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Inspection apparatus method and apparatus comprising selective frame output 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H04N-007/18
출원번호 US-0642569 (2006-12-20)
등록번호 US-8810636 (2014-08-19)
발명자 / 주소
  • Bendall, Clark A.
출원인 / 주소
  • GE Inspection Technologies, LP
대리인 / 주소
    Hiscock & Barclay LLP
인용정보 피인용 횟수 : 7  인용 특허 : 175

초록

A control signal for selectively outputting a frame of image data can be initiated using an inspection apparatus, and an inspection apparatus can process one or more frames of image data for determining a motion parameter. Responsively to the processing, the inspection apparatus can selectively outp

대표청구항

1. A method for operating an inspection apparatus having an elongated inspection tube and an image sensor for generating image signals, said method comprising the steps of: (a) displaying a video stream comprising successive frames of image data on a display;(b) initiating a control signal to output

이 특허에 인용된 특허 (175)

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  1. Bendall, Clark Alexander, Graphic overlay for measuring dimensions of features using a video inspection device.
  2. Bendall, Clark Alexander, Method and device for automatically identifying a point of interest in a depth measurement on a viewed object.
  3. Bendall, Clark Alexander, Method and device for automatically identifying a point of interest in a depth measurement on a viewed object.
  4. Bendall, Clark Alexander, Method and device for automatically identifying a point of interest on a viewed object.
  5. Bendall, Clark Alexander, Method and device for automatically identifying the deepest point on the surface of an anomaly.
  6. Bendall, Clark Alexander; Ball, Michael Melvin, Method and device for displaying a two-dimensional image of a viewed object simultaneously with an image depicting the three-dimensional geometry of the viewed object.
  7. Bendall, Clark Alexander, Method and device for measuring features on or near an object.
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