Device and method relating to a sensing device
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G01L-003/20
G01L-003/00
G01L-001/00
G01M-005/00
G01B-005/20
G01B-007/16
A63F-013/20
F02K-009/34
출원번호
US-0095775
(2013-12-03)
등록번호
US-9074864
(2015-07-07)
발명자
/ 주소
Mathias, Edward C.
Shipley, John L.
출원인 / 주소
ALLIANT TECHSYSTEMS INC.
대리인 / 주소
TraskBritt
인용정보
피인용 횟수 :
0인용 특허 :
14
초록▼
Methods, devices, and systems relating to a sensing device are disclosed. A device may comprise a structure including a first surface and a second, opposite surface, wherein the structure comprises one or more segments. Further, the device may include a plurality of sensors disposed on the structure
Methods, devices, and systems relating to a sensing device are disclosed. A device may comprise a structure including a first surface and a second, opposite surface, wherein the structure comprises one or more segments. Further, the device may include a plurality of sensors disposed on the structure, wherein each segment of the one or more segments comprises a first sensor of the plurality of sensors coupled to the first surface and an associated second sensor of the plurality of sensors coupled to the second surface. Moreover, each sensor of the plurality of sensors may be configured to measure a strain exhibited on an adjacent surface of the structure at an associated segment of the one or more segments.
대표청구항▼
1. A device, comprising: a substantially planar structure having a first side and a second side opposite the first side;a first plurality of sensors coupled along the first side of the structure;a second plurality of sensors coupled along the second side of the structure, each sensor of the first pl
1. A device, comprising: a substantially planar structure having a first side and a second side opposite the first side;a first plurality of sensors coupled along the first side of the structure;a second plurality of sensors coupled along the second side of the structure, each sensor of the first plurality of sensors having an opposing associated sensor of the second plurality of sensors, wherein each sensor of the first and second plurality of sensors is configured to measure a strain exhibited by at least a portion of the structure; anda processor configured to determine at least one characteristic of the structure based on strain data from the first and second plurality of sensors, wherein the at least one characteristic of the structure includes a vibrational frequency of the structure. 2. The device of claim 1, wherein the at least one characteristic of the structure further includes a shape of at least one segment of the structure at a moment in time. 3. The device of claim 2, wherein the processor is configured to determine the shape of the at least one segment of the structure at a moment in time by integrating curvature over a length of the structure. 4. The device of claim 1, wherein the processor is configured to determine a shape of the structure as a function of time. 5. The device of claim 1, further comprising an object to which the structure is coupled. 6. The device of claim 5, wherein the object includes a composite component for an aerospace vehicle. 7. The device of claim 6, wherein the aerospace vehicle includes a solid rocket motor. 8. The device of claim 7, wherein the composite component includes an inhibitor of the solid rocket motor. 9. The device of claim 6, wherein the aerospace vehicle includes a spacecraft vehicle. 10. The device of claim 1, wherein the substantially planar structure includes a flexible metal strip. 11. A device, comprising: a structure having a first side and a second side opposite the first side;a first plurality of sensors coupled along the first side of the structure;a second plurality of sensors coupled along the second side of the structure, each sensor of the first plurality of sensors having an associated sensor of the second plurality of sensors, wherein each sensor of the first and second plurality of sensors is configured to measure a strain exhibited by at least a portion of the structure; anda processor configured to determine at least one characteristic of the structure based on strain data from the first and second plurality of sensors, wherein the structure is configured as a flex circuit such that the first side and the second side are on a same surface of the structure that is folded along a center line to form the first side and the second side that oppose each other. 12. A method, comprising: positioning a substantially planar structure adjacent to an object, the structure having a first side with a first plurality of sensors coupled thereto and a second side with a second plurality of sensors coupled thereto, wherein the second side is opposite the first side, and each sensor of the first plurality of sensors has an opposing associated sensor of the second plurality of sensors;obtaining data from the first plurality of sensors and the second plurality of sensors that is indicative of strain on the structure; anddetermining at least one characteristic of the object based on the data obtained from the first plurality of sensors and the second plurality of sensors, wherein determining the at least one characteristic of the object includes determining harmonic frequencies associated with the shape of the object as a function of time. 13. The method of claim 12, wherein determining the at least one characteristic of the object includes determining a shape of the object as a function of time by repeating individual measurements at a predetermined frequency. 14. The method of claim 12, wherein determining harmonic frequencies includes performing a Fourier transform on time-domain data obtained from repeating the individual measurements at the predetermined frequency. 15. The method of claim 12, wherein positioning a substantially planar structure adjacent an object includes at least one of: coupling the substantially planar structure to the object;bonding the substantially planar structure to the object; andembedding the substantially planar structure within the object. 16. The method of claim 12, wherein determining the at least one characteristic associated with the object includes determining a vibrational frequency of the structure. 17. The method of , claim 16, wherein positioning the structure adjacent to an object includes positioning the structure adjacent to a construction material. 18. The method of claim 12, wherein positioning a substantially planar structure adjacent to an object includes positioning the substantially planar structure adjacent to a composite component for an aerospace vehicle. 19. The device of claim 18, wherein the aerospace vehicle includes a solid rocket motor. 20. A method, comprising: positioning a substantially planar structure adjacent to an object, the structure having a first side with a first plurality of sensors coupled thereto and a second side with a second plurality of sensors coupled thereto, wherein the second side is opposite the first side, and each sensor of the first plurality of sensors has an opposing associated sensor of the second plurality of sensors;obtaining data from the first plurality of sensors and the second plurality of sensors that is indicative of strain on the structure;determining at least one characteristic of the object based on the data obtained from the first plurality of sensors and the second plurality of sensors;comparing a determined shape of the structure against a predetermined virtual shape on a computer;manipulating the object to alter the shape of the object; andinforming a user when the determined shape of the object at least substantially matches the predetermined virtual shape. 21. The method of claim 20, wherein positioning a substantially planar structure adjacent to an object includes positioning the substantially planar structure adjacent to a composite component for an aerospace vehicle. 22. A method, comprising: positioning a substantially planar structure adjacent to an object, the structure having a first side with a first plurality of sensors coupled thereto and a second side with a second plurality of sensors coupled thereto, wherein the second side is opposite the first side, and each sensor of the first plurality of sensors has an opposing associated sensor of the second plurality of sensors;obtaining data from the first plurality of sensors and the second plurality of sensors that is indicative of strain on the structure; anddetermining at least one characteristic of the object based on the data obtained from the first plurality of sensors and the second plurality of sensors, wherein determining the at least one characteristic associated with the object includes determining an erosion rate of the structure. 23. The method of claim 22, wherein determining the erosion rate includes monitoring a loss of measured data from the first plurality of sensors and the second plurality of sensors. 24. The method of claim 22, wherein positioning a substantially planar structure adjacent to an object includes positioning the substantially planar structure adjacent to a composite component for an aerospace vehicle. 25. The device of claim 24, wherein the aerospace vehicle includes a solid rocket motor of a spacecraft vehicle.
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이 특허에 인용된 특허 (14)
Johnson,Mont A.; Everton,Randy L., Apparatus and method for measuring stress at an interface.
Jeuniaux Francois (Sancy FRX) Malhomme Marc (Dunkerque FRX) Moretti Jean-Marc (Dunkerque FRX) Haralamb Grard (Dillingen FRX), Method of measuring the shape and/or the planarity of a running material, and device for its implementation.
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