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Controlling a manufacturing process with a multivariate model 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06F-019/00
  • G06F-007/60
  • G06F-017/10
  • G05B-013/04
출원번호 US-0358864 (2009-01-23)
등록번호 US-9069345 (2015-06-30)
발명자 / 주소
  • McCready, Christopher Peter
  • Wold, Svante Bjarne
출원인 / 주소
  • MKS Instruments, Inc.
대리인 / 주소
    Proskauer Rose LLP
인용정보 피인용 횟수 : 2  인용 특허 : 67

초록

A method, controller, and system for controlling a manufacturing process (batch-type or continuous-type) with a multivariate model are described. Dependent variable data and manipulated variable data are received. Dependent variable data represents values of uncontrolled process parameters from a pl

대표청구항

1. A computer-implemented method for controlling a batch-type manufacturing process with a finite duration, the method comprising: receiving dependent variable data and manipulated variable data associated with the batch-type manufacturing process, the dependent variable data including measured past

이 특허에 인용된 특허 (67)

  1. Katsuta Hiroshi,JPX ; Nishizawa Makoto,JPX, Apparatus for controlling injection molding machines.
  2. Bulgrin Thomas C., Auto-tuned, adaptive process controlled, injection molding machine.
  3. Brecher Virginia H. (West Cornwall CT) Chou Paul B.-L ; (Montvale NJ) Hall Robert W. (Jericho VT) Parisi Debra M. (Carmel NY) Rao Ravishankar (White Plains NY) Riley Stuart L. (Colchester VT) Sturzen, Automated defect classification system.
  4. Hendler, Lawrence; Lazarovich, Stela Diamant; Hadar, Ron; Kettaneh, Nouna; Levami, Uzi; Perlroizen, Dmitry, Automated model building and model updating.
  5. Lorenz, Alexander D.; Ruchti, Timothy L.; Blank, Thomas B., Automatic process for sample selection during multivariate calibration.
  6. Spahr David K. ; Tibbitts Dennis C., Combination control for injection molding.
  7. Mack, Chris; Jones, Robert; Byers, Jeffrey, Computer-implemented method and carrier medium configured to generate a set of process parameters for a lithography process.
  8. Shaun S. Gleason ; Martin A. Hunt ; Hamed Sari-Sarraf, Context-based automated defect classification system using multiple morphological masks.
  9. Shioiri,Takayoshi; Iwashita,Eiki; Yamagiwa,Yoshitoshi, Control apparatus for injection molding machine.
  10. Vaculik, Vit; Quinn, Shannon L.; Dudzic, Michael S., Desulphurization reagent control method and system.
  11. Stewart, Gregory E.; Rhodes, Michael L., Engine controller.
  12. Suganuma Masashi (Sakaki JPX), Fuzzy inference thermocontrol method for an injection molding machine.
  13. Nakamura Nobuyuki (Sakaki JPX) Suganuma Masashi (Sakaki JPX), Fuzzy inference thermocontrol method for an injection molding machine with a PID control.
  14. Nakamura Nobuyuki (Sakaki JPX) Takizawa Kiyoto (Sakaki JPX) Suganuma Masashi (Sakaki JPX), Fuzzy inference thermocontrol method for an injection molding machine with a plurality of means for heating or cooling.
  15. Moyne James R. (Ypsilanti MI), Generic cell controlling method and apparatus for computer integrated manufacturing system.
  16. Hendler,Lawrence; Richter,Matthew, Method and apparatus for classifying manufacturing outputs.
  17. Cherry,Gregory A.; Kadosh,Daniel, Method and apparatus for detecting faults using principal component analysis parameter groupings.
  18. Ryskoski, Matthew S., Method and apparatus for determining control actions based on tool health and metrology data.
  19. Miller, Michael L.; Oshelski, Anatasia L.; Campbell, William J., Method and apparatus for interfacing a statistical process control system with a manufacturing process control framework.
  20. Morrison Philip W. (Shaker Heights OH) Solomon Peter R. (West Hartford CT) Carangelo Robert M. (Glastonbury CT) Hamblen David G. (East Hampton CT), Method and apparatus for monitoring layer processing.
  21. Zenhausern, Frederic, Method and apparatus for monitoring materials used in electronics.
  22. Minor,James M.; Illouz,Mika, Method and system for predicting multi-variable outcomes.
  23. Chamness,Kevin Andrew, Method and system of diagnosing a processing system using adaptive multivariate analysis.
  24. Van-Duc Nguyen ; Joseph Leagrand Mundy, Method for automatic screening of abnormalities.
  25. Frey, Jürgen, Method for automatically balancing the volumetric filling of cavities.
  26. O'Brien, Jr., Francis J.; Nguyen, Chung T., Method for classifying a random process for data sets in arbitrary dimensions.
  27. Bode, Christopher A.; Toprac, Anthony J., Method for identifying and controlling impact of ambient conditions on photolithography processes.
  28. Christopher A. Bode ; Anthony J. Toprac, Method for identifying and controlling impact of ambient conditions on photolithography processes.
  29. Wold Svante,SEX ; Sundin Karl Olov Lasse,SEX, Method for monitoring multivariate processes.
  30. Bode, Christopher Allen; Toprac, Anthony J., Method for relating photolithography overlay target damage and chemical mechanical planarization (CMP) fault detection to CMP tool indentification.
  31. Sasaki, Kiyoshi, Method for setting an injection speed control pattern of an injection molding machine.
  32. Saito Osamu,JPX ; Watanabe Hiroshi,JPX ; Araki Kenji,JPX, Method of analyzing factors affecting product quality and adjusting molding conditions for injection molding machine.
  33. Hopkins Robert W. (Rochester NY) Miller Paige (Rochester NY) Swanson Ronald E. (Rochester NY) Scheible John J. (Fairport NY), Method of controlling a manufacturing process using multivariate analysis.
  34. Iino Yutaka (Kawasaki JPX) Ohya Junko (Kawasaki JPX), Model predictive control apparatus.
  35. Bulgrin, Thomas C.; Schuplin, Andrew, Model predictive control apparatus and methods for motion and/or pressure control of injection molding machines.
  36. Le Minh ; Chen Kuang Han ; Smith Taber H. ; Boning Duane S. ; Sawin Herbert H., Monitor of plasma processes with multivariate statistical analysis of plasma emission spectra.
  37. Mozumder Purnendu K. (Plano TX) Saxena Sharad (Dallas TX) Pu William W. (Plano TX), Multi-variable statistical process controller for discrete manufacturing.
  38. Lin,Kuo Chin, Multivariate control of semiconductor processes.
  39. Taguchi,Genichi; Jugulum,Rajesh; Taguchi,Shin, Multivariate data analysis method and uses thereof.
  40. Keyes,Tim K., Multivariate responses using classification and regression trees systems and methods.
  41. Vaculik, Vit; MacCuish, R. Blair; Mutha, Rajendra K., Multivariate statistical model-based system for monitoring the operation of a continuous caster and detecting the onset of impending breakouts.
  42. Kruger,Uwe; Chen,Qian; Sandoz,David J., Multivariate statistical process monitors.
  43. Bulgrin,Thomas C., OO control for injection molding machine.
  44. Gardner,Craig; Haass,Michael J.; Rowe,Robert K.; Jones,Howland; Strohl,Steven T.; Novak,Matthew J.; Abbink,Russell E.; Nu챰ez,David; Gruner,William; Johnson,Robert D., Optically similar reference samples and related methods for multivariate calibration models used in optical spectroscopy.
  45. Kurtzberg Jerome M. ; Levanoni Menachem, Optimizing functional operation in manufacturing control.
  46. Hutson,Lee Merrill; Wold,Svante, Parametric injection molding system and method.
  47. Magnus Fransson SE; Lars Karlsson SE; Bengt Lagerholm SE; Anders Sparen SE, Process control.
  48. Pistikopoulos,Efstratios; Bozinis,Nikolaos A.; Dua,Vivek; Perking,John D.; Sakizlis,Vassilis, Process control using co-ordinate space.
  49. Hendler, Lawrence; Lin, Kuo Chin; Wold, Svante Bjarne, Process control using process data and yield data.
  50. Bader Christopherus,CHX ; Zanetti Markus,CHX, Process for controlling the hot-runner heating of a multicavity injection mould.
  51. Bader Christopherus,CHX, Process for determining the switchover point in the production of a die casting.
  52. Blevins, Terrence Lynn; Nixon, Mark J.; McMillan, Gregory K., Process plant monitoring based on multivariate statistical analysis and on-line process simulation.
  53. Fox Edward P. (Austin TX) Kappuswamy Chandru (Austin TX), Real time control of plasma etch utilizing multivariate statistical analysis.
  54. Qin, S. Joe; Guiver, John P., Sensor validation apparatus and method.
  55. Solomon Peter R. ; Rosenthal Peter A., Spectrometric method for analysis of film thickness and composition on a patterned sample.
  56. Wittkowski,Knut M., Statistical methods for multivariate ordinal data which are used for data base driven decision support.
  57. Bickford, Randall L., Surveillance system and method having an operating mode partitioned fault classification model.
  58. Harvey, Kenneth C.; Hosch, Jimmy W.; Gallagher, Neal B.; Wise, Barry M., System and method for determining endpoint in etch processes using partial least squares discriminant analysis in the time domain of optical emission spectra.
  59. Firth, Stacy; Campbell, W. Jarrett, System and method for estimating error in a manufacturing process.
  60. Castro Perez,Jose; Plumb,Robert; Jones,Christopher, System and method for isotopic signature and mass analysis.
  61. Gross, Kenneth C.; Wegerich, Stephan W., System for monitoring non-coincident, nonstationary process signals.
  62. Bershteyn Mikhail (Campbell CA), System for testing of digital integrated circuits.
  63. Graichen,Catherine Mary; Cardella,Aidan Thomas; Nicolia, Jr.,Raymond Louis; Feher,Lucille Anna; Osborn,Brock Estel, System, method and computer product for performing automated predictive reliability.
  64. Dimitris K. Agrafiotis ; Victor S. Labanov ; Francis R. Salemme, System, method, and computer program product for representing proximity data in a multi-dimensional space.
  65. Bunkofske, Raymond J.; Colt, Jr., John Z.; McGill, James J.; Pascoe, Nancy T.; Surendra, Maheswaran; Taubenblatt, Marc A.; Ghias, Asif, User configurable multivariate time series reduction tool control method.
  66. Bunkofske, Raymond J.; Colt, Jr., John Z.; McGill, James J; Pascoe, Nancy T.; Surendra, Maheswaran; Taubenblatt, Marc A.; Ghias, Asif, User configurable multivariate time series reduction tool control method.
  67. Raymond J. Bunkofske ; John Z. Colt, Jr. ; James J. McGill ; Nancy T. Pascoe ; Maheswaran Surendra ; Marc A. Taubenblatt ; Asif Ghias, User configurable multivariate time series reduction tool control method.

이 특허를 인용한 특허 (2)

  1. Asakura, Ryoji; Tamaki, Kenji; Kagoshima, Akira; Shiraishi, Daisuke, Analysis method and semiconductor etching apparatus.
  2. McCready, Chris Peter, Multivariate prediction of a batch manufacturing process.
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