High-speed particle detector for discriminating charge states of ions
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
H01J-049/26
H01L-039/10
H01J-049/02
출원번호
US-0582658
(2011-02-04)
등록번호
US-8872109
(2014-10-28)
우선권정보
JP-P2010-049161 (2010-03-05)
국제출원번호
PCT/JP2011/052407
(2011-02-04)
§371/§102 date
20120904
(20120904)
국제공개번호
WO2011/108336
(2011-09-09)
발명자
/ 주소
Ohkubo, Masataka
Suzuki, Kouji
출원인 / 주소
National Institute of Advanced Industrial Science and Technology
대리인 / 주소
Birch, Stewart, Kolasch & Birch, LLP
인용정보
피인용 횟수 :
2인용 특허 :
12
초록▼
Detected ion charge states are discriminated in a mass spectrograph using a superconducting stripline detector (SSLD) as the detector thereof. A set of mass spectra of the singly charged or higher ions, the doubly charged or higher ions, the triply charged or higher ions (and successively higher ion
Detected ion charge states are discriminated in a mass spectrograph using a superconducting stripline detector (SSLD) as the detector thereof. A set of mass spectra of the singly charged or higher ions, the doubly charged or higher ions, the triply charged or higher ions (and successively higher ion charge states) are determined by measuring the mass spectra successively while decreasing the bias current flowing through the superconducting stripline detector. Then, the data of singly charged ions alone can be determined by subtracting the data of the doubly charged or higher ions from the data of the singly charged or higher ions. In a similar manner, the data of doubly charged ions alone, the data of triply charged ions alone (and similarly successively multiply charged ions) can also be determined.
대표청구항▼
1. A particle detector with a superconducting stripline detector that is impacted with multiple particles and counts the multiple particles in accordance with hot spots induced locally in a superconductor by an impact of the particles, wherein a detectable range of charge states is selectable,wherei
1. A particle detector with a superconducting stripline detector that is impacted with multiple particles and counts the multiple particles in accordance with hot spots induced locally in a superconductor by an impact of the particles, wherein a detectable range of charge states is selectable,wherein the superconducting stripline detector includes a superconducting stripline that is adapted to allow passage of a bias current that is lower than a superconducting critical current of the superconducting stripline,wherein the critical current is a current at or above which a resistance appears, andwherein the bias current selects a detectable particle kinetic energy range by changing the bias current. 2. The particle detector according to claim 1, wherein the superconducting stripline is arranged in series or in parallel within a sensitive area of a detecting element, and the superconducting stripline is adapted to transition from a superconducting state to a normal state by the impact of the particles, thus causing the resistance,thereby causing each the superconducting stripline to be sensitive to the impact of individual ones of the particles. 3. The particle detector according to claim 1, wherein the superconducting stripline is made of a single metal element, a nitride, an oxide, a boride, or other compounds. 4. The particle detector according to claim 3, wherein the superconducting stripline is made of the boride. 5. The particle detector according to claim 1, wherein the superconducting stripline is made of a thin film deposited on a substrate and processed into striplines. 6. The particle detector according to claim 1, wherein the superconducting stripline detector is adapted to detect and select individual ones of the particles from among a group of the multiple particles, in which some of the particles are in a single charged state and others of the particles are in a double charged state, and the superconducting stripline detector is further adapted to detect and select the individual ones of the particles from among the group of the multiple particles, in which still others of the particles are in a triple charged state, and additional ones of the particles are in more multiple charged states. 7. A particle detector with a superconducting stripline detector that is impacted with multiple particles and counts the multiple particles in accordance with hot spots induced locally in a superconductor by an impact of the particles, wherein a detectable range of charge states is selectable,wherein the superconducting stripline detector includes a superconducting stripline that is adapted to allow passage of a bias current that is lower than a superconducting critical current of the superconducting stripline,wherein the critical current is a current at or above which a resistance appears, andwherein the bias current selects a detectable particle kinetic energy range by changing the bias current,wherein the superconducting stripline consists of a single stripline arranged on a flat plane of the detector. 8. The particle detector according to claim 7, wherein the superconducting stripline arranged on the flat plane of the detector has a shape of a rectangle, and the stripline has opposite ends arranged at a mid-section of two opposite sides of the rectangle. 9. The particle detector according to claim 7, wherein the superconducting stripline arranged on the flat plane of the detector has a shape of a square, and the stripline has opposite ends arranged at a mid-section of two opposite sides of the square. 10. The particle detector according to claim 7, wherein the superconducting stripline is made of a boride. 11. The particle detector according to claim 7, wherein the superconducting stripline detector is adapted to detect and select individual ones of the particles from among a group of the multiple particles, in which some of the particles are in a single charged state and others of the particles are in a double charged state.
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이 특허에 인용된 특허 (12)
Irwin Kent D. (Boulder CO) Cabrera Blas (Stanford CA), Application of electrothermal feedback for high resolution cryogenic particle detection using a transition edge sensor.
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