Automatic measurement of dimensional data with a laser tracker
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G01B-011/14
G01B-011/00
G01B-021/04
G01C-015/00
G01S-007/48
G01S-007/481
G01S-007/497
G01S-017/42
G01S-017/66
G01S-017/89
출원번호
US-0199211
(2014-03-06)
등록번호
US-9007601
(2015-04-14)
발명자
/ 주소
Steffey, Kenneth
Steffensen, Nils P.
Bridges, Robert E.
출원인 / 주소
FARO Technologies, Inc.
대리인 / 주소
Cantor Colburn LLP
인용정보
피인용 횟수 :
3인용 특허 :
235
초록▼
Measuring with a system having retroreflector targets and a laser tracker includes storing a list of coordinates for three targets and at least one added point; capturing on a photosensitive array a portion of the light emitted by a light beam and reflected off the targets; obtaining spot positions
Measuring with a system having retroreflector targets and a laser tracker includes storing a list of coordinates for three targets and at least one added point; capturing on a photosensitive array a portion of the light emitted by a light beam and reflected off the targets; obtaining spot positions on a photosensitive array of a tracker camera from the reflected light; determining a correspondence between three spot positions on the photosensitive array and the coordinates of the targets; directing a beam of light from the tracker to the targets based at least in part on the coordinates of the first target and the first spot position; measuring 3-D coordinates of the targets with the tracker; determining 3-D coordinates of the at least one added point based at least in part on the measured 3-D coordinates of the targets and the coordinates of the at least one added point.
대표청구항▼
1. A method for measuring with a system, the method comprising steps of: providing the system including a collection of retroreflector targets and a laser tracker, the collection of retroreflector targets including at least two retroreflector targets configured to be placed on an object, the at leas
1. A method for measuring with a system, the method comprising steps of: providing the system including a collection of retroreflector targets and a laser tracker, the collection of retroreflector targets including at least two retroreflector targets configured to be placed on an object, the at least two retroreflector targets including a first target, and a second target, the laser tracker in a first frame of reference fixed with respect to a laser tracker surroundings, the laser tracker having a first inclinometer, a structure, a first light source, an absolute distance meter, a first angular transducer, a second angular transducer, a tracking system, a first camera, a second light source, a processor, and a memory, the memory operably coupled to the processor, the first inclinometer configured to measure a first angle of tilt and a second angle of tilt of the first frame of reference with respect to a gravity vector, the structure rotatable about a first axis and a second axis, the first light source producing a first light beam that cooperates with the absolute distance meter, the first angular transducer measuring a first angle of rotation about the first axis, the second angular transducer measuring a second angle of rotation about the second axis, the tracking system configured to move the first light beam to a center of any retroreflector target from among the collection of retroreflector targets, the first camera including a first lens system and a first photosensitive array, the second light source providing a second light beam, and the processor configured to operate the laser tracker;storing, with the processor into the memory, a list of nominal coordinates for the first target, the second target, and at least one additional point, a nominal coordinates being three-dimensional coordinates in a second frame of reference;measuring with a second inclinometer a third angle of tilt and a fourth angle of tilt of the second frame of reference with respect to the gravity vector;capturing on the first photosensitive array a portion of the second light beam reflected off the first target and the second target;determining by the processor a first spot position and a second spot position on the first photosensitive array from the portion of the second light beam reflected off the first target and the second target;determining by the processor a correspondence between the first spot position and the second spot position, and the stored nominal coordinates of the first target and the second target, respectively;directing by the processor the first light beam to the first target based at least in part on the stored nominal coordinates of the first target, the first spot position, the first angle of tilt, the second angle of tilt, the third angle of tilt, and the fourth angle of tilt;measuring three-dimensional coordinates of the first target using the absolute distance meter, the first angular transducer, and the second angular transducer;directing by the processor the first light beam to the second target based at least in part on the stored nominal coordinates of the second target, the second spot position, the first angle of tilt, the second angle of tilt, the third angle of tilt, and the fourth angle of tilt;measuring three-dimensional coordinates of the second target using the absolute distance meter, the first angular transducer, and the second angular transducer;directing by the processor the first light beam to a plurality of additional points, the plurality of additional points including the at least one additional point, the plurality of additional points indicative of actions to be taken by an operator;determining by the processor three-dimensional coordinates of the at least one additional point in the first frame of reference based at least in part on the measured three-dimensional coordinates of the first target, the measured three-dimensional coordinates of the second target, the stored nominal coordinates of the at least one additional point, the first angle of tilt, the second angle of tilt, the third angle of tilt, and the fourth angle of tilt; andstoring, with the processor into the memory, the determined three-dimensional coordinates of the at least one additional point. 2. The method of claim 1, further including steps of: acting by the operator in response to the first light beam being directed to the at least one additional point by placing a selected retroreflector target to intercept at least a portion of the first light beam, the selected retroreflector target selected from among any of the retroreflector targets in the collection of retroreflector targets;directing by the processor the first light beam to a center of the selected retroreflector target; andmeasuring three-dimensional coordinates of the selected retroreflector target using the absolute distance meter, the first angular transducer, and the second angular transducer. 3. The method of claim 2, wherein the step of placing the selected retroreflector target to intercept at least a portion of the first light beam includes one step selected from the group consisting of: moving the selected retroreflector target to intercept at least a portion of the first light beam; andplacing the selected retroreflector target in a fixed nest positioned to intercept at least a portion of the first light beam. 4. The method of claim 2, further including a step of measuring according to an inspection plan. 5. The method of claim 4, wherein the step of measuring according to the inspection plan further includes a step of measuring automatically without an operator intervention. 6. The method of claim 4, wherein the step of measuring according to the inspection plan further includes a step of moving the first light beam to direct the operator to move the selected retroreflector target to measure according to the inspection plan. 7. The method of claim 4, wherein the step of measuring according to the inspection plan further includes detecting when the operator has placed the selected retroreflector target in a wrong location and directing the operator to move the selected retroreflector target to a correct location, the laser tracker moving the first light beam to indicate to the operator the correct location of the selected retroreflector target. 8. The method of claim 4, wherein the step of measuring according to the inspection plan includes steps of: obtaining nominal coordinates of a target point, the nominal coordinates derived from data provided in a computer aided design (CAD), the CAD data transformed into the first frame of reference;providing the selected retroreflector target as a spherically mounted retroreflector, the spherically mounted retroreflector having a cube-corner retroreflector embedded within a spherical surface, the spherical surface having a first radius;placing the selected retroreflector target at the position of the target point, the retroreflector target either held against the target point or placed on a magnetic nest representing the target point;measuring three-dimensional coordinates of the selected retroreflector target using the absolute distance meter, the first angular transducer, and the second angular transducer;calculating three-dimensional coordinates of the measured target point based at least in part on the measured three-dimensional coordinates of the selected retroreflector target and on the first radius;calculating a first difference in three-dimensional coordinates of the measured target point and the nominal coordinates of the target point; andproviding an indication of a first difference. 9. The method of claim 8, wherein the step of providing an indication of the first difference includes providing a warning if the first difference exceeds a first allowable difference. 10. The method of claim 4, wherein the step of measuring according to the inspection plan includes steps of performing a two-face test to obtain a two-face error and providing a warning if the two face error exceeds a maximum allowable two-face error value. 11. The method of claim 4, wherein the step of measuring according to the inspection plan includes steps of measuring three-dimensional coordinates of two target points and providing a warning if relative positions of the two target points exceed a maximum allowable target change value. 12. The method of claim 2, further including steps of: providing an inspection plan having inspection points to be measured by the laser tracker;affixing at least one retroreflector target to the object under test;providing a maximum allowable movement of at least one of the at least two retroreflector targets affixed to the object under test;measuring three-dimensional coordinates of at least one of the at least two retroreflector targets affixed to the object under test, the measuring performed at a first time and at a second time;determining a first change in the three-dimensional coordinates of at least one of the at least two retroreflector targets from the first time to the second time; andtaking an action when the first change exceeds the maximum allowable movement, the action being one of:measuring at least three retroreflector targets from the collection of retroreflector targets on the object under test to re-establish three-dimensional coordinates of the inspection points, andnotifying the operator that the first change has exceeded the maximum allowable movement. 13. The method of claim 1, further including steps of: moving by the processor the first light beam in a first pattern in space, the first pattern proximate to the at least one additional point;detecting by the tracking system a reflection of the first light beam by a selected retroreflector target, the selected retroreflector target selected from among any of the retroreflector targets in the collection of retroreflector targets;directing by the processor the first light beam to a center of the selected retroreflector target; andmeasuring three-dimensional coordinates of the selected retroreflector target using the absolute distance meter, the first angular transducer, and the second angular transducer. 14. The method of claim 1, further including the steps of: providing the laser tracker with a second camera and a third light source, the second camera including a second lens system and a second photosensitive array, the second camera having a second field of view smaller than a first field of view of the first camera, the third light source providing a third light beam;capturing on the second photosensitive array a portion of the third light beam reflected off the first target, and the second target;determining by the processor a third spot position and a fourth spot position on the second photosensitive array from the third light beam reflected off the first target and the second target; anddetermining by the processor a correspondence between the third spot position and the fourth spot position, and the stored nominal coordinates of the first target and the second target, respectively. 15. The method of claim 1, wherein the step of capturing on the first photosensitive array a portion of the second light beam reflected off the first target and the second target further includes one step selected from the group consisting of: positioning the laser tracker on a stand so that the first photosensitive array simultaneously obtains the first spot position and the second spot position;rotating the first camera and the second light source about the first axis to a plurality of orientations so that the first photosensitive array obtains the first spot position at a first of the plurality of orientations and the second spot position at a second of the plurality of orientations; andmoving a selected retroreflector target from among the collection of retroreflector targets to delimit a region of space that contains the first target, and the second target, the region of space determined by the laser tracker either by tracking the selected retroreflector target by the tracking system or by tracking movement of the selected retroreflector target on the first photosensitive array. 16. The method of claim 1, wherein the step of providing the system further includes providing the tracker with a third camera and a fourth light source, the third camera including a third lens system and a third photosensitive array, the fourth light source providing a fourth light beam, the processor further configured to calculate three-dimensional coordinates of any retroreflector targets from among the collection of retroreflector targets, the calculated three-dimensional coordinates based at least in part on first images on the first photosensitive array and on third images on the third photosensitive array, the first images and the third images obtained in response to the second light beam and the fourth light beam reflected by the any retroreflector targets. 17. The method of claim 1, wherein the step of determining by the processor a correspondence between the first spot position and the second spot position and the stored nominal coordinates of the first target and the second target, includes one step selected from the group consisting of: determining the correspondence based at least in part on a range of allowable relative orientations between the first frame of reference and the second frame of reference and on the nominal coordinates of the first target, and the second target;collecting, at a first time, a first set of images from the first photosensitive array in response to illumination of the first target and the second target by the second light beam; changing one of the first angle of rotation and the second angle of rotation and collecting, at a second time, a second set of images from the first photosensitive array in response to illumination of the first target and the second target by the second light beam; and determining the correspondence among the first spot position and the second spot position and the nominal coordinates of the first target, and the second target, the determining based at least in part on the first set of images and the second set of images; andcollecting, at a third time, a third set of images from the first photosensitive array in response to illumination of the first target and the second target by the second light beam; changing the position of the second frame of reference relative to the first frame of reference and collecting, at a fourth time, a fourth set of images from the first photosensitive array in response to illumination of the first target and the second target by the second light beam; and determining the correspondence among the first spot position, the second spot position and the nominal coordinates of the first target, and the second target, the determining based at least in part on the third set of images and the fourth set of images. 18. The method of claim 1, wherein the step of storing the list of nominal coordinates for the first target, the second target, and the at least one additional point, further includes one step selected from the group consisting of: extracting the nominal coordinates from a computer aided design (CAD) model; andmeasuring the nominal coordinates with a 3D measurement instrument. 19. The method of claim 1, further comprising an action taken by the operator selected from the group consisting of: picking up a selected retroreflector target, designated by the plurality of additional points;moving the selected retroreflector target in a direction indicated by the plurality of additional points, capturing the first light beam with the selected retroreflector target, and measuring three dimensional coordinates of the at least one additional point using the absolute distance meter, the first angular transducer, and the second angular transducer;observing a pattern formed by the plurality of additional points, capturing the first light beam with the selected retroreflector target, and measuring three-dimensional points along the pattern; andobserving a pattern formed by the plurality of additional points, interpreting the points as a gestural command, and taking action as indicated by the gestural command. 20. The method of claim 1, wherein the step of determining three-dimensional coordinates of the at least one additional point further includes steps of: calculating a transformation matrix to transform arbitrary three-dimensional coordinates in the second frame of reference to arbitrary three-dimensional coordinates in the first frame of reference, the calculating based at least in part on the nominal coordinates of the first target, and the second target; andcalculating three-dimensional coordinates of the at least one additional point based at least in part on the transformation matrix and the nominal coordinates of the at least one additional point. 21. The method of claim 1, wherein the step of providing the system includes providing at least one of the retroreflector targets from among the collection of retroreflector targets with a cube-corner retroreflector, the cube-corner retroreflector having three reflecting surfaces that are mutually perpendicular. 22. The method of claim 1, wherein the step of providing the system includes providing at least one of the retroreflector targets from among the collection of retroreflector targets as a spherically mounted retroreflector, the spherically mounted retroreflector having a cube-corner retroreflector embedded within a spherical surface. 23. The method of claim 1, wherein the step of providing the system includes providing at least one retroreflector target from among the collection of retroreflector targets as a reflective point centered within a spherical surface. 24. The method of claim 1, further including steps of: directing the first light beam to the at least one additional point; andperforming an assembly operation at a position of the first light beam. 25. The method of claim 24, wherein the step of performing the assembly operation includes drilling a hole in the object at the position of the first light beam. 26. The method of claim 1, further including steps of: providing a maximum allowable discrepancy;providing a coefficient of thermal expansion for the object under test;providing a reference temperature;placing a first reference retroreflector and a second reference retroreflector on the object under test, there being a first distance between the first reference retroreflector and the second reference retroreflector at the reference temperature;measuring a temperature of the object under test;calculating a first temperature difference by subtracting the reference temperature from the measured temperature of the object under test;calculating a scale factor by multiplying the first temperature difference by the coefficient of thermal expansion;measuring three-dimensional coordinates of the first reference retroreflector using the absolute distance meter, the first angular transducer, and the second angular transducer;measuring three-dimensional coordinates of the second reference retroreflector using the absolute distance meter, the first angular transducer, and the second angular transducer;calculating a second distance extending from the measured three-dimensional coordinates of the first reference retroreflector to the measured three-dimensional coordinates of the second reference retroreflector;calculating a third distance by subtracting the first distance from the second distance;calculating a fourth distance by multiplying the scale factor by the first distance;calculating a discrepancy value by subtracting the third distance from the fourth distance; andtaking an action when the discrepancy value exceeds the maximum allowable discrepancy, the action being either issuing an alarm or measuring three-dimensional coordinates of at least some retroreflector targets from among the collection of retroreflector targets and, re-establishing a frame of reference for the object under test.
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이 특허에 인용된 특허 (235)
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