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A semiconductor package may include a circuit board chip having a through-hole, a semiconductor device mounted on the circuit board chip, and an encapsulant. The encapsulant encapsulates the semiconductor device, fills the through-hole and has an external pattern that is the complement of a mold wit

A semiconductor package may include a circuit board chip having a through-hole, a semiconductor device mounted on the circuit board chip, and an encapsulant. The encapsulant encapsulates the semiconductor device, fills the through-hole and has an external pattern that is the complement of a mold within which the encapsulant was formed. The external pattern on one side of the package reflects a mold shape that retards the flow of encapsulant material relative to the flow of encapsulant material on the opposite side of the package.

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1. A semiconductor package molding die comprising: a mounting surface configured for receiving a plurality of circuit board chips, each having a through-hole; anda plurality of window patterns, each aligned with the through-hole of a circuit board chip, each window pattern extending in a first direc

1. A semiconductor package molding die comprising: a mounting surface configured for receiving a plurality of circuit board chips, each having a through-hole; anda plurality of window patterns, each aligned with the through-hole of a circuit board chip, each window pattern extending in a first direction under a corresponding one of the circuit board chips,wherein each of the window patterns comprises a first passage pattern having a first width and a second passage pattern having a second width different from the first width, wherein the second width is greater than the first width and the second passage pattern is deeper than the first passage pattern. 2. The molding die of claim 1, further configured for receiving an encapsulant which fills the through-hole and the window patterns. 3. The molding die of claim 1, wherein the first passage pattern and the second passage pattern are connected alternately in the first direction. 4. The molding die of claim 1, wherein the second passage pattern is longer than the first passage pattern. 5. The molding die of claim 4, wherein the first passage pattern is disposed adjacent to an end of each of the circuit board chips, and the second passage pattern is disposed adjacent to the through-hole of each of the circuit board chips. 6. The molding die of claim 1, wherein each of the window patterns further comprises a third passage pattern having a third width greater than the second width, wherein the third passage pattern is disposed adjacent to an end of each of the circuit board chips, the second passage pattern is disposed adjacent to the through-hole, and the first passage pattern is disposed between the second passage pattern and the third passage pattern. 7. A semiconductor package comprising: a circuit board chip having a through-hole;a semiconductor device mounted on the circuit board chip; andan encapsulant,wherein the encapsulant encapsulates the semiconductor device, fills the through-hole, extends in a bottom surface of the circuit board chip in a first direction, and comprises a first bottom surface pattern having a first width and a second bottom surface pattern having a second width different from the first width, wherein the second width is greater than the first width and the second bottom surface pattern is thicker than the first bottom surface pattern. 8. The semiconductor package of claim 7, wherein the first bottom surface pattern and the second bottom surface pattern are connected alternately in the first direction. 9. The semiconductor package of claim 7, wherein the second bottom surface pattern is longer than the first bottom surface pattern. 10. The semiconductor package of claim 9, wherein the first bottom surface pattern is disposed adjacent to an end of the circuit board chip, and the second bottom surface pattern is disposed adjacent to the through-hole. 11. The semiconductor package of claim 7, wherein the encapsulant further comprises a third bottom surface pattern having a third width greater than the second width, wherein the third bottom surface pattern is disposed adjacent to both ends of the circuit board chip, the second bottom surface pattern is disposed adjacent to the through-hole, and the first bottom surface pattern is disposed between the second bottom surface pattern and the third bottom surface pattern. 12. A semiconductor package, comprising: a circuit board chip having a through-hole;a semiconductor device mounted on the circuit board chip; andan encapsulant, wherein the encapsulant encapsulates the semiconductor device, fills the through-hole and has an external pattern that is the complement of a mold within which the encapsulant was formed, the external pattern on one side of the package reflecting a mold shape that retards the flow of encapsulant material relative to the flow of encapsulant material on the opposite side of the package, wherein the external pattern on one side includes segments having different thicknesses. 13. The semiconductor package of claim 12, wherein the external pattern on one side includes segments having different widths. 14. The semiconductor package of claim 12, wherein the external pattern on one side includes a thicker segment aligned with the through-hole. 15. The semiconductor package of claim 12, wherein the external pattern on one side includes a wider segment aligned with the through-hole.