Low temperature device with low-vibration sample holding device
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
F25D-019/00
F17C-003/08
H01J-037/20
G01Q-030/10
G01Q-070/02
G01Q-070/04
G03F-007/20
G01N-021/01
출원번호
US-0653059
(2009-12-07)
등록번호
US-9062905
(2015-06-23)
우선권정보
DE-10 2007 028 865 (2007-06-22)
발명자
/ 주소
Hoehne, Jens
Buehler, Matthias
출원인 / 주소
HB Patent Unternehmergesellschaft
대리인 / 주소
Imperium Patent Works
인용정보
피인용 횟수 :
0인용 특허 :
7
초록▼
A low temperature device has a low temperature container with an investigational opening. A material sample to that is to be examiner is mounted on a sample-holding device in the low temperature container. A sample that is fastened to the sample holding device can be cooled to the desired temperatur
A low temperature device has a low temperature container with an investigational opening. A material sample to that is to be examiner is mounted on a sample-holding device in the low temperature container. A sample that is fastened to the sample holding device can be cooled to the desired temperature using a cooling device, such as a pulse tube cooler, with a cold head that is inside the low temperature container. The sample holder is disposed in the low temperature container in such a way that the sample can be seen through the investigational opening. Because the investigational opening is flexible and not rigidly connected to the low temperature container, vibrations produced by the mechanical cooling device are prevented from being transferred to the investigational opening. Thus, a vibration-sensitive investigating and manipulating device can be coupled to the investigational opening without vibrations being transferred to the investigating and manipulating device.
대표청구항▼
1. A device comprising: a low temperature container; a probe holder disposed inside the low temperature container, wherein the probe holder is adapted to be attached to a probe that is to be investigated; a cooling device that is thermally coupled to the probe holder; a test window that is mechanica
1. A device comprising: a low temperature container; a probe holder disposed inside the low temperature container, wherein the probe holder is adapted to be attached to a probe that is to be investigated; a cooling device that is thermally coupled to the probe holder; a test window that is mechanically decoupled from the low temperature container; and a base, wherein the test window is mechanically coupled to the base outside the low temperature container and mechanically coupled to the probe holder via a tube piece such that mechanical oscillations of the low temperature container that are transferred to the test window are damped; wherein the tube piece has a first front side and a second front side, wherein the first front side is mechanically coupled to the test window, and wherein the second front side is mechanically coupled to the probe holder. 2. The device of claim 1, wherein the probe holder is mechanically decoupled from the cooling device. 3. The device of claim 2, wherein the cooling device includes a cooling head that is thermally coupled to the probe holder. 4. The device of claim 1, wherein the probe holder is mechanically coupled to the test window. 5. The device of claim 1, wherein the probe that is attached to the probe holder is visible through the test window. 6. The device of claim 1, wherein the low temperature container is a vacuum-sealed Dewar container. 7. The device of claim 1, wherein the low temperature container includes a radiation shield that provides thermal insulation to the probe that is attached to the probe holder. 8. The device of claim 1, wherein the test window includes a coupling device that couples the test window to an external testing and manipulation device. 9. The device of claim 1, wherein the test window is permeable to radiation of a predetermined wavelength such that radiation of the predetermined wavelength is directed to the probe that is attached to the probe holder. 10. The device of claim 1, wherein a test and manipulation device is disposed outside the low temperature container in front of the test window. 11. The device of claim 10, wherein the test and manipulation device is disposed on the base. 12. The device of claim 1, wherein the cooling device includes a mechanical cooling device. 13. The device of claim 12, wherein the cooling device includes a pulsed tube cooler. 14. The device of claim 12, wherein the pulsed tube cooler is a two-stage pulsed tube cooler. 15. The device of claim 1, wherein the test window is connected by a bellows to the low temperature container. 16. The device of claim 1, wherein a test opening is disposed in a recess in the low temperature container, and wherein the test opening includes the test window and the probe holder. 17. A device comprising: a low temperature container; a probe holder disposed inside the low temperature container; a test window that is mechanically decoupled from the low temperature container; the test window is mechanically coupled to a base outside the low temperature container and is mechanically coupled to the probe holder via a tube piece such that mechanical oscillations of the low temperature container that are transferred to the test window are damped; wherein the tube piece has a first front side and a second front side, wherein the first front side is mechanically coupled to the test window, and wherein the second front side is mechanically coupled to the probe holder; and a cooling head of a cooling device, wherein the cooling head is thermally coupled to the probe holder. 18. The device of claim 17, wherein the test window is connected by a bellows to the low temperature container. 19. The device of claim 17, wherein a test opening is disposed in a recess in the low temperature container, and wherein the test opening includes the test window and the probe holder. 20. A device comprising: a low temperature container; a probe holder adapted to be attached to a probe that is to be investigated; a cooling device disposed inside the low temperature container, wherein the cooling device is thermally coupled to the probe holder; and a test window that is mechanically coupled to a base outside the low temperature container and that is mechanically coupled to the probe holder via a tube piece and that is mechanically decoupled from the low temperature container such that mechanical oscillations of the low temperature container that are transferred to the test window are damped: wherein the tube piece has a first front side and a second front side, wherein the first front side is mechanically coupled to the test window, and wherein the second front side is mechanically coupled to the probe holder. 21. The device of claim 20, wherein an optical testing device is disposed on the base. 22. The device of claim 20, wherein the test window is connected by a bellows to the low temperature container. 23. The device of claim 1, wherein the tube piece is made of a material taken from the group consisting of: glass fiber reinforced plastic and plastic reinforced with graphite fiber.
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