SWIR targeted agile raman system for detection of unknown materials using dual polarization
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G01J-003/44
G01N-021/65
G01J-003/02
G01J-003/28
G01J-003/36
G01N-033/22
G01N-021/17
출원번호
US-0842034
(2013-03-15)
등록번호
US-9052290
(2015-06-09)
발명자
/ 주소
Treado, Patrick J.
Nelson, Matthew
Gardner, Charles
출원인 / 주소
ChemImage Corporation
대리인 / 주소
Pepper Hamilton LLP
인용정보
피인용 횟수 :
1인용 특허 :
60
초록▼
The present disclosure provides for a system and method for analyzing a sample comprising at least one unknown material. A first location may be scanned to generate a SWIR hyperspectral image. The SWIR hyperspectral image may be generated using dual polarization techniques. The SWIR hyperspectral im
The present disclosure provides for a system and method for analyzing a sample comprising at least one unknown material. A first location may be scanned to generate a SWIR hyperspectral image. The SWIR hyperspectral image may be generated using dual polarization techniques. The SWIR hyperspectral image may be analyzed to target a second location comprising the unknown material. This second location may be further analyzed using Raman spectroscopic techniques and a Raman data set may be generated. The Raman data set may be further analyzed to associate the unknown material with a know material.
대표청구항▼
1. A system comprising: a first subsystem comprising: a first collection optics configured to collect a first plurality of interacted photons having optical components in a plurality of polarization alignments from a first location comprising an unknown material;a polarization assembly configured to
1. A system comprising: a first subsystem comprising: a first collection optics configured to collect a first plurality of interacted photons having optical components in a plurality of polarization alignments from a first location comprising an unknown material;a polarization assembly configured to receive the first plurality of interacted photons and separate the first plurality of interacted photons into a first optical component with a first polarization alignment and a second optical component with a second polarization alignment;a first optical filter configured to receive at least a portion of the first optical component and generate a first filtered component having a first wavelength;a second optical filter configured to receive at least a portion of the second optical component and generate a second filtered component having a second wavelength; andat least one SWIR detector configured to detect one or more of the first filtered component and the second filtered component and generate at least one SWIR data set; anda second subsystem comprising: an illumination source configured to illuminate a second location comprising the unknown material and generate a second plurality of interacted photons,a second collection optics configured to collect the second plurality of interacted photons;a fiber array spectral translator device having a two-dimensional array of optical fibers drawn into a one-dimensional fiber stack, wherein the fiber array spectral translator device is configured to convert a two-dimensional field of view into a curvilinear field of view;a spectrometer comprising an entrance slit coupled to the one-dimensional end of the fiber stack to generate a plurality of spatially resolved Raman spectra; anda Raman detector coupled to the spectrometer to detect the spatially resolved Raman spectra and generate at least one Raman data set. 2. The system of claim 1, wherein at least one of the first collection optics and the second collection optics further comprises a telescope optic. 3. The system of claim 1, wherein at least one of the first optical filter and the second optical filter further comprises a tunable filter. 4. The system of claim 3, wherein the tunable filter is selected from the group consisting of a multi-conjugate liquid crystal tunable filter, an acousto-optical tunable filter, a Lyot liquid crystal tunable filter, an Evans split-element liquid crystal tunable filter, a Solc liquid crystal tunable filter, a ferroelectric liquid crystal tunable filter, and a Fabry Perot liquid crystal tunable filter. 5. The system of claim 1, wherein the at least one SWIR detector comprises a first SWIR detector configured to detect the first filtered component, and a second SWIR detector configured to detect the second filtered component. 6. The system of claim 1, wherein the at least one SWIR detector further comprises a focal plane array. 7. The system of claim 6, wherein the focal plane array further comprises one or more of an InGaAs detector, a CMOS detector, an InSb detector, an MCT detector, an ICCD detector, and a CCD detector. 8. The system of claim 1, wherein the Raman detector further comprises a focal plane array. 9. The system of claim 8, wherein the focal plane array further comprises one or more of an InGaAs detector, a CMOS detector, an InSb detector, an MCT detector, an ICCD detector, and a CCD detector. 10. The system of claim 1 further comprising at least one reference database comprising at least one reference data set associated with a known material. 11. The system of claim 1 further comprising a processor configured to analyze one or more of the at least one SWIR data set and the at least one Raman data set. 12. A method comprising: collecting a first plurality of interacted photons having optical components in a plurality of polarization alignments from a first location comprising an unknown material;separating the first plurality of interacted photons into a first optical component having a first polarization alignment and a second optical component having a second polarization alignment;passing at least a portion of the first optical component through a first optical filter configured to generate a first filtered component having a first wavelength;passing at least a portion of the second optical component through a second optical filter configured to generate a second filtered component having a second wavelength;detecting the first filtered component and the second filtered component to generate at least one SWIR data set;analyzing the at least one SWIR data set to target a second location comprising the unknown material;illuminating the second location to generate a second plurality of interacted photons;passing the second plurality of interacted photons through a fiber array spectral translator device to generate a plurality of spatially resolved Raman spectra;generating at least one Raman data set of the spatially resolved Raman spectra; andanalyzing the Raman data set to associate the unknown material with a known material. 13. The method of claim 12, wherein the first filtered component is detected by a first SWIR detector and the second filtered component is detected by a second SWIR detector. 14. The method of claim 12, wherein the first filtered component and the second filtered component are detected using one SWIR detector. 15. The method of claim 14, wherein the first filtered component and the second filtered component are overlaid. 16. The method of claim 14, wherein the first filtered component and the second filtered component are not overlaid. 17. The method of claim 12, wherein one or more of the at least one SWIR data set and the at least one Raman data set are analyzed by comparison with at least one reference data set, associated with a known material. 18. The method of claim 17, wherein the comparison is achieved by applying at least one chemometric technique. 19. The method of claim 12, wherein at least a portion of the first location and at least a portion of the second location overlap. 20. The method of claim 12, wherein the second location is located within the first location. 21. The method of claim 12, wherein the at least one SWIR data set further comprises one or more of a SWIR spectrum and a spatially accurate wavelength resolved SWIR image. 22. The method of claim 12, wherein the at least one SWIR data set further comprises at least one hyperspectral SWIR image.
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