초록 ▼

An automatic cutting device is described for cutting an assembly. The assembly includes a material having a weakened zone therein that defines a useful layer and being attached to a source substrate. The cutting device includes a cutting mechanism and a holding and positioning mechanism operatively

An automatic cutting device is described for cutting an assembly. The assembly includes a material having a weakened zone therein that defines a useful layer and being attached to a source substrate. The cutting device includes a cutting mechanism and a holding and positioning mechanism operatively associated with the cutting mechanism. The holding and positioning mechanism positions the material so that the cutting mechanism detaches the layer from the source substrate along the weakened zone. The cutting device also includes a control mechanism for adjusting at least two different portions of the assembly during detachment of the layer to facilitate a more precise detachment.

대표청구항 ▼

1. A method for automatically separating an assembly along a weakened zone therein, which method comprises: holding and positioning the assembly with at least two grippers, andcompletely separating the assembly by cutting the weakened zone partially but not fully along a cutting plane in combination

1. A method for automatically separating an assembly along a weakened zone therein, which method comprises: holding and positioning the assembly with at least two grippers, andcompletely separating the assembly by cutting the weakened zone partially but not fully along a cutting plane in combination with inducing strain in the weakened zone by moving at least one of the grippers relative to the other;wherein the movement of the grippers is controlled in conjunction with the cutting of the assembly to separate the assembly by propagation of a detachment front from the partially cut weakened zone through uncut portions of the weakened zone. 2. The method of claim 1, wherein the assembly includes a source substrate bonded to a support substrate, with the source substrate having the weakened zone therein that defines a useful layer, and the separating detaches and transfers the useful layer from the source substrate to the support substrate. 3. The method of claim 2, wherein the separating is achieved by controlling the movement of the at least one gripper in both the parallel and perpendicular directions relative to the cutting plane during detachment of the useful layer. 4. The method of claim 1, wherein the partial cutting comprises contacting the assembly with one or more blades. 5. The method of claim 1, wherein the partial cutting is achieved by applying a pressurized fluid jet to the assembly along the cutting plane. 6. The method of claim 1, wherein the at least two grippers are moved relative to each other in a direction parallel to that of the cutting plane to induce the strain in the assembly to separate the assembly. 7. The method of claim 6, wherein each gripper comprises a suction cup for holding a surface of the respective source or support substrate of the assembly and the grippers are also moved in a direction perpendicular to and away from the weakened zone. 8. The method of claim 1, which further comprises controlling and coordinating the holding and positioning in a control loop. 9. The method of claim 1, wherein the partial cutting of and the inducing strain in the weakened zone occur at the same time. 10. The method of claim 1, wherein the assembly comprises semiconductor material. 11. A method for automatically separating an assembly along a weakened zone therein, wherein the assembly includes a source substrate bonded to a support substrate, with the source substrate having the weakened zone therein that defines a useful layer, which method comprises: holding and positioning the assembly with at least two grippers, andcompletely separating the assembly by cutting the weakened zone partially but not fully along a cutting plane in combination with inducing strain in the weakened zone by moving at least one of the grippers relative to the other to separate, detach and transfer the useful layer from the source substrate to the support substrate;wherein the movement of the grippers is controlled in conjunction with the cutting of the assembly to separate the assembly by propagation of a detachment front from the partially cut weakened zone through uncut portions of the weakened zone. 12. The method of claim 11, wherein one gripper contacts a surface of the support substrate and the other gripper contacts a surface of the source substrate, and at least one gripper is moved relative to the other in directions parallel to and perpendicular to the cutting plane to induce strain in the assembly to facilitate separating of the assembly. 13. The method of claim 12, wherein both grippers are moved relative to the other in directions parallel to and perpendicular to the cutting plane. 14. The method of claim 12, which further comprises controlling the holding and positioning of the assembly to separate the useful layer by controlling the partial cutting to engage only a peripheral portion of the weakened zone of the assembly and controlling the movement of the at least one gripper to induce the strain in the assembly. 15. The method of claim 14, wherein the partial cutting is achieved by applying a pressurized fluid jet to the assembly along the cutting plane. 16. The method of claim 11, wherein the partial cutting of and the inducing strain in the weakened zone occur at the same time. 17. The method of claim 11, wherein the substrates comprise semiconductor material. 18. A method for automatically separating an assembly along a weakened zone therein, wherein the assembly includes a source substrate bonded to a support substrate, with the source substrate having the weakened zone therein that defines a useful layer, which method comprises: holding and positioning the assembly with at least two grippers; andcompletely separating the assembly by cutting the weakened zone partially but not fully along a cutting plane in combination with inducing strain in the weakened zone by moving at least one of the grippers relative to the other to separate, detach and transfer the useful layer from the source substrate to the support substrate;wherein the movement of the grippers is controlled in conjunction with the cutting of the assembly to separate the assembly by propagation of a detachment front from the partially cut weakened zone through uncut portions of the weakened zone, andwherein the partial cutting is achieved by a cutting mechanism that comprises more than one blade that contacts the weakened zone of the assembly. 19. The method of claim 18, wherein the substrates comprise semiconductor material.