of metering apertures, such that depositing the specimen through one of the groups of metering apertures deposits the specimen on the test area aligned therewith when the device is in the collection configuration;a spacer element, which, when the device is in the testing configuration, is disposed between the metering aperture structure and the sheet, creating a space between the metering aperture structure and the test area. 2. The device of claim 1, wherein the spacer element is a third panel. 3. The device of claim 2, wherein the spacer element includes at least one aperture aligned with one of the groups of metering apertures when the device is in the testing configuration. 4. The device of claim 1, wherein the spacer element is integral with the first panel. 5. The device of claim 1, wherein the spacer element is integral with the second panel. 6. The device of claim 1, wherein the first panel, the second panel, and the spacer element are formed from a single piece of material and are hingably connected to each other along a fold. 7. The device of claim 1, wherein the second panel includes a flap, the flap covering an aperture in the second panel that is aligned with one of the one or more test areas. 8. The device of claim 1, wherein the spacer element is at least one strip of material adjacent one of the groups of metering apertures. 9. The device of claim 1 wherein at least one of the one or more metering aperture structures is integrally formed in the first panel. 10. The device of claim 1 wherein at least one of the one or more metering aperture structures is separately formed and is disposed on the first panel. 11. The device of claim 1 wherein, in the specimen testing configuration, the one or more test areas are free of contact with any other structure of the device. 12. The device of claim 1 wherein the space is between at least a portion of one of the one or more metering aperture structures and at least a portion of the test area aligned with the one metering aperture structure. 13. The device of claim 1 wherein the space is between one of the one or more metering aperture structures and the entire test area aligned with the one metering aperture structure. 14. The device of claim 1 including two or more groups of metering apertures and two or more test areas.
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