Methods and apparatus for package on package devices with reversed stud bump through via interconnections
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
H01L-023/02
H01L-023/48
출원번호
US-0444674
(2012-04-11)
등록번호
US-8922005
(2014-12-30)
발명자
/ 주소
Hu, Yen-Chang
Hsiao, Ching-Wen
Chen, Chih-Hua
Chen, Chen-Shien
Kuo, Tin-Hao
출원인 / 주소
Taiwan Semiconductor Manufacturing Company, Ltd.
대리인 / 주소
Slater & Matsil, L.L.P.
인용정보
피인용 횟수 :
22인용 특허 :
8
초록▼
Methods and apparatus for package on package structures having stud bump through via interconnections. A structure includes an interconnect layer having a plurality of through via assemblies each including at least one stud bump are formed on conductive pads; and encapsulant surrounding the through
Methods and apparatus for package on package structures having stud bump through via interconnections. A structure includes an interconnect layer having a plurality of through via assemblies each including at least one stud bump are formed on conductive pads; and encapsulant surrounding the through via assembly, a first redistribution layer formed over a surface of the encapsulant and coupled to the through via assemblies and carrying connectors, and a second redistribution layer over interconnect layer at the other end of the through via assemblies, the through via assemblies extending vertically through the interconnect layer. In an embodiment the interconnect layer is mounted using the connectors to a lower package substrate to form a package on package structure. A first integrated circuit device may be mounted on the second redistribution layer of the interconnect layer. Methods for forming the interconnect layer and the package on package structures are disclosed.
대표청구항▼
1. A package comprising: a top integrated circuit coupled to a first redistribution layer (RDL);a bottom integrated circuit coupled to a second RDL;a pad extending from a surface of the first RDL and extending toward the second RDL, a surface of the bottom integrated circuit being coplanar with a su
1. A package comprising: a top integrated circuit coupled to a first redistribution layer (RDL);a bottom integrated circuit coupled to a second RDL;a pad extending from a surface of the first RDL and extending toward the second RDL, a surface of the bottom integrated circuit being coplanar with a surface of the pad;a reversed stud bump stack extending between the pad and the second RDL, the reversed stud bump stack comprising a plurality of individual stud bumps stacked one atop another, each of the plurality of individual stud bumps having a base region of a first width and a tail region of a second width, the first width being larger than the second width, the base region of each of the plurality of individual stud bumps being oriented to a first direction, wherein the first direction is towards either the first RDL or the second RDL; anda molding compound surrounding and in contact with the reversed stud bump from a top of the reversed stud bump stack to a bottom of the reversed stud bump stack. 2. The package of claim 1 wherein the package is configured to be mounted to a circuit board and wherein the bottom integrated circuit is configured to be interjacent the circuit board and the top integrated circuit. 3. The package of claim 2 wherein the base region is oriented toward the top integrated circuit and the tail region is oriented away from the top integrated circuit. 4. The package of claim 3 wherein the second width is from about 0.5× to less than 1× the first width. 5. The package of claim 3 wherein the second width is about 0.5× the first width. 6. The package of claim 1, wherein the reversed stud bump stack electrically connects the top integrated circuit to the bottom integrated circuit. 7. The package of claim 1, wherein the bottom integrated circuit is interposed between the first RDL and the second RDL. 8. The package of claim 1, wherein the reversed stud bump stack comprises a first tail region, a surface of the first tail region being coplanar with a lower surface of the molding compound. 9. A package on package (POP) device configured to be mounted to a substrate, the POP device having a nominal top and a nominal bottom, wherein the nominal top is distant from the substrate when the POP device is mounted to the substrate and the nominal bottom is proximate the substrate when the POP device is mounted to the substrate, the POP device comprising: a first integrated circuit adjacent the nominal top;a second integrated circuit adjacent the nominal bottom;a molding compound adjacent to the second integrated circuit, an upper surface of the molding compound being coplanar with an upper surface of the second integrated circuit;a first redistribution layer (RDL) extending over the upper surface of the second integrated circuit and the upper surface of the molding compound; anda reversed stud bump assembly electrically connecting the first and second integrated circuits, wherein the reversed stub bump assembly is located outside of the first integrated circuit and the second integrated circuit, the reversed stud bump assembly comprising a plurality of reversed stub bumps, each of the reversed stud bumps having a base region with a first width and a tail region with a second width smaller than the first width, the tail region extending from the base region toward the nominal bottom, a lowermost surface of a lowermost reversed stud bump being coplanar with a lower surface of the molding compound. 10. The POP device of claim 9 further comprising a second redistribution layer to which the second integrated circuit is electrically coupled, and wherein the reversed stud bump extends from the first redistribution layer to the second redistribution layer. 11. The POP device of claim 9, wherein the lowermost surface of the lowermost reversed stud bump comprises the tail region of a first reversed stud bump. 12. A package comprising, a first substrate;a second substrate;a molding compound interposed between the first substrate and the second substrate; anda plurality of electrical connections directly connecting the first substrate to the second substrate, each of the electrical connections comprising a first stud bump and a second stud bump, the first stud bump having a first base region wider than a first tail region, the second stud bump having a second base region wider than a second tail region, the first tail region being directly connected to the second base region, wherein a surface of the second tail region and a surface of the molding compound are coplanar. 13. The package of claim 12, further comprising a first integrated circuit electrically coupled to the first substrate and a second integrated circuit electrically coupled to the second substrate. 14. The package of claim 13, wherein the second integrated circuit is interposed between the first substrate and the second substrate. 15. The package of claim 12, wherein the first tail region has a width about 0.5× to less than 1× a width of the first base region. 16. The package of claim 12, further comprising a third substrate coupled directly to the second substrate. 17. The package of claim 12, wherein the first substrate comprises a first redistribution layer, wherein the second substrate comprises a second redistribution layer, and wherein the reversed stud bump stack electrically connects the first redistribution layer and the second redistribution layer. 18. The package of claim 12, further comprising a first integrated circuit interposed between the first substrate and the second substrate.
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