초록 ▼

A device is described that allows for the insertion and removal of a Transmission Electron Microscope (TEM) specimen stage and insertion rod into and out of a vacuum chamber. The device can be configured to accommodate specimen stage and insertion rods manufactured by all TEM producers. The device h

A device is described that allows for the insertion and removal of a Transmission Electron Microscope (TEM) specimen stage and insertion rod into and out of a vacuum chamber. The device can be configured to accommodate specimen stage and insertion rods manufactured by all TEM producers. The device has a side-entry slot for accepting the cylindrical stage rod and a locking mechanism, such that unwanted contact with the specimen and the specimen stage itself is avoided during entry and exit from the plasma vacuum chamber. The devices hold said specimen stage and insertion rod in position during the process of plasma cleaning in a vacuum chamber.

대표청구항 ▼

1. A method for loading and unloading a transmission electron microscope (TEM) sample holder into and out of a plasma cleaner vacuum chamber while minimizing the possibility of damage or recontamination to the specimen or specimen stage by use of an entry formed in the vacuum chamber, the apparatus

1. A method for loading and unloading a transmission electron microscope (TEM) sample holder into and out of a plasma cleaner vacuum chamber while minimizing the possibility of damage or recontamination to the specimen or specimen stage by use of an entry formed in the vacuum chamber, the apparatus comprising: selecting a loading guide corresponding to the TEM sample holder and securing the loading guide to the vacuum chamber through an accepting gate secured to an aperture in the sample chamber;inserting the TEM sample holder into the loading guide laterally through a side entry slot in the loading guide;orienting the TEM sample holder to a selected orientation within the loading guide by registering an alignment pin on the TEM sample holder with a groove in the loading guide;inserting the oriented TEM sample holder axially through the loading guide and into the vacuum chamber;viewing the TEM sample holder while it is inserted into the loading guide using a viewing port in the loading guide; andremoving the TEM sample holder while viewing it through the viewing port to insure that the specimen stage and specimen have properly cleared the loading guide. 2. An apparatus for loading a transmission electron microscope (TEM) sample holder into a vacuum chamber while minimizing the possibility of damage or recontamination to the specimen or specimen stage by use of an entry formed in the vacuum chamber, the apparatus comprising: a generally tubular loading guide having a passage therethrough;an accepting gate into which the loading guide is inserted, the accepting gate secured to an aperture in the vacuum chamber;a longitudinal slot formed in the loading guide to permit lateral loading and unloading of a TEM sample holder into the loading guide followed by axial insertion of the TEM sample holder into the vacuum chamber through the passage in the loading guide;a viewing port formed in the loading guide to permit viewing of the passage from an exterior of the loading guide;an alignment pin groove formed in the loading guide and engaging with a corresponding pin on the TEM sample holder to guide it through the loading guide; anda sealing surface to create a vacuum seal between the loading guide and the accepting gate. 3. The apparatus according to claim 2, wherein the accepting gate is welded to the vacuum chamber. 4. The apparatus according to claim 2, wherein the accepting gate is secured to a flange or fitting port on the vacuum chamber. 5. The apparatus according to claim 2, further comprising a locking member on the loading guide to releasably secure it to the accepting gate. 6. The apparatus according to claim 5, wherein the loading guide is dimensioned to receive a TEM sample holder specific to a TEM manufacturer and having a locking member configured to engage a locking member provided by the same TEM manufacturer. 7. An apparatus for loading a transmission electron microscope (TEM) sample holder into a vacuum chamber of a TEM comprising: an accepting gate secured to an aperture in the wall of the vacuum chamber and communicating with an interior of the vacuum chamber;a loading guide configured to be received in and form a vacuum seal with the accepting gate, the loading guide having a passage through it in communication with the interior of the vacuum chamber when the loading guide is received in the accepting gate;a longitudinal slot formed in the loading guide to permit lateral loading and unloading of a TEM sample holder into the passage in the loading guide and axial insertion of the TEM sample holder into the interior of the vacuum chamber through the loading guide and accepting gate;a viewing port formed in the loading guide separate from the longitudinal slot to permit viewing of the passage from an exterior of the loading guide; andan alignment pin groove formed in the loading guide and engaging with a corresponding pin on the TEM sample holder to guide it through the loading guide. 8. The apparatus according to claim 7, wherein the accepting gate is welded to the vacuum chamber. 9. The apparatus according to claim 7, wherein the accepting gate is secured to a flange or fitting port on the vacuum chamber. 10. The apparatus according to claim 7, further comprising a locking member on the loading guide to releasably secure it to the accepting gate. 11. The apparatus according to claim 10, wherein the loading guide is dimensioned to receive a TEM sample holder specific to a TEM manufacturer and having a locking member configured to engage a locking member provided by the same TEM manufacturer.