Measuring device electronics for a measuring device as well as measuring device formed therewith
원문보기
IPC분류정보
국가/구분
United States(US) Patent
등록
국제특허분류(IPC7판)
G06F-001/26
G01F-001/84
G06F-011/16
출원번호
US-0484444
(2012-05-31)
등록번호
US-9109936
(2015-08-18)
우선권정보
DE-10 2011 076 838 (2011-05-31)
발명자
/ 주소
Drahm, Wolfgang
Engstler, Gernot
Pohl, Hans
Matt, Christian
Lalla, Robert
Brudermann, Matthias
출원인 / 주소
ENDRESS + HAUSER FLOWTEC AG
대리인 / 주소
Bacon & Thomas, PLLC
인용정보
피인용 횟수 :
0인용 특허 :
94
초록▼
A measuring device electronics comprises a processor and two clock signal generators. One clock signal generator serves for producing a working clock signal, and also for producing a reference clock signal which is dependant on the working clock signal. The other clock signal generator, serves for p
A measuring device electronics comprises a processor and two clock signal generators. One clock signal generator serves for producing a working clock signal, and also for producing a reference clock signal which is dependant on the working clock signal. The other clock signal generator, serves for producing a second reference clock signal, which is independent of the working clock signal. Based on the two independent reference clock signals, a frequency difference, can, to the extent that such is present, be ascertained during operation of the measuring device electronics or of the measuring device formed therewith. The frequency difference, represents a difference between the instantaneous clocking frequency of the first reference clock signal and the instantaneous clocking frequency of the second reference clock signal, and, in this respect, represents a measure for a deviation of an instantaneous clocking frequency, from the nominally predetermined clocking frequency, of the working clock signal.
대표청구항▼
1. A measuring device electronics for a measuring device, said measuring device electronics comprising: a processor;a first clock signal generator for producing a working clock signal clocking the processor with a nominally constant clocking frequency and for producing a first reference clock signal
1. A measuring device electronics for a measuring device, said measuring device electronics comprising: a processor;a first clock signal generator for producing a working clock signal clocking the processor with a nominally constant clocking frequency and for producing a first reference clock signal dependent on the working clock signal, said first reference clock signal exhibiting a nominally constant clocking frequency which is smaller than the clocking frequency of the working clock signal by a predetermined factor; anda second clock signal generator for producing a second reference clock signal independent of the working clock signal, said second reference clock signal exhibiting a nominally constant clocking frequency which is smaller than the clocking frequency of the working clock signal by a predetermined factor,wherein said processor is adapted to detect, based on said first reference signal as well as based on said second reference clock signal, whether at least one of said first and second clock signal generators is delivering a reference clock signal with an instantaneous clocking frequency, which deviates by a predetermined degree from the nominal clocking frequency respectively predetermined therefor. 2. The measuring device electronics as claimed in claim 1, wherein: for producing said first reference clock signal, said first clock signal generator includes a frequency divider for said working clock signal. 3. The measuring device electronics as claimed in claim 1, wherein: for producing the working clock signal, said first clock signal generator includes a frequency multiplier for the first reference clock signal. 4. The measuring device electronics as claimed in claim 1, wherein: the clocking frequency of said first reference clock signal differs from the clocking frequency of said second reference clock signal. 5. The measuring device electronics as claimed in claim 1, further comprising: a counter controlled by one of said two reference clock signals, said counter including a count input for the other reference clock signal, not controlling said counter. 6. The measuring device electronics as claimed in claim 5, wherein: said reference clock signal present at the count input is that reference clock signal, whose clocking frequency is higher than the clocking frequency of the other reference clock signal, namely that controlling the counter. 7. The measuring device electronics as claimed in claim 1, wherein: said processor is equipped, by making use of the two reference clock signals, to produce a report, which signals, that at least one of the two clock signal generators is delivering a reference clock signal, which exhibits an instantaneous clocking frequency deviating from the nominal clocking frequency respectively predetermined therefor. 8. The measuring device electronics as claimed in claim 1, wherein: said processor is adapted to ascertain an instantaneous frequency difference defined as a difference between the instantaneous clocking frequency of said first reference clock signal and the instantaneous clocking frequency of said second reference clock signal. 9. The measuring device electronics as claimed in claim 8, wherein: said processor is adapted to compare the ascertained instantaneous frequency difference with a threshold value predeterminable therefor, which represents a maximum allowable frequency difference. 10. The measuring device electronics as claimed in claim 9, wherein: said processor is adapted to produce, if the ascertained instantaneous frequency difference exceeds the threshold value, a report which signals that at least one of the two clock signal generators is delivering a reference clock signal, which exhibits a clocking frequency differing from a nominal clocking frequency respectively predetermined therefor. 11. The measuring device electronics as claimed in claim 8, wherein: said processor ascertains the instantaneous frequency difference based on a frequency difference formed by means of the instantaneous clocking frequency of said first reference clock signal and the instantaneous clocking frequency of said second reference clock signal. 12. The measuring device electronics as claimed in claim 8, wherein: said processor ascertains the instantaneous frequency difference based on a frequency quotient formed by means of the instantaneous clocking frequency of said first clock signal and the instantaneous clocking frequency of said second clock signal. 13. The measuring device electronics as claimed in claim 1, wherein: said two clock signal generators are held in case of undisturbed, steady state operation at the same operating temperature. 14. The measuring device electronics as claimed in claim 1, wherein: said first clock signal generator is placed on a substrate which, at least as regards its coefficient of thermal expansion, is equal to a substrate on which said second clock signal generator is placed. 15. The measuring device electronics as claimed in claim 1, wherein: said first clock signal generator and said second clock signal generator are placed on one and the same substrate. 16. The measuring device electronics as claimed in claim 1, further comprising: a non-volatile data memory for measuring and/or operating data generated by means of the measuring device electronics. 17. The measuring device electronics as claimed in claim 5, wherein said clocking frequency of the reference clock signal controlling the counter determines a count interval, within which the counter counts clock signals of the reference clock signal present at the count input. 18. The measuring device electronics as claimed in claim 1, wherein the processor is embodied as a digital signal processor. 19. A method for testing a measuring device for measuring at least one physical and/or chemical, measured variable of a medium conveyed in a line or in a container, wherein the measuring device includes a measuring device electronics and a measuring transducer electrically coupled with said measuring device electronics for transducing the at least one measured variable into at least one measurement signal dependent thereon, and wherein the measuring device electronics includes: a processor,a first clock signal generator for producing a working clock signal clocking the processor with a nominally constant clocking frequency and for producing a first reference clock signal dependent on the working clock signal, said first reference clock exhibiting a nominally constant clocking frequency, which is smaller than the clocking frequency of the working clock signal by a predetermined factor,and a second clock signal generator for producing a second reference clock signal independent of the working clock signal, said second reference clock exhibiting a nominally constant clocking frequency, which is smaller than the clocking frequency of the working clock signal by a predetermined factor, said method comprising:producing the working clock signal by means of the first clock signal generator and clocking the processor with said working clock signal;producing the first reference clock signal by means of the first clock signal generator and producing the second reference clock signal by means of the second clock signal generator;producing, by means of the processor, measured values representing said at least one measured variable;ascertaining a frequency difference, which represents a difference between the instantaneous clocking frequency of the first reference clock signal and the instantaneous clocking frequency of the second reference clock signal; andgenerating an error report, said error report signaling that at least one of the two clock signal generators is delivering a reference clock signal with an instantaneous clocking frequency, which deviates by a predetermined degree from a nominal clocking frequency respectively predetermined therefor, and/or said error report signaling that measured values ascertained by means of the processor are erroneous or unreliable by more than a predetermined degree, if the instantaneous clock frequencies of the first and second reference clock signals deviate from one another by more than a predetermined degree. 20. The method as claimed in claim 19, wherein: producing measured values representing said at least one measured variable includes using the at least one measurement signal as well as the working clock signal as a time-basis and/or a frequency base. 21. The measuring device electronics as claimed in claim 1, wherein: the processor is embodied as a microprocessor. 22. The measuring device electronics as claimed in claim 1, wherein: the processor is embodied as a digital signal processor. 23. The measuring device electronics as claimed in claim 1, wherein: said first clock signal generator is formed by means of a quartz oscillator. 24. The measuring device electronics as claimed in claim 1, wherein: said first clock signal generator is formed by means of a PLL circuit. 25. The measuring device electronics as claimed in claim 1, wherein: said first clock signal generator is formed by means of a FLL circuit. 26. The measuring device electronics as claimed in claim 1, wherein: said second clock signal generator is formed by means of a quartz oscillator. 27. The measuring device electronics as claimed in claim 1, wherein: said second clock signal generator is formed by means of a PLL circuit. 28. The measuring device electronics as claimed in claim 1, wherein: said second clock signal generator is formed by means of a FLL circuit. 29. The measuring device electronics as claimed in claim 7, further comprising: a non-volatile data memory adapted to store a datum containing a point in time of generation of said report. 30. The measuring device electronics as claimed in claim 8, further comprising: a non-volatile data memory adapted to store a point in time of ascertaining the frequency difference. 31. The measuring device electronics as claimed in claim 10, further comprising: a non-volatile data memory adapted to store a datum containing a point in time of generation of said report. 32. A measuring device for measuring at least one physical and/or chemical, measured variable of a medium conveyed in a line, or in a container, said measuring device comprising: a measuring device electronics and a measuring transducer electrically coupled with said measuring device electronics for transducing the at least one measured variable into at least one measurement signal dependent thereon,wherein the measuring device electronics includes:a processor,a first clock signal generator for producing a working clock signal clocking the processor with a nominally constant frequency and for producing a first reference clock signal dependent on the working clock signal, said first reference clock signal exhibiting a nominally constant clocking frequency which is smaller than the clocking frequency of the working clock signal by a predetermined factor,and a second clock signal generator for producing a second reference clock signal independent of the working clock signal, said second reference clock signal exhibiting a nominally constant clocking frequency which is smaller than the clocking frequency of the working clock signal by a predetermined factor. 33. The measuring device as claimed in claim 32, wherein: said processor of the measuring device electronics is adapted, making use of the working clock signal as reference, as well as making use of the at least one measurement signal, to ascertain a measured value representing the at least one measured variable. 34. The measuring device as claimed in claim 32, wherein: the measuring device is a measuring device which measures in a time-based and/or a frequency-based manner. 35. The measuring device as claimed in claim 32, wherein the measuring device is one of: a Coriolis mass flow measuring device, an ultrasonic flow measuring device, a vortex flow measuring device, an ultrasonic fill level measuring device, or a microwave fill level measuring device. 36. The method as claimed in claim 19, further comprising: storing the error report in a non-volatile data memory of the measuring device electronics. 37. The method as claimed in claim 19, further comprising: storing the ascertained frequency difference in a non-volatile data memory of the measuring device electronics. 38. The method as claimed in claim 37, further comprising: storing, in the non-volatile data memory, a datum containing a point in time of generation of the error report and/or a point in time of ascertaining the frequency difference. 39. A measuring device electronics for a measuring device, said measuring device electronics comprising: a processor;a first clock signal generator adapted to produce a working clock signal clocking the processor with a nominally constant clocking frequency and to produce a first reference clock signal dependent on the working clock signal, said first reference clock signal exhibiting a nominally constant clocking frequency, which is smaller than the clocking frequency of the working clock signal by a predetermined factor;a second clock signal generator adapted to produce a second reference clock signal independent of the working clock signal, said second reference clock signal exhibiting a nominally constant clocking frequency, which is smaller than the clocking frequency of the working clock signal by a predetermined factor;and a counter controlled by one of said two reference clock signals, said counter including a count input for the other reference clock signal, not controlling said counter; wherein:the clocking frequency of said reference clock signal controlling the counter determines a count interval, within which the counter counts clock signals of the reference clock signal present at the count input, and/orsaid reference clock signal present at the count input is that reference clock signal, whose clocking frequency is higher than the clocking frequency of the other reference clock signal, namely that controlling the counter. 40. The measuring device electronics as claimed in claim 39, wherein: the processor is adapted to ascertain an instantaneous frequency difference, defined as a difference between the instantaneous clocking frequency of said first reference clock signal and the instantaneous clocking frequency of said second reference clock signal. 41. The measuring device electronics as claimed in claim 40, further comprising: a non-volatile data memory adapted to store a point in time of ascertaining the frequency difference. 42. The measuring device electronics as claimed in claim 39, wherein: the processor is adapted to detect, based on said first reference clock signal as well as based on said second reference clock signal, whether at least one of said first and second clock signal generators is delivering a reference clock signal with an instantaneous clocking frequency, which deviates by a predetermined degree from the nominal clocking frequency respectively predetermined therefor. 43. A measuring device electronics for a measuring device, said measuring device electronics comprising: a processor;a first clock signal generator adapted to produce a working clock signal clocking the processor with a nominally constant clocking frequency and to produce a first reference clock signal dependent on the working clock signal, said first reference clock signal exhibiting a nominally constant clocking frequency, which is smaller than the clocking frequency of the working clock signal by a predetermined factor;a second clock signal generator adapted to produce a second reference clock signal independent of the working clock signal, said second reference clock signal exhibiting a nominally constant clocking frequency, which is smaller than the clocking frequency of the working clock signal by a predetermined factor;and a counter controlled by one of said two reference clock signals, said counter including a count input for the other reference clock signal, not controlling said counter;wherein: the processor is adapted to ascertain an instantaneous frequency difference, defined as a difference between the instantaneous clocking frequency of said first reference clock signal and the instantaneous clocking frequency of said second reference clock signal. 44. The measuring device electronics as claimed in claim 43, wherein: the processor is adapted to detect, based on said first reference clock signal as well as based on said second reference clock signal, whether at least one of said first and second clock signal generators is delivering a reference clock signal with an instantaneous clocking frequency, which deviates by a predetermined degree from the nominal clocking frequency respectively predetermined therefor. 45. The measuring device electronics as claimed in claim 43, further comprising: a non-volatile data memory adapted to storing the ascertained frequency difference.
연구과제 타임라인
LOADING...
LOADING...
LOADING...
LOADING...
LOADING...
이 특허에 인용된 특허 (94)
Abe Shinichi,JPX, Abnormal clock signal detector and switching device.
Fragnito Carlos Roberto,BRX ; Guasti ; Jr. Jose Guilherme,BRX ; De Souza Libanio Carlos,BRX ; Ginatto Luiz Antonio,BRX ; Graton Marco Antonio,BRX, Analog current / digital bus protocol converter circuit.
Seesink Petrus H. (Chamonixlaan 210 NL-5627 KE Eindhoven NLX) Schneider Georg (Talstrasse 55 D-79650 Schopfheim NLX) Wagner Richard (Im Hungerich 16 D-79618 Rheinfelden NLX) Mellert Vierten M. (Obert, Circuit arrangement for the linearization and temperature compensation of sensor signals.
Cage Donald R. (Longmont CO) Campbell Steven W. (Longmont CO) Hahn David T. (Longmont CO), Coriolis mass flow rate meter having means for modifying angular velocity gradient positioned within a conduit.
Pfeiffer Helmut (Lrrach DEX) Dreyer Volker (Lrrach-Haagen DEX) Pfndler Martin (Steinen DEX), Device for determining and/or monitoring a predetermined filling level in a container.
Steinebrunner Edwin (Todtnau DEX) Renk Peter (Lrrach DEX), Filling level measuring device for measuring the filling level of explosive or aggressive media in a container.
Kalotay Paul (Lafayette CO) Bruck Robert (Boulder CO) Emch Arnold (Estes Park CO) Martella Donald (Louisville CO), Flow tube drive circuit having a bursty output for use in a coriolis meter.
Schlosser, Martin Andrew; Bell, Mark James; Wheeler, Matthew Glen; McNulty, Daniel Patrick; Pawlas, Gary Edward, Flowmeter for the precision measurement of an ultra-pure material flow.
Stinus, Jochen; Banzhaf, Monika, Method and system for switching active configuration memory during on-line operation of programmable field mounted device.
Keyghobad, Seyamak; Baker, William; Thibault, Richard, System and method of powering and communicating field ethernet device for an instrumentation and control using a single pair of powered ethernet wire.
Pedersen Norman E. (Newburyport MA) Bradshaw James E. (Tyngsboro MA) Matson James E. (Brookline MA) Lynnworth Lawrence C. (Waltham MA), Ultrasonic flowmeter.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.