IPC분류정보
국가/구분 |
United States(US) Patent
등록
|
국제특허분류(IPC7판) |
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출원번호 |
US-0273642
(2008-11-19)
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등록번호 |
US-8815103
(2014-08-26)
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발명자
/ 주소 |
- Bookbinder, Dana Craig
- LeBlond, Nicolas
- Young, Judith Eileen
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출원인 / 주소 |
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대리인 / 주소 |
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인용정보 |
피인용 횟수 :
0 인용 특허 :
1 |
초록
▼
A method of preparing an optical preform includes the steps of: a) etching an optical preform to remove a portion of an oxide material deposited on the preform by using a gas comprising an etchant gas containing fluorine at a sufficient temperature and gas concentration to create a redeposited germa
A method of preparing an optical preform includes the steps of: a) etching an optical preform to remove a portion of an oxide material deposited on the preform by using a gas comprising an etchant gas containing fluorine at a sufficient temperature and gas concentration to create a redeposited germanium containing compounds contamination such as GeOx in the remaining oxide material; and b) cleaning the etched preform using a cleaning gas containing at least one halogen gas at a sufficient temperature and gas concentration to remove the redeposited germanium containing compound contamination without any substantial further contamination of the remaining deposited oxide material. Preferably the halogen is either chlorine or bromine.
대표청구항
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1. A process for preparing an optical preform, said method comprising the steps of: a) etching an inner portion of an optical preform, said inner portion containing at least 10 wt % GeO2, to remove a portion of an oxide material deposited on the preform by using a gas comprising an etchant gas conta
1. A process for preparing an optical preform, said method comprising the steps of: a) etching an inner portion of an optical preform, said inner portion containing at least 10 wt % GeO2, to remove a portion of an oxide material deposited on the preform by using a gas comprising an etchant gas containing fluorine at a sufficient temperature and gas concentration to create a redeposited Ge compound contamination in the remaining oxide material on an etched portion an optical preform; andb) cleaning the etched preform at a temperature between 800° C. and 1600° C. by providing to the etched portion of the preform a cleaning gas containing at least one halogen gas at a sufficient temperature and gas concentration to remove the redeposited Ge compound contamination without any substantial further contamination of the remaining deposited oxide material, wherein the halogen is either chlorine or bromine and does not contain fluorine. 2. The process of claim 1, wherein etchant gas is selected from the group consisting of CF4, SF6, NF3, C2F6, C4F8, CHF3, C2F6, and combinations thereof. 3. The process of claim 1, wherein the cleaning gas containing halogen are is at least one gas selected from the group consisting of: Br2; Cl2; CH3Cl; CH2Cl2; CHCl3; CCl4; COCl2; and/or a saturated, unsaturated, cyclic or aromatic halohydrocarbon, CxHyHalogenz, where halogen is Cl or Br, and x is ≧1, y≧0, and 0, and z>1. 4. The process of claim 1, wherein the etchant gas comprises SF6 and the cleaning gas comprises at least one of: CO and Cl2. 5. The process of claim 1, wherein the etchant gas comprises SF6 and the cleaning gas comprises halogen gas Cl2. 6. The process of claim 1, wherein the redeposited Ge compound contamination is a layer of GeOxFy or GeOx, wherein x≧1 and y≧0, and cleaning gas includes oxygen-scavenger gas CO and the halogen gas is Cl2. 7. The process of claim 1, wherein said cleaning step is 1 minute to 120 minutes long. 8. A process for preparing an optical preform, said method comprising the steps of: a) etching an inner portion of an optical preform containing Ge said inner portion containing at least 10 wt % GeO2, to remove a portion of an oxide material deposited on the preform by using a gas comprising an etchant gas containing fluorine at a sufficient temperature and gas concentration to create a redeposited Ge compound contamination in the remaining oxide material on an etched portion an optical preform; andb) cleaning the etched preform by providing to the etched portion of the preform a cleaning gas containing at least one halogen gas at a sufficient temperature and gas concentration to remove the redeposited Ge compound contamination without any substantial further contamination of the remaining deposited oxide material, wherein the halogen is either chlorine or bromine and does not contain fluorine , wherein said cleaning gas further contains at least one oxygen-scavenger gas. 9. The process of claim 8, wherein the optical preform is partially collapsed prior to etching, the preform having an inner and outer surface and the redeposited Ge compound contamination is on the inner surface. 10. The process of claim 9, wherein the preform is partially collapsed before etching and the inner surface has inner diameter of less than about 10 mm. 11. The process of claim 10, wherein the inner diameter is not larger than 5 mm. 12. The process of claim 10, wherein the temperature during the etching step is greater than 1300° C. and is less than about 1700° C. 13. The process of claim 12 wherein the temperature during the etching step is less than about 1400° C. to 1600° C. 14. The process of claim 12, wherein the cleaning step temperature is between 800° C. and 1600° C. 15. A process for preparing an optical fiber preform comprising the steps of: a) etching an inner surface of the optical fiber preform containing at least 10 wt % GeO2 to remove a portion of an oxide material deposited on the preform by using a gas comprising an etchant gas containing fluorine at a sufficient temperature and gas concentration to create a germanium containing compound contamination layer in the remaining oxide material; andb) cleaning the etched inner surface of the preform at temperatures between 800° C. and 1600° C. by providing a cleaning gas containing at least one oxygen-scavenger gas and at least one halogen gas to the etched inner surface of the preform without any substantial further contamination of the remaining deposited oxide material. 16. The process of claim 15, wherein the first etchant gas has a flow rate of greater than about 65 sccm and the cleaning gas has a flow rate of at least 25 sccm. 17. The process of claim 16, wherein said etchant gas is selected from the group consisting of CF4, SF6, NF3, C2F6, C4F8, CHF3, C2F6 and combinations thereof; and said cleaning gas is selected from the group consisting of: CO; CCl4; CH4; C2H6; propane; acetylene; ethylene; CH3Cl; CH2Cl2; CHCl3; COCl2; CxHyHalogenz, where halogen is Cl or Br, and x is >1, y≧0, and y+z=2x+2; Br2; Cl2, and combinations thereof. 18. A process for preparing an optical fiber preform comprising the steps of: a) etching an inner portion of an optical fiber perform, said inner portion containing at least 10 wt % GeO2 to remove a portion of an oxide material deposited on the preform by using a gas comprising an etchant gas containing fluorine at a sufficient temperature and gas concentration to create a GeOx contamination layer in the remaining oxide material; andb) cleaning the etched portion of the preform using a cleaning gas, said cleaning gas comprising at least one gas selected from the group consisting of CO; CCl4; CH4; C2H6; propane; acetylene; ethylene; CH3Cl; CH2Cl2; CHCl3; COCl2; CxHyHalogenz where halogen is Cl or Br, and x is >1, y≧0, and y+z=2x+2; Br2; and Cl2, at a sufficient temperature and gas concentration to remove the redeposited oxide GeOx contamination layer without any substantial further contamination of the remaining deposited oxide material.
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