A signaling system is described. The signaling system comprises a transmit device, a receive device including a partial response receive circuit, and a signaling path coupling the transmit device and the receive device. The receive device observes an equalized signal from the signaling path, and inc
A signaling system is described. The signaling system comprises a transmit device, a receive device including a partial response receive circuit, and a signaling path coupling the transmit device and the receive device. The receive device observes an equalized signal from the signaling path, and includes circuitry to use feedback from the most recent previously resolved symbol to sample a currently incoming symbol. The transmit device equalizes transmit data to transmit the equalized signal, by applying weighting based on one or more data values not associated with the most recent previously resolved symbol value.
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1. An integrated circuit comprising: first and second partial response receivers coupled to respective signal line inputs to receive a respective data signal;a circuit operable to select a threshold level;wherein the first and second partial response receivers are each coupled to the circuit and are
1. An integrated circuit comprising: first and second partial response receivers coupled to respective signal line inputs to receive a respective data signal;a circuit operable to select a threshold level;wherein the first and second partial response receivers are each coupled to the circuit and are operable to apply the selected threshold level; andcircuitry to provide a reference clock, the integrated circuit operable to permit programmable clock source selection between the reference clock and a sampling clock signal, the first and second partial response circuits operable to sample the respective data signal in dependence on the clock source selection. 2. The integrated circuit of claim 1, wherein the respective data signals together represent a unified digital value, and respectively carry a least significant bit (LSB) and a most significant bit (MSB). 3. The integrated circuit of claim 2, wherein the integrated circuit further comprises a clock data recovery circuit coupled to one of the respective signal line inputs to receive the respective data signal and operable to generate in dependence thereon a sampling clock signal, and wherein each of the first and second partial response circuits is operable to sample the respective data signal in dependence on the sampling clock signal. 4. The integrated circuit of claim 1, where the integrated circuit is adapted to receive the reference clock from an external source. 5. The integrated circuit of claim 1, wherein each respective data signal comprises a distinct serial transmission, and wherein each of the first and second partial response circuits is to sample the respective, distinct serial transmission in response to a respective clock signal. 6. The integrated circuit of claim 1, wherein: each respective data signal comprises a distinct serial transmission;the integrated circuit further comprises a clock recovery circuit for each of the first and second partial response circuits, each clock recovery circuit coupled to a respective one of the signal line inputs so as to receive the respective distinct serial transmission and generate therefrom a respective sampling clock; andeach of the first and second partial response circuits is to sample the respective data signal in response to the respective sampling clock. 7. The integrated circuit of claim 1, wherein each of the signal line inputs is adapted for bidirectional data transmission. 8. The integrated circuit of claim 1, wherein each of the signal line inputs is adapted for unidirectional data transmission only. 9. The integrated circuit of claim 1, wherein the circuit is operable to adaptively select the threshold level. 10. The integrated circuit of claim 9, wherein the circuit is operable to enter a mode in which the circuit is operable to perform a calibration operation to select the threshold level. 11. The integrated circuit of claim 10, wherein the integrated circuit further comprises a pattern register operable to store a predefined calibration pattern, and the circuit is adapted to select the threshold level in dependence upon comparison of the predefined calibration pattern and sampled data signal values. 12. The integrated circuit of claim 10, wherein the threshold level is selectable from plural choices, and wherein the circuit is operable to perform the calibration operation whilst sweeping the selected threshold level through the plural choices. 13. The integrated circuit of claim 1 wherein the first and second partial response receivers include respective first and second offset threshold comparator circuits. 14. An integrated circuit adapted to receive signals via first and second signal line inputs, the integrated circuit comprising: a first receiver having a first comparator operable to compare a current symbol received via the first signal line input with a first threshold,a second comparator operable to compare the current symbol received via the first signal line input with a second threshold, anda first select circuit operable to receive a result of comparison from each of the first and second comparators and to select one of the results of comparison from the first and second comparators to be output as a first receiver sample according to a previously received symbol;a second receiver having a third comparator operable to compare a current symbol received via the second signal line input with the first threshold,a fourth comparator operable to compare the current symbol received via the second signal line input with the second threshold, anda second select circuit operable to receive a result of comparison from each of the third and fourth comparators and to select one of the results of comparison from the third and fourth comparators to be output as a second receiver sample according to a previously received symbol;circuitry operable to select the first threshold and distribute the first threshold to each of the first and third comparators; andcircuitry operable to select the second threshold and distribute the second threshold to each of the second and fourth comparators. 15. The integrated circuit of claim 14, wherein the integrated circuit is operable to enter a mode in which the integrated circuit is operable to perform a calibration operation to select the first threshold and the second threshold. 16. The integrated circuit of claim 14, further comprising a clock data recovery circuit operable to generate a sampling clock from one of the signal line inputs, and to distribute the sampling clock to each of the first, second, third and fourth comparators. 17. The integrated circuit of claim 14, further comprising: a first clock data recovery circuit operable to generate a first sampling clock from the first signal line input and to distribute the first sampling clock to the first and second comparators; anda second clock data recovery circuit operable to generate a second sampling clock from the second signal line input and to distribute the second sampling clock to the third and fourth comparators. 18. An integrated circuit comprising: first and second partial response receivers coupled to respective signal line inputs to receive a respective data signal; andmeans for adaptively selecting at least one threshold level, and for distributing the at least one threshold level to each of the first and second partial response receivers;wherein the first and second partial response receivers are each operable to sample the respective data signal in dependence on each distributed threshold level; andcircuitry to provide a reference clock, the integrated circuit operable to permit programmable clock source selection between the reference clock and a sampling clock signal, the first and second partial response receivers operable to sample the respective data signal in dependence on the clock source selection. 19. The integrated circuit of claim 18 wherein the first and second partial response receivers include respective first and second offset threshold comparator circuits.
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